Fault Detection Circuit Based on IGBT Gate Signal
The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the...
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| Veröffentlicht in: | Revista IEEE América Latina 2016-02, Vol.14 (2), p.541-548 |
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| creator | Flores, Eligio Claudio, Abraham Aguayo, Jesus Hernandez, Leobardo |
| description | The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases. |
| doi_str_mv | 10.1109/TLA.2016.7437190 |
| format | Article |
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The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases.</description><identifier>ISSN: 1548-0992</identifier><identifier>EISSN: 1548-0992</identifier><identifier>DOI: 10.1109/TLA.2016.7437190</identifier><language>eng</language><publisher>Los Alamitos: IEEE</publisher><subject>Capacitance ; Circuit design ; Circuits ; Devices ; Early Fault detection ; Electrical fault detection ; Fault detection ; fault detection signals ; Faults ; Gates (circuits) ; IGBT devices ; Insulated gate bipolar transistors ; Monitoring ; Short circuit and Open circuit Faults ; Short circuits ; Switching ; Switching circuits</subject><ispartof>Revista IEEE América Latina, 2016-02, Vol.14 (2), p.541-548</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases.</description><subject>Capacitance</subject><subject>Circuit design</subject><subject>Circuits</subject><subject>Devices</subject><subject>Early Fault detection</subject><subject>Electrical fault detection</subject><subject>Fault detection</subject><subject>fault detection signals</subject><subject>Faults</subject><subject>Gates (circuits)</subject><subject>IGBT devices</subject><subject>Insulated gate bipolar transistors</subject><subject>Monitoring</subject><subject>Short circuit and Open circuit Faults</subject><subject>Short circuits</subject><subject>Switching</subject><subject>Switching circuits</subject><issn>1548-0992</issn><issn>1548-0992</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkDFPwzAQRi0EEqWwI7FEYmFJOeeS2B7bQkulSgxkt4zjIFdpUmxn4N_jKgUhpjvdve90eoTcUphRCuKx2s5nGdByxnJkVMAZmdAi5ykIkZ3_6S_Jlfc7AOQlxwmhKzW0IXkywehg-y5ZWqcHG5KF8qZO4mCzXlTJWgWTvNmPTrXX5KJRrTc3pzol1eq5Wr6k29f1Zjnfpjor8pBSrDkwjagho8h42TTMiELVRa55jQoF1ghlpt5zJTiNz5RKNDwXGpqsZDglD-PZg-s_B-OD3FuvTduqzvSDl5TTQvAiBiJ6_w_d9YOLr0aKcQbAEHmkYKS06713ppEHZ_fKfUkK8qhQRoXyqFCeFMbI3Rixxphf_Gf7DbrKaK0</recordid><startdate>20160201</startdate><enddate>20160201</enddate><creator>Flores, Eligio</creator><creator>Claudio, Abraham</creator><creator>Aguayo, Jesus</creator><creator>Hernandez, Leobardo</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20160201</creationdate><title>Fault Detection Circuit Based on IGBT Gate Signal</title><author>Flores, Eligio ; Claudio, Abraham ; Aguayo, Jesus ; Hernandez, Leobardo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c254t-13d807c33c0213786ff7e95ad54c8d3a393d3062ab4a9816836a9f849c0f2673</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Capacitance</topic><topic>Circuit design</topic><topic>Circuits</topic><topic>Devices</topic><topic>Early Fault detection</topic><topic>Electrical fault detection</topic><topic>Fault detection</topic><topic>fault detection signals</topic><topic>Faults</topic><topic>Gates (circuits)</topic><topic>IGBT devices</topic><topic>Insulated gate bipolar transistors</topic><topic>Monitoring</topic><topic>Short circuit and Open circuit Faults</topic><topic>Short circuits</topic><topic>Switching</topic><topic>Switching circuits</topic><toplevel>online_resources</toplevel><creatorcontrib>Flores, Eligio</creatorcontrib><creatorcontrib>Claudio, Abraham</creatorcontrib><creatorcontrib>Aguayo, Jesus</creatorcontrib><creatorcontrib>Hernandez, Leobardo</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>Revista IEEE América Latina</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Flores, Eligio</au><au>Claudio, Abraham</au><au>Aguayo, Jesus</au><au>Hernandez, Leobardo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fault Detection Circuit Based on IGBT Gate Signal</atitle><jtitle>Revista IEEE América Latina</jtitle><stitle>T-LA</stitle><date>2016-02-01</date><risdate>2016</risdate><volume>14</volume><issue>2</issue><spage>541</spage><epage>548</epage><pages>541-548</pages><issn>1548-0992</issn><eissn>1548-0992</eissn><abstract>The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). 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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Capacitance Circuit design Circuits Devices Early Fault detection Electrical fault detection Fault detection fault detection signals Faults Gates (circuits) IGBT devices Insulated gate bipolar transistors Monitoring Short circuit and Open circuit Faults Short circuits Switching Switching circuits |
| title | Fault Detection Circuit Based on IGBT Gate Signal |
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