Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements

Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements

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Veröffentlicht in:Microscopy and microanalysis 2014-08, Vol.20 (S3), p.856-857
Hauptverfasser: Nowell, Matthew M., Wright, Stuart I., Rampton, Travis, de Kloe, René
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Sprache:eng
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Advances in Instrumentation Symposia
Practical Applications and Analytical Trends of Metallography and Microstructure
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container_issue S3
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container_title Microscopy and microanalysis
container_volume 20
creator Nowell, Matthew M.
Wright, Stuart I.
Rampton, Travis
de Kloe, René
description
doi_str_mv 10.1017/S143192761400600X
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subjects Advances in Instrumentation Symposia
Practical Applications and Analytical Trends of Metallography and Microstructure
title Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements
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