Dielectric and Conduction Processes and Behaviours in Ni0.3Zn0.7Fe2O4

Dielectric relaxation and conductivity of Ni0.3Zn0.7Fe2O4 (NZF) were studied in the frequency range between 0.01 Hz to 3 MHz and temperature range within 313 K to 473 K. The sample was prepared by mixing Zinc Oxide, Nickel Oxide and Iron Oxide and sintered at 1573 K for 10 hours long. Dielectric pro...

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Veröffentlicht in:Materials science forum 2016-03, Vol.846, p.311-317
Hauptverfasser: Zainuddin, Y., Aiman, T.I.T.M., Wan Yusoff, Wan Mohd Daud, Nizam, H., Halimah, M.K., Mat, Mohd Noor, Mansor, H.
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container_start_page 311
container_title Materials science forum
container_volume 846
creator Zainuddin, Y.
Aiman, T.I.T.M.
Wan Yusoff, Wan Mohd Daud
Nizam, H.
Halimah, M.K.
Mat, Mohd Noor
Mansor, H.
description Dielectric relaxation and conductivity of Ni0.3Zn0.7Fe2O4 (NZF) were studied in the frequency range between 0.01 Hz to 3 MHz and temperature range within 313 K to 473 K. The sample was prepared by mixing Zinc Oxide, Nickel Oxide and Iron Oxide and sintered at 1573 K for 10 hours long. Dielectric properties were studied using Novo Control Dielectric Spectrometer. Dielectric relaxation and conductivity phenomena were discussed using an empirical model to key out the dielectric relaxation process. Analyze peak frequency relaxation process consist of four slopes to explain the dielectric relaxation process. The conductivity of the sample indicates an activated process and activation energy of dc conductivity is 0.44 ± 0.01 eV.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1790069365</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>4062098071</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2711-3e195d8843aade5e77eaaaf9d1579b112264aec8aa797e78b8f46371907d41f93</originalsourceid><addsrcrecordid>eNqNkE1LAzEURYMoWKv_YUBwN9Nk8r0RtbYqVCuoGzchzbzBSM1oMrX4741W0KWrt7iXcx8HoSOCK4ZrNVqv11VyHkLvW--qAP3o-m5aKSYqSsgWGhAh6lJLXm-jAa45LzmTYhftpfSMMSWKiAGanHtYguujd4UNTTHuQrNyve9CcRs7BylB-g7O4Mm--24VU-FDceNxRR8DruQU6jnbRzutXSY4-LlD9DCd3I8vy9n84mp8OitdLQkpKRDNG6UYtbYBDlKCtbbVDeFSLwipa8EsOGWt1BKkWqiWCSqJxrJhpNV0iA433NfYva0g9eY5fxTypCFSYyw0FTy3jjctF7uUIrTmNfoXGz8MweZLncnqzK86k9WZrM5kdSary4CTDaCPNqQe3NOfnf8hPgFK-n47</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1790069365</pqid></control><display><type>article</type><title>Dielectric and Conduction Processes and Behaviours in Ni0.3Zn0.7Fe2O4</title><source>ProQuest Central Essentials</source><source>ProQuest Central (Alumni Edition)</source><source>ProQuest Central Student</source><source>Scientific.net Journals</source><creator>Zainuddin, Y. ; Aiman, T.I.T.M. ; Wan Yusoff, Wan Mohd Daud ; Nizam, H. ; Halimah, M.K. ; Mat, Mohd Noor ; Mansor, H.</creator><creatorcontrib>Zainuddin, Y. ; Aiman, T.I.T.M. ; Wan Yusoff, Wan Mohd Daud ; Nizam, H. ; Halimah, M.K. ; Mat, Mohd Noor ; Mansor, H.</creatorcontrib><description>Dielectric relaxation and conductivity of Ni0.3Zn0.7Fe2O4 (NZF) were studied in the frequency range between 0.01 Hz to 3 MHz and temperature range within 313 K to 473 K. The sample was prepared by mixing Zinc Oxide, Nickel Oxide and Iron Oxide and sintered at 1573 K for 10 hours long. Dielectric properties were studied using Novo Control Dielectric Spectrometer. Dielectric relaxation and conductivity phenomena were discussed using an empirical model to key out the dielectric relaxation process. Analyze peak frequency relaxation process consist of four slopes to explain the dielectric relaxation process. The conductivity of the sample indicates an activated process and activation energy of dc conductivity is 0.44 ± 0.01 eV.</description><identifier>ISSN: 0255-5476</identifier><identifier>ISSN: 1662-9752</identifier><identifier>EISSN: 1662-9752</identifier><identifier>DOI: 10.4028/www.scientific.net/MSF.846.311</identifier><language>eng</language><publisher>Pfaffikon: Trans Tech Publications Ltd</publisher><ispartof>Materials science forum, 2016-03, Vol.846, p.311-317</ispartof><rights>2016 Trans Tech Publications Ltd</rights><rights>Copyright Trans Tech Publications Ltd. Mar 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2711-3e195d8843aade5e77eaaaf9d1579b112264aec8aa797e78b8f46371907d41f93</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/3813?width=600</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/1790069365?pq-origsite=primo$$EHTML$$P50$$Gproquest$$H</linktohtml><link.rule.ids>314,780,784,21389,21390,23256,27924,27925,33530,33703,34314,43659,43787,44067</link.rule.ids></links><search><creatorcontrib>Zainuddin, Y.</creatorcontrib><creatorcontrib>Aiman, T.I.T.M.</creatorcontrib><creatorcontrib>Wan Yusoff, Wan Mohd Daud</creatorcontrib><creatorcontrib>Nizam, H.</creatorcontrib><creatorcontrib>Halimah, M.K.</creatorcontrib><creatorcontrib>Mat, Mohd Noor</creatorcontrib><creatorcontrib>Mansor, H.</creatorcontrib><title>Dielectric and Conduction Processes and Behaviours in Ni0.3Zn0.7Fe2O4</title><title>Materials science forum</title><description>Dielectric relaxation and conductivity of Ni0.3Zn0.7Fe2O4 (NZF) were studied in the frequency range between 0.01 Hz to 3 MHz and temperature range within 313 K to 473 K. The sample was prepared by mixing Zinc Oxide, Nickel Oxide and Iron Oxide and sintered at 1573 K for 10 hours long. Dielectric properties were studied using Novo Control Dielectric Spectrometer. Dielectric relaxation and conductivity phenomena were discussed using an empirical model to key out the dielectric relaxation process. Analyze peak frequency relaxation process consist of four slopes to explain the dielectric relaxation process. The conductivity of the sample indicates an activated process and activation energy of dc conductivity is 0.44 ± 0.01 eV.</description><issn>0255-5476</issn><issn>1662-9752</issn><issn>1662-9752</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNqNkE1LAzEURYMoWKv_YUBwN9Nk8r0RtbYqVCuoGzchzbzBSM1oMrX4741W0KWrt7iXcx8HoSOCK4ZrNVqv11VyHkLvW--qAP3o-m5aKSYqSsgWGhAh6lJLXm-jAa45LzmTYhftpfSMMSWKiAGanHtYguujd4UNTTHuQrNyve9CcRs7BylB-g7O4Mm--24VU-FDceNxRR8DruQU6jnbRzutXSY4-LlD9DCd3I8vy9n84mp8OitdLQkpKRDNG6UYtbYBDlKCtbbVDeFSLwipa8EsOGWt1BKkWqiWCSqJxrJhpNV0iA433NfYva0g9eY5fxTypCFSYyw0FTy3jjctF7uUIrTmNfoXGz8MweZLncnqzK86k9WZrM5kdSary4CTDaCPNqQe3NOfnf8hPgFK-n47</recordid><startdate>20160304</startdate><enddate>20160304</enddate><creator>Zainuddin, Y.</creator><creator>Aiman, T.I.T.M.</creator><creator>Wan Yusoff, Wan Mohd Daud</creator><creator>Nizam, H.</creator><creator>Halimah, M.K.</creator><creator>Mat, Mohd Noor</creator><creator>Mansor, H.</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7SR</scope><scope>7XB</scope><scope>88I</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>M2P</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>Q9U</scope></search><sort><creationdate>20160304</creationdate><title>Dielectric and Conduction Processes and Behaviours in Ni0.3Zn0.7Fe2O4</title><author>Zainuddin, Y. ; Aiman, T.I.T.M. ; Wan Yusoff, Wan Mohd Daud ; Nizam, H. ; Halimah, M.K. ; Mat, Mohd Noor ; Mansor, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2711-3e195d8843aade5e77eaaaf9d1579b112264aec8aa797e78b8f46371907d41f93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zainuddin, Y.</creatorcontrib><creatorcontrib>Aiman, T.I.T.M.</creatorcontrib><creatorcontrib>Wan Yusoff, Wan Mohd Daud</creatorcontrib><creatorcontrib>Nizam, H.</creatorcontrib><creatorcontrib>Halimah, M.K.</creatorcontrib><creatorcontrib>Mat, Mohd Noor</creatorcontrib><creatorcontrib>Mansor, H.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Engineered Materials Abstracts</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Science Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>ProQuest Central Basic</collection><jtitle>Materials science forum</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zainuddin, Y.</au><au>Aiman, T.I.T.M.</au><au>Wan Yusoff, Wan Mohd Daud</au><au>Nizam, H.</au><au>Halimah, M.K.</au><au>Mat, Mohd Noor</au><au>Mansor, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dielectric and Conduction Processes and Behaviours in Ni0.3Zn0.7Fe2O4</atitle><jtitle>Materials science forum</jtitle><date>2016-03-04</date><risdate>2016</risdate><volume>846</volume><spage>311</spage><epage>317</epage><pages>311-317</pages><issn>0255-5476</issn><issn>1662-9752</issn><eissn>1662-9752</eissn><abstract>Dielectric relaxation and conductivity of Ni0.3Zn0.7Fe2O4 (NZF) were studied in the frequency range between 0.01 Hz to 3 MHz and temperature range within 313 K to 473 K. The sample was prepared by mixing Zinc Oxide, Nickel Oxide and Iron Oxide and sintered at 1573 K for 10 hours long. Dielectric properties were studied using Novo Control Dielectric Spectrometer. Dielectric relaxation and conductivity phenomena were discussed using an empirical model to key out the dielectric relaxation process. Analyze peak frequency relaxation process consist of four slopes to explain the dielectric relaxation process. The conductivity of the sample indicates an activated process and activation energy of dc conductivity is 0.44 ± 0.01 eV.</abstract><cop>Pfaffikon</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/MSF.846.311</doi><tpages>7</tpages></addata></record>
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title Dielectric and Conduction Processes and Behaviours in Ni0.3Zn0.7Fe2O4
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T09%3A22%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Dielectric%20and%20Conduction%20Processes%20and%20Behaviours%20in%20Ni0.3Zn0.7Fe2O4&rft.jtitle=Materials%20science%20forum&rft.au=Zainuddin,%20Y.&rft.date=2016-03-04&rft.volume=846&rft.spage=311&rft.epage=317&rft.pages=311-317&rft.issn=0255-5476&rft.eissn=1662-9752&rft_id=info:doi/10.4028/www.scientific.net/MSF.846.311&rft_dat=%3Cproquest_cross%3E4062098071%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1790069365&rft_id=info:pmid/&rfr_iscdi=true