Mechanical Properties and Strain-Induced Filament Degradation of Ex Situ and In Situ MgB2 Wires

We have compared the mechanical properties and the degradation of the critical current after uniaxial tensile loading at room temperature (RT) and at 77 K of ex situ and in situ MgB 2 wires. The strain that the wires can withstand without degradation is at 77 K substantially higher than at RT. In or...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 2016-04, Vol.26 (3), p.1-5
Hauptverfasser:	Alknes, P., Hagner, M., Bjoerstad, R., Scheuerlein, C., Bordini, B., Sugano, M., Hudspeth, J., Ballarino, A.
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Sprache:	eng
Schlagworte:	Degradation Integrated circuits lattice distortion Lattices MgB2 Niobium Strain Stress Superconductor Wires XRD
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creator	Alknes, P. Hagner, M. Bjoerstad, R. Scheuerlein, C. Bordini, B. Sugano, M. Hudspeth, J. Ballarino, A.
description	We have compared the mechanical properties and the degradation of the critical current after uniaxial tensile loading at room temperature (RT) and at 77 K of ex situ and in situ MgB 2 wires. The strain that the wires can withstand without degradation is at 77 K substantially higher than at RT. In order to explain the mechanical behavior of the wires, the lattice distortions of the different wire constituents and their texture have been measured simultaneously with the composite wire stress and strain in a high-energy synchrotron beamline. The different MgB 2 microstructure in both wire types is revealed in filament cross sections prepared by the focused-ion-beam technique and in fracture surfaces.
doi_str_mv	10.1109/TASC.2015.2509166
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The strain that the wires can withstand without degradation is at 77 K substantially higher than at RT. In order to explain the mechanical behavior of the wires, the lattice distortions of the different wire constituents and their texture have been measured simultaneously with the composite wire stress and strain in a high-energy synchrotron beamline. The different MgB 2 microstructure in both wire types is revealed in filament cross sections prepared by the focused-ion-beam technique and in fracture surfaces.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2015.2509166</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Degradation ; Integrated circuits ; lattice distortion ; Lattices ; MgB2 ; Niobium ; Strain ; Stress ; Superconductor ; Wires ; XRD</subject><ispartof>IEEE transactions on applied superconductivity, 2016-04, Vol.26 (3), p.1-5</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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subjects	Degradation Integrated circuits lattice distortion Lattices MgB2 Niobium Strain Stress Superconductor Wires XRD
title	Mechanical Properties and Strain-Induced Filament Degradation of Ex Situ and In Situ MgB2 Wires
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