Dimer Configuration of Si(001)2×1 Surface by Projected Potential Approach of Reflection High-Energy Electron Diffraction
The configuration of asymmetric dimers on the Si(001)2×1 surface was investigated at room temperature (RT) and high temperature (HT) by measurements of many-beam rocking curves of reflection high-energy electron diffraction (RHEED). We propose a novel projected potential approach for analyzing the d...
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Veröffentlicht in: | E-journal of surface science and nanotechnology 2014/08/09, Vol.12, pp.380-386 |
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description | The configuration of asymmetric dimers on the Si(001)2×1 surface was investigated at room temperature (RT) and high temperature (HT) by measurements of many-beam rocking curves of reflection high-energy electron diffraction (RHEED). We propose a novel projected potential approach for analyzing the dynamic structure of the Si(001)2×1 surface, on which high frequency flip-flop of asymmetric dimers occurs. This method is based on reciprocal lattice rods in the 0th Laue zone, which represent Fourier components of the projected crystal potential along the incident azimuth, so that the cross-sectional surface structure that is perpendicular to the incident azimuth can be investigated. It has been confirmed that this approach is effective for such dynamic surface structures with randomly flipping dimers. The asymmetric dimer configuration for the Si(001)2×1 surface at RT was determined to be fundamentally the same as that for the static Si(001)c(4×2) surface. The dimer relaxation into a symmetric configuration was confirmed to occur at a HT of approximately 1000 K. [DOI: 10.1380/ejssnt.2014.380] |
doi_str_mv | 10.1380/ejssnt.2014.380 |
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We propose a novel projected potential approach for analyzing the dynamic structure of the Si(001)2×1 surface, on which high frequency flip-flop of asymmetric dimers occurs. This method is based on reciprocal lattice rods in the 0th Laue zone, which represent Fourier components of the projected crystal potential along the incident azimuth, so that the cross-sectional surface structure that is perpendicular to the incident azimuth can be investigated. It has been confirmed that this approach is effective for such dynamic surface structures with randomly flipping dimers. The asymmetric dimer configuration for the Si(001)2×1 surface at RT was determined to be fundamentally the same as that for the static Si(001)c(4×2) surface. The dimer relaxation into a symmetric configuration was confirmed to occur at a HT of approximately 1000 K. 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Surf. Sci. Nanotechnol.</addtitle><description>The configuration of asymmetric dimers on the Si(001)2×1 surface was investigated at room temperature (RT) and high temperature (HT) by measurements of many-beam rocking curves of reflection high-energy electron diffraction (RHEED). We propose a novel projected potential approach for analyzing the dynamic structure of the Si(001)2×1 surface, on which high frequency flip-flop of asymmetric dimers occurs. This method is based on reciprocal lattice rods in the 0th Laue zone, which represent Fourier components of the projected crystal potential along the incident azimuth, so that the cross-sectional surface structure that is perpendicular to the incident azimuth can be investigated. It has been confirmed that this approach is effective for such dynamic surface structures with randomly flipping dimers. The asymmetric dimer configuration for the Si(001)2×1 surface at RT was determined to be fundamentally the same as that for the static Si(001)c(4×2) surface. The dimer relaxation into a symmetric configuration was confirmed to occur at a HT of approximately 1000 K. [DOI: 10.1380/ejssnt.2014.380]</description><subject>Asymmetric dimer</subject><subject>Reflection high-energy electron diffraction (RHEED)</subject><subject>Si2×1</subject><subject>Surface structure analysis</subject><issn>1348-0391</issn><issn>1348-0391</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNpNkL1OwzAUhSMEEqUws1pigSHFjp2_jaotFKkSFYXZcpzr1FGbFDsZ8iQ8EC-GQyhi8M-99zvH1vG8a4InhCb4Hkprq2YSYMImrj7xRoSyxMc0Jaf_7ufehbUlxjSmcTTyurneg0GzulK6aI1odF2hWqGNvsWY3AVfnwRtWqOEBJR1aG3qEmQDOVrXDVSNFjs0PRxMLeS2l72C2rl5b7LUxdZfVGCKDi36pnHNuVbKiB_g0jtTYmfh6vcce--Pi7fZ0l-9PD3Ppitf0jjFPiSRYmGYJALyLEzSOGUqZEKlRKR5mrGQhiwPVCRZJkDgIKBBTCQELGFh5BYdezeDr_vlRwu24WXdmso9yUkcMhIRklJH3Q-UNLW1BhQ_GL0XpuME8z5fPuTL-3y5q53iYVCUthEF_PHCNFru4MiTgON-6y2OI7kVhkNFvwF6S4b0</recordid><startdate>20140101</startdate><enddate>20140101</enddate><creator>Horio, Yoshimi</creator><creator>Takakuwa, Yuji</creator><creator>Ogawa, Schuichi</creator><general>The Japan Society of Vacuum and Surface Science</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20140101</creationdate><title>Dimer Configuration of Si(001)2×1 Surface by Projected Potential Approach of Reflection High-Energy Electron Diffraction</title><author>Horio, Yoshimi ; Takakuwa, Yuji ; Ogawa, Schuichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3790-e86f45588aedb589794f54af91a9d9b45354d2f6c4baea0223271ce2484568453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Asymmetric dimer</topic><topic>Reflection high-energy electron diffraction (RHEED)</topic><topic>Si2×1</topic><topic>Surface structure analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Horio, Yoshimi</creatorcontrib><creatorcontrib>Takakuwa, Yuji</creatorcontrib><creatorcontrib>Ogawa, Schuichi</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>E-journal of surface science and nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Horio, Yoshimi</au><au>Takakuwa, Yuji</au><au>Ogawa, Schuichi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dimer Configuration of Si(001)2×1 Surface by Projected Potential Approach of Reflection High-Energy Electron Diffraction</atitle><jtitle>E-journal of surface science and nanotechnology</jtitle><addtitle>e-J. Surf. Sci. Nanotechnol.</addtitle><date>2014-01-01</date><risdate>2014</risdate><volume>12</volume><spage>380</spage><epage>386</epage><pages>380-386</pages><issn>1348-0391</issn><eissn>1348-0391</eissn><abstract>The configuration of asymmetric dimers on the Si(001)2×1 surface was investigated at room temperature (RT) and high temperature (HT) by measurements of many-beam rocking curves of reflection high-energy electron diffraction (RHEED). We propose a novel projected potential approach for analyzing the dynamic structure of the Si(001)2×1 surface, on which high frequency flip-flop of asymmetric dimers occurs. This method is based on reciprocal lattice rods in the 0th Laue zone, which represent Fourier components of the projected crystal potential along the incident azimuth, so that the cross-sectional surface structure that is perpendicular to the incident azimuth can be investigated. It has been confirmed that this approach is effective for such dynamic surface structures with randomly flipping dimers. The asymmetric dimer configuration for the Si(001)2×1 surface at RT was determined to be fundamentally the same as that for the static Si(001)c(4×2) surface. The dimer relaxation into a symmetric configuration was confirmed to occur at a HT of approximately 1000 K. [DOI: 10.1380/ejssnt.2014.380]</abstract><cop>Tokyo</cop><pub>The Japan Society of Vacuum and Surface Science</pub><doi>10.1380/ejssnt.2014.380</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Asymmetric dimer Reflection high-energy electron diffraction (RHEED) Si2×1 Surface structure analysis |
title | Dimer Configuration of Si(001)2×1 Surface by Projected Potential Approach of Reflection High-Energy Electron Diffraction |
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