Experimental Results of an E-Field Probe Using Variable Resistors to Improve Performance
In this letter, experimental results are shown for an E-field probe using variable chip resistor values to improve performance. The E-field probe consists of three small orthogonal dipoles with a diode and a lossy transmission line. Since the transmission line does not receive transmitted signals di...
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Veröffentlicht in: | IEEE antennas and wireless propagation letters 2016, Vol.15, p.1369-1372 |
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description | In this letter, experimental results are shown for an E-field probe using variable chip resistor values to improve performance. The E-field probe consists of three small orthogonal dipoles with a diode and a lossy transmission line. Since the transmission line does not receive transmitted signals directly or indirectly, a high impedance value of the transmission line is required. To achieve such a high impedance value, chip resistors are inserted in the transmission line. In this letter, variable resistors are used in the transmission line to improve probe performance of such areas as sensitivity and isotropy. Finally, probes with identical and variable resistance values are fabricated, performance levels are measured, and characteristics are compared. |
doi_str_mv | 10.1109/LAWP.2015.2510009 |
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The E-field probe consists of three small orthogonal dipoles with a diode and a lossy transmission line. Since the transmission line does not receive transmitted signals directly or indirectly, a high impedance value of the transmission line is required. To achieve such a high impedance value, chip resistors are inserted in the transmission line. In this letter, variable resistors are used in the transmission line to improve probe performance of such areas as sensitivity and isotropy. 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Finally, probes with identical and variable resistance values are fabricated, performance levels are measured, and characteristics are compared.</description><subject>Electrical resistance measurement</subject><subject>Frequency measurement</subject><subject>Isotropy</subject><subject>Power measurement</subject><subject>Power transmission lines</subject><subject>probe</subject><subject>Probes</subject><subject>Resistors</subject><subject>sensitivity</subject><subject>Transmission line measurements</subject><issn>1536-1225</issn><issn>1548-5757</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE9LAzEQxYMoWKsfQLwEPG-dZJPN5lhKq4WCRax6W5J0Klu2m5psRb-9WVo8zYP5vfnzCLllMGIM9MNi_L4ccWByxCUDAH1GBkyKMpNKqvNe50XGOJeX5CrGLQBThcwH5GP6s8dQ77DtTENfMB6aLlK_oaal02xWY7Omy-At0lWs20_6ZkJtbIM9WsfOh0g7T-e7ffDfSJcYNj7sTOvwmlxsTBPx5lSHZDWbvk6essXz43wyXmSO67zLinRTYblYO0gCAVGAK4WSGrixCIUtVeo4p7VwgqO0VlvDFHdgjGI6H5L749x0wdcBY1dt_SG0aWXFVKlYmRiRKHakXPAxBtxU-_S0Cb8Vg6oPsOoDrPoAq1OAyXN39NSI-M-rvAAmeP4HQyJrbA</recordid><startdate>2016</startdate><enddate>2016</enddate><creator>Kwak, Sang il</creator><creator>Kwon, Jong Hwa</creator><creator>Yoon, Young Joong</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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subjects | Electrical resistance measurement Frequency measurement Isotropy Power measurement Power transmission lines probe Probes Resistors sensitivity Transmission line measurements |
title | Experimental Results of an E-Field Probe Using Variable Resistors to Improve Performance |
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