A proposed standard for loss measurements on printed circuit boards
As components increase their rate of data processing the Printed Circuit Board is expected to transfer data at ever faster rates to keep pace. Beyond 2 Gb/s the impact of dielectric loss becomes a critical factor in the design process. Agreement of loss measurements between PCB manufacturers and the...
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creator | Harper, M.R Ridler, N.M Salter, M.J |
description | As components increase their rate of data processing the Printed Circuit Board is expected to transfer data at ever faster rates to keep pace. Beyond 2 Gb/s the impact of dielectric loss becomes a critical factor in the design process. Agreement of loss measurements between PCB manufacturers and their customer base can be crucial in ensuring that design tolerances are met. |
doi_str_mv | 10.1049/ic.2012.0067 |
format | Conference Proceeding |
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Beyond 2 Gb/s the impact of dielectric loss becomes a critical factor in the design process. 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Agreement of loss measurements between PCB manufacturers and their customer base can be crucial in ensuring that design tolerances are met.</description><subject>Dielectric variables measurement</subject><subject>General circuit analysis and synthesis methods</subject><subject>Printed circuit layout and design</subject><isbn>9781849195423</isbn><isbn>1849195420</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNotkEtrAyEURoVSaEln1x8gdFkm9TWOLkPoCwLdtGsxegVDoqk6_7-GdHU3h_sdDkKPlKwpEfolujUjlK0JkfMNGvSsqBKa6kkwfoeGWg-EEKqlkpLfo-0Gn0s-5woe12aTt8XjkAs-5lrxCWxdCpwgtYpz6mhMrZMuFrfEhve54_UB3QZ7rDD83xX6eXv93n6Mu6_3z-1mN0bKRRu1FtJNHBybvfDAJVjFCLHTBN7viaZKcRUo811UeRmY51o6J9gcuq4NfIWern-78e8CtZlDXkrqk4bO80Ql54R16vlKRWjG5RSgQHLQGWIugUx05hLIXALxP_t6WSs</recordid><startdate>2012</startdate><enddate>2012</enddate><creator>Harper, M.R</creator><creator>Ridler, N.M</creator><creator>Salter, M.J</creator><general>IET</general><general>The Institution of Engineering & Technology</general><scope>8ET</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>L6V</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>2012</creationdate><title>A proposed standard for loss measurements on printed circuit boards</title><author>Harper, M.R ; Ridler, N.M ; Salter, M.J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i134t-9946c53ec27d4de36ea8200a55eddb0918838f12d4238d6f2d396cc427f196af3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Dielectric variables measurement</topic><topic>General circuit analysis and synthesis methods</topic><topic>Printed circuit layout and design</topic><toplevel>online_resources</toplevel><creatorcontrib>Harper, M.R</creatorcontrib><creatorcontrib>Ridler, N.M</creatorcontrib><creatorcontrib>Salter, M.J</creatorcontrib><collection>IET Conference Publications by volume</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Harper, M.R</au><au>Ridler, N.M</au><au>Salter, M.J</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A proposed standard for loss measurements on printed circuit boards</atitle><btitle>3rd Annual Seminar on Passive RF and Microwave Components</btitle><date>2012</date><risdate>2012</risdate><spage>85</spage><pages>85-</pages><isbn>9781849195423</isbn><isbn>1849195420</isbn><abstract>As components increase their rate of data processing the Printed Circuit Board is expected to transfer data at ever faster rates to keep pace. Beyond 2 Gb/s the impact of dielectric loss becomes a critical factor in the design process. Agreement of loss measurements between PCB manufacturers and their customer base can be crucial in ensuring that design tolerances are met.</abstract><cop>Stevenage, UK</cop><pub>IET</pub><doi>10.1049/ic.2012.0067</doi></addata></record> |
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identifier | ISBN: 9781849195423 |
ispartof | 3rd Annual Seminar on Passive RF and Microwave Components, 2012, p.85 |
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language | eng |
recordid | cdi_proquest_journals_1775163302 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Dielectric variables measurement General circuit analysis and synthesis methods Printed circuit layout and design |
title | A proposed standard for loss measurements on printed circuit boards |
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