Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes

Functional fault diagnosis is widely used in board manufacturing to ensure product quality and improve product yield. Advanced machine-learning techniques have recently been advocated for reasoning-based diagnosis; these techniques are based on the historical record of successfully repaired boards....

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Veröffentlicht in:IEEE transactions on computer-aided design of integrated circuits and systems 2016-06, Vol.35 (6), p.985-998
Hauptverfasser: Shi Jin, Fangming Ye, Zhaobo Zhang, Chakrabarty, Krishnendu, Xinli Gu
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container_title IEEE transactions on computer-aided design of integrated circuits and systems
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creator Shi Jin
Fangming Ye
Zhaobo Zhang
Chakrabarty, Krishnendu
Xinli Gu
description Functional fault diagnosis is widely used in board manufacturing to ensure product quality and improve product yield. Advanced machine-learning techniques have recently been advocated for reasoning-based diagnosis; these techniques are based on the historical record of successfully repaired boards. However, traditional diagnosis systems fail to provide appropriate repair suggestions when the diagnostic logs are fragmented and some error outcomes, or syndromes, are not available during diagnosis. We describe the design of a diagnosis system that can handle missing syndromes and can be applied to four widely used machine-learning techniques. Several imputation methods are discussed and compared in terms of their effectiveness for addressing missing syndromes. Moreover, a syndrome-selection technique based on the minimum-redundancy-maximum-relevance criteria is also incorporated to further improve the efficiency of the proposed methods. Two large-scale synthetic data sets generated from the log information of complex industrial boards in volume production are used to validate the proposed diagnosis system in terms of diagnosis accuracy and training time.
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_1790678189</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7275129</ieee_id><sourcerecordid>1816064787</sourcerecordid><originalsourceid>FETCH-LOGICAL-c369t-3ff7b4841437401b9eff860d7504ae934937ee992e9ac2df4078fb0a51679f783</originalsourceid><addsrcrecordid>eNpdkD1PwzAQhi0EEqXwAxBLJBaWlLvEie2x9AukIgaKGC03PRdXaVLsBKn_nlStGJjuhud9dfcwdoswQAT1uBgNx4MEMBskXKLM1BnroUpFzDHDc9aDRMgYQMAluwphA4A8S1SPzSbWusJR1URPtfGreE4_VEbTtioaV1emW01bNtHYmXVVBxeiT9d8Ra8uBFeto_d9tfL1lsI1u7CmDHRzmn32MZ0sRs_x_G32MhrO4yLNVROn1oollxx5KjjgUpG1MoeVyIAbUinvTiZSKiFlimRlOQhpl2AyzIWyQqZ99nDs3fn6u6XQ6K0LBZWlqahug0aJOeRcSNGh9__QTd367qWOEgpy0XlSHYVHqvB1CJ6s3nm3NX6vEfRBrT6o1Qe1-qS2y9wdM46I_niRiAwTlf4C7BBzNQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1790678189</pqid></control><display><type>article</type><title>Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes</title><source>IEEE Electronic Library (IEL)</source><creator>Shi Jin ; Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu</creator><creatorcontrib>Shi Jin ; Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu</creatorcontrib><description>Functional fault diagnosis is widely used in board manufacturing to ensure product quality and improve product yield. Advanced machine-learning techniques have recently been advocated for reasoning-based diagnosis; these techniques are based on the historical record of successfully repaired boards. However, traditional diagnosis systems fail to provide appropriate repair suggestions when the diagnostic logs are fragmented and some error outcomes, or syndromes, are not available during diagnosis. We describe the design of a diagnosis system that can handle missing syndromes and can be applied to four widely used machine-learning techniques. Several imputation methods are discussed and compared in terms of their effectiveness for addressing missing syndromes. Moreover, a syndrome-selection technique based on the minimum-redundancy-maximum-relevance criteria is also incorporated to further improve the efficiency of the proposed methods. Two large-scale synthetic data sets generated from the log information of complex industrial boards in volume production are used to validate the proposed diagnosis system in terms of diagnosis accuracy and training time.</description><identifier>ISSN: 0278-0070</identifier><identifier>EISSN: 1937-4151</identifier><identifier>DOI: 10.1109/TCAD.2015.2481859</identifier><identifier>CODEN: ITCSDI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Accuracy ; Board-level functional fault diagnosis ; Boards ; Circuit faults ; Design engineering ; Diagnosis ; Diagnostic systems ; Disorders ; Fault diagnosis ; feature selection ; Historic ; machine-learning techniques ; Maintenance engineering ; missing syndromes ; Niobium ; Training ; Training data</subject><ispartof>IEEE transactions on computer-aided design of integrated circuits and systems, 2016-06, Vol.35 (6), p.985-998</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-3ff7b4841437401b9eff860d7504ae934937ee992e9ac2df4078fb0a51679f783</citedby><cites>FETCH-LOGICAL-c369t-3ff7b4841437401b9eff860d7504ae934937ee992e9ac2df4078fb0a51679f783</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7275129$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7275129$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Shi Jin</creatorcontrib><creatorcontrib>Fangming Ye</creatorcontrib><creatorcontrib>Zhaobo Zhang</creatorcontrib><creatorcontrib>Chakrabarty, Krishnendu</creatorcontrib><creatorcontrib>Xinli Gu</creatorcontrib><title>Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes</title><title>IEEE transactions on computer-aided design of integrated circuits and systems</title><addtitle>TCAD</addtitle><description>Functional fault diagnosis is widely used in board manufacturing to ensure product quality and improve product yield. Advanced machine-learning techniques have recently been advocated for reasoning-based diagnosis; these techniques are based on the historical record of successfully repaired boards. However, traditional diagnosis systems fail to provide appropriate repair suggestions when the diagnostic logs are fragmented and some error outcomes, or syndromes, are not available during diagnosis. We describe the design of a diagnosis system that can handle missing syndromes and can be applied to four widely used machine-learning techniques. Several imputation methods are discussed and compared in terms of their effectiveness for addressing missing syndromes. Moreover, a syndrome-selection technique based on the minimum-redundancy-maximum-relevance criteria is also incorporated to further improve the efficiency of the proposed methods. Two large-scale synthetic data sets generated from the log information of complex industrial boards in volume production are used to validate the proposed diagnosis system in terms of diagnosis accuracy and training time.</description><subject>Accuracy</subject><subject>Board-level functional fault diagnosis</subject><subject>Boards</subject><subject>Circuit faults</subject><subject>Design engineering</subject><subject>Diagnosis</subject><subject>Diagnostic systems</subject><subject>Disorders</subject><subject>Fault diagnosis</subject><subject>feature selection</subject><subject>Historic</subject><subject>machine-learning techniques</subject><subject>Maintenance engineering</subject><subject>missing syndromes</subject><subject>Niobium</subject><subject>Training</subject><subject>Training data</subject><issn>0278-0070</issn><issn>1937-4151</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkD1PwzAQhi0EEqXwAxBLJBaWlLvEie2x9AukIgaKGC03PRdXaVLsBKn_nlStGJjuhud9dfcwdoswQAT1uBgNx4MEMBskXKLM1BnroUpFzDHDc9aDRMgYQMAluwphA4A8S1SPzSbWusJR1URPtfGreE4_VEbTtioaV1emW01bNtHYmXVVBxeiT9d8Ra8uBFeto_d9tfL1lsI1u7CmDHRzmn32MZ0sRs_x_G32MhrO4yLNVROn1oollxx5KjjgUpG1MoeVyIAbUinvTiZSKiFlimRlOQhpl2AyzIWyQqZ99nDs3fn6u6XQ6K0LBZWlqahug0aJOeRcSNGh9__QTd367qWOEgpy0XlSHYVHqvB1CJ6s3nm3NX6vEfRBrT6o1Qe1-qS2y9wdM46I_niRiAwTlf4C7BBzNQ</recordid><startdate>201606</startdate><enddate>201606</enddate><creator>Shi Jin</creator><creator>Fangming Ye</creator><creator>Zhaobo Zhang</creator><creator>Chakrabarty, Krishnendu</creator><creator>Xinli Gu</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201606</creationdate><title>Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes</title><author>Shi Jin ; Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-3ff7b4841437401b9eff860d7504ae934937ee992e9ac2df4078fb0a51679f783</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Accuracy</topic><topic>Board-level functional fault diagnosis</topic><topic>Boards</topic><topic>Circuit faults</topic><topic>Design engineering</topic><topic>Diagnosis</topic><topic>Diagnostic systems</topic><topic>Disorders</topic><topic>Fault diagnosis</topic><topic>feature selection</topic><topic>Historic</topic><topic>machine-learning techniques</topic><topic>Maintenance engineering</topic><topic>missing syndromes</topic><topic>Niobium</topic><topic>Training</topic><topic>Training data</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shi Jin</creatorcontrib><creatorcontrib>Fangming Ye</creatorcontrib><creatorcontrib>Zhaobo Zhang</creatorcontrib><creatorcontrib>Chakrabarty, Krishnendu</creatorcontrib><creatorcontrib>Xinli Gu</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on computer-aided design of integrated circuits and systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shi Jin</au><au>Fangming Ye</au><au>Zhaobo Zhang</au><au>Chakrabarty, Krishnendu</au><au>Xinli Gu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes</atitle><jtitle>IEEE transactions on computer-aided design of integrated circuits and systems</jtitle><stitle>TCAD</stitle><date>2016-06</date><risdate>2016</risdate><volume>35</volume><issue>6</issue><spage>985</spage><epage>998</epage><pages>985-998</pages><issn>0278-0070</issn><eissn>1937-4151</eissn><coden>ITCSDI</coden><abstract>Functional fault diagnosis is widely used in board manufacturing to ensure product quality and improve product yield. Advanced machine-learning techniques have recently been advocated for reasoning-based diagnosis; these techniques are based on the historical record of successfully repaired boards. However, traditional diagnosis systems fail to provide appropriate repair suggestions when the diagnostic logs are fragmented and some error outcomes, or syndromes, are not available during diagnosis. We describe the design of a diagnosis system that can handle missing syndromes and can be applied to four widely used machine-learning techniques. Several imputation methods are discussed and compared in terms of their effectiveness for addressing missing syndromes. Moreover, a syndrome-selection technique based on the minimum-redundancy-maximum-relevance criteria is also incorporated to further improve the efficiency of the proposed methods. Two large-scale synthetic data sets generated from the log information of complex industrial boards in volume production are used to validate the proposed diagnosis system in terms of diagnosis accuracy and training time.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCAD.2015.2481859</doi><tpages>14</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
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1937-4151
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recordid cdi_proquest_journals_1790678189
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subjects Accuracy
Board-level functional fault diagnosis
Boards
Circuit faults
Design engineering
Diagnosis
Diagnostic systems
Disorders
Fault diagnosis
feature selection
Historic
machine-learning techniques
Maintenance engineering
missing syndromes
Niobium
Training
Training data
title Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T20%3A16%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Efficient%20Board-Level%20Functional%20Fault%20Diagnosis%20With%20Missing%20Syndromes&rft.jtitle=IEEE%20transactions%20on%20computer-aided%20design%20of%20integrated%20circuits%20and%20systems&rft.au=Shi%20Jin&rft.date=2016-06&rft.volume=35&rft.issue=6&rft.spage=985&rft.epage=998&rft.pages=985-998&rft.issn=0278-0070&rft.eissn=1937-4151&rft.coden=ITCSDI&rft_id=info:doi/10.1109/TCAD.2015.2481859&rft_dat=%3Cproquest_RIE%3E1816064787%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1790678189&rft_id=info:pmid/&rft_ieee_id=7275129&rfr_iscdi=true