Effect of Silver Flakes in Silver Paste on the Joining Process and Properties of Sandwich Power Modules (IGBTs Chip/Silver Paste/Bare Cu)
In this study, a silver paste has been introduced for attaching chips onto bare Cu substrates (without coating) without applying pressure. Small nano-thickness Ag flakes, measuring 1 μ m–5 μ m length, were embedded uniformly in Ag nanoparticles for improving the density of the material. The presen...
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creator | Zhao, Su-Yan Li, Xin Mei, Yun-Hui Lu, Guo-Quan |
description | In this study, a silver paste has been introduced for attaching chips onto bare Cu substrates (without coating) without applying pressure. Small nano-thickness Ag flakes, measuring 1
μ
m–5
μ
m length, were embedded uniformly in Ag nanoparticles for improving the density of the material. The presence of silver flakes in the silver paste affected the joining process and its microstructure. Microstructure characterization revealed that densification of the silver layer was affected by the presence of silver flakes as the flakes coarsened and formed reactive in situ nanoparticles, which facilitated the sintering between the flakes and the incorporated nanoparticles. Coarsening of silver flakes depended on the sintering temperature, time, and the atmosphere, which affected the decomposition and burning out of organics presented on the surface of the flakes. A high-density silver layer was obtained due to the presence of compact silver flakes. With an increase in the microstructure density, a higher bonding strength and a lower thermal impedance of the sintered joints were achieved. On performing pressureless sintering at 270°C for 30 min under 99.99% N
2
or 4% H
2
/N
2
, the bonding strength and thermal impedance for 11 × 11 mm
2
chips were excellent, measuring approximately 21.9 MPa and 0.077°C/W, respectively. |
doi_str_mv | 10.1007/s11664-016-4739-3 |
format | Article |
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μ
m–5
μ
m length, were embedded uniformly in Ag nanoparticles for improving the density of the material. The presence of silver flakes in the silver paste affected the joining process and its microstructure. Microstructure characterization revealed that densification of the silver layer was affected by the presence of silver flakes as the flakes coarsened and formed reactive in situ nanoparticles, which facilitated the sintering between the flakes and the incorporated nanoparticles. Coarsening of silver flakes depended on the sintering temperature, time, and the atmosphere, which affected the decomposition and burning out of organics presented on the surface of the flakes. A high-density silver layer was obtained due to the presence of compact silver flakes. With an increase in the microstructure density, a higher bonding strength and a lower thermal impedance of the sintered joints were achieved. On performing pressureless sintering at 270°C for 30 min under 99.99% N
2
or 4% H
2
/N
2
, the bonding strength and thermal impedance for 11 × 11 mm
2
chips were excellent, measuring approximately 21.9 MPa and 0.077°C/W, respectively.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-016-4739-3</identifier><identifier>CODEN: JECMA5</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Bond strength ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Electronics and Microelectronics ; Heat conductivity ; Instrumentation ; Materials Science ; Optical and Electronic Materials ; Silver ; Solid State Physics</subject><ispartof>Journal of electronic materials, 2016-11, Vol.45 (11), p.5789-5799</ispartof><rights>The Minerals, Metals & Materials Society 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c353t-fda11adc417e1bebf8fb6c75070e9f2d9cc47b532b558d3de5d9de35385c03f43</citedby><cites>FETCH-LOGICAL-c353t-fda11adc417e1bebf8fb6c75070e9f2d9cc47b532b558d3de5d9de35385c03f43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11664-016-4739-3$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11664-016-4739-3$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51297</link.rule.ids></links><search><creatorcontrib>Zhao, Su-Yan</creatorcontrib><creatorcontrib>Li, Xin</creatorcontrib><creatorcontrib>Mei, Yun-Hui</creatorcontrib><creatorcontrib>Lu, Guo-Quan</creatorcontrib><title>Effect of Silver Flakes in Silver Paste on the Joining Process and Properties of Sandwich Power Modules (IGBTs Chip/Silver Paste/Bare Cu)</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><description>In this study, a silver paste has been introduced for attaching chips onto bare Cu substrates (without coating) without applying pressure. Small nano-thickness Ag flakes, measuring 1
μ
m–5
μ
m length, were embedded uniformly in Ag nanoparticles for improving the density of the material. The presence of silver flakes in the silver paste affected the joining process and its microstructure. Microstructure characterization revealed that densification of the silver layer was affected by the presence of silver flakes as the flakes coarsened and formed reactive in situ nanoparticles, which facilitated the sintering between the flakes and the incorporated nanoparticles. Coarsening of silver flakes depended on the sintering temperature, time, and the atmosphere, which affected the decomposition and burning out of organics presented on the surface of the flakes. A high-density silver layer was obtained due to the presence of compact silver flakes. With an increase in the microstructure density, a higher bonding strength and a lower thermal impedance of the sintered joints were achieved. On performing pressureless sintering at 270°C for 30 min under 99.99% N
2
or 4% H
2
/N
2
, the bonding strength and thermal impedance for 11 × 11 mm
2
chips were excellent, measuring approximately 21.9 MPa and 0.077°C/W, respectively.</description><subject>Bond strength</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Electronics and Microelectronics</subject><subject>Heat conductivity</subject><subject>Instrumentation</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Silver</subject><subject>Solid State Physics</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp1kEFPAjEQhRujiYj-AG9NvOhhpbPd7i5HIYAYjCRi4q3ZbaewiFtsF4k_wX9tCZpw8TSTN-97kzxCLoHdAmNZxwOkaRIxSKMk492IH5EWiIRHkKevx6TFeAqRiLk4JWfeLxkDATm0yPfAGFQNtYY-V6tPdHS4Kt7Q06r-E6aFb5DamjYLpA-2qqt6TqfOKvSeFrXe7Wt0TRWoXUyQtpVa0KndBvrR6s0qXK7Ho97M0_6iWncOgzu9wiHtb27OyYkpVh4vfmebvAwHs_59NHkajft3k0hxwZvI6AKg0CqBDKHE0uSmTFUmWMawa2LdVSrJSsHjUohcc41CdzUGNBeKcZPwNrna566d_digb-TSblwdXkrIY54nwCAOLti7lLPeOzRy7ar3wn1JYHLXuNw3LkPjcte45IGJ94wP3nqO7iD5X-gH33yD5Q</recordid><startdate>20161101</startdate><enddate>20161101</enddate><creator>Zhao, Su-Yan</creator><creator>Li, Xin</creator><creator>Mei, Yun-Hui</creator><creator>Lu, Guo-Quan</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope></search><sort><creationdate>20161101</creationdate><title>Effect of Silver Flakes in Silver Paste on the Joining Process and Properties of Sandwich Power Modules (IGBTs Chip/Silver Paste/Bare Cu)</title><author>Zhao, Su-Yan ; Li, Xin ; Mei, Yun-Hui ; Lu, Guo-Quan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c353t-fda11adc417e1bebf8fb6c75070e9f2d9cc47b532b558d3de5d9de35385c03f43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Bond strength</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Electronics and Microelectronics</topic><topic>Heat conductivity</topic><topic>Instrumentation</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Silver</topic><topic>Solid State Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhao, Su-Yan</creatorcontrib><creatorcontrib>Li, Xin</creatorcontrib><creatorcontrib>Mei, Yun-Hui</creatorcontrib><creatorcontrib>Lu, Guo-Quan</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhao, Su-Yan</au><au>Li, Xin</au><au>Mei, Yun-Hui</au><au>Lu, Guo-Quan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of Silver Flakes in Silver Paste on the Joining Process and Properties of Sandwich Power Modules (IGBTs Chip/Silver Paste/Bare Cu)</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2016-11-01</date><risdate>2016</risdate><volume>45</volume><issue>11</issue><spage>5789</spage><epage>5799</epage><pages>5789-5799</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><coden>JECMA5</coden><abstract>In this study, a silver paste has been introduced for attaching chips onto bare Cu substrates (without coating) without applying pressure. Small nano-thickness Ag flakes, measuring 1
μ
m–5
μ
m length, were embedded uniformly in Ag nanoparticles for improving the density of the material. The presence of silver flakes in the silver paste affected the joining process and its microstructure. Microstructure characterization revealed that densification of the silver layer was affected by the presence of silver flakes as the flakes coarsened and formed reactive in situ nanoparticles, which facilitated the sintering between the flakes and the incorporated nanoparticles. Coarsening of silver flakes depended on the sintering temperature, time, and the atmosphere, which affected the decomposition and burning out of organics presented on the surface of the flakes. A high-density silver layer was obtained due to the presence of compact silver flakes. With an increase in the microstructure density, a higher bonding strength and a lower thermal impedance of the sintered joints were achieved. On performing pressureless sintering at 270°C for 30 min under 99.99% N
2
or 4% H
2
/N
2
, the bonding strength and thermal impedance for 11 × 11 mm
2
chips were excellent, measuring approximately 21.9 MPa and 0.077°C/W, respectively.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11664-016-4739-3</doi><tpages>11</tpages></addata></record> |
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subjects | Bond strength Characterization and Evaluation of Materials Chemistry and Materials Science Electronics and Microelectronics Heat conductivity Instrumentation Materials Science Optical and Electronic Materials Silver Solid State Physics |
title | Effect of Silver Flakes in Silver Paste on the Joining Process and Properties of Sandwich Power Modules (IGBTs Chip/Silver Paste/Bare Cu) |
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