Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy
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| Veröffentlicht in: | Microscopy and microanalysis 2014-08, Vol.20 (S3), p.530-531 |
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| container_issue | S3 |
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| container_title | Microscopy and microanalysis |
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| creator | Schmidt, S. S. Dietrich, J. Koch, C. T. Schaffer, B. Schaffer, M. Klingsporn, M. Merdes, S. Abou-Ras, D. |
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| doi_str_mv | 10.1017/S1431927614004371 |
| format | Article |
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| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.530-531 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_proquest_journals_1855660248 |
| source | Alma/SFX Local Collection |
| subjects | Advances in Instrumentation Symposia Nano-Characterization of Emerging Photovoltaic Materials and Devices Solar cells Thin films |
| title | Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy |
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