A Life Model for Supercapacitors
Supercapacitors provide high-power energy storage for electrical systems. The expected useful life of a supercapacitor is related to the oxidation of functional groups on the graphite electrode surface during usage, and it is highly dependent on operational voltage and temperature. In this paper, a...
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| Veröffentlicht in: | IEEE transactions on device and materials reliability 2015-12, Vol.15 (4), p.519-528 |
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| container_title | IEEE transactions on device and materials reliability |
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| creator | Williard, Nick Dongcheon Baek Jong Won Park Byung-Oh Choi Osterman, Michael Pecht, Michael |
| description | Supercapacitors provide high-power energy storage for electrical systems. The expected useful life of a supercapacitor is related to the oxidation of functional groups on the graphite electrode surface during usage, and it is highly dependent on operational voltage and temperature. In this paper, a life model is developed for commercial supercapacitors. The model incorporates a new voltage multiplier to describe the combined effects of temperature and voltage on supercapacitor life. Accelerated testing was conducted to obtain the time to failure of supercapacitors over a range of voltage and temperature conditions, validate the life model, and compare the model with two previously established capacitor life models. Failure was defined by a 30% decrease in capacitance or a 100% increase in equivalent series resistance. |
| doi_str_mv | 10.1109/TDMR.2015.2479466 |
| format | Magazinearticle |
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Failure was defined by a 30% decrease in capacitance or a 100% increase in equivalent series resistance.</description><identifier>ISSN: 1530-4388</identifier><identifier>EISSN: 1558-2574</identifier><identifier>DOI: 10.1109/TDMR.2015.2479466</identifier><identifier>CODEN: ITDMA2</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Accelerated aging ; Capacitance ; Capacitors ; Life estimation ; Lifetime estimation ; Materials reliability ; Resistance ; Stress ; Supercapacitors ; Temperature measurement ; Testing</subject><ispartof>IEEE transactions on device and materials reliability, 2015-12, Vol.15 (4), p.519-528</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Dec 2015</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-3ed68bc4f84b15b9872c5df78b0e5b95dedf758af54a05cc2007fdc38be3ff4a3</citedby><cites>FETCH-LOGICAL-c293t-3ed68bc4f84b15b9872c5df78b0e5b95dedf758af54a05cc2007fdc38be3ff4a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7271050$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>777,781,793,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7271050$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Williard, Nick</creatorcontrib><creatorcontrib>Dongcheon Baek</creatorcontrib><creatorcontrib>Jong Won Park</creatorcontrib><creatorcontrib>Byung-Oh Choi</creatorcontrib><creatorcontrib>Osterman, Michael</creatorcontrib><creatorcontrib>Pecht, Michael</creatorcontrib><title>A Life Model for Supercapacitors</title><title>IEEE transactions on device and materials reliability</title><addtitle>TDMR</addtitle><description>Supercapacitors provide high-power energy storage for electrical systems. The expected useful life of a supercapacitor is related to the oxidation of functional groups on the graphite electrode surface during usage, and it is highly dependent on operational voltage and temperature. In this paper, a life model is developed for commercial supercapacitors. The model incorporates a new voltage multiplier to describe the combined effects of temperature and voltage on supercapacitor life. Accelerated testing was conducted to obtain the time to failure of supercapacitors over a range of voltage and temperature conditions, validate the life model, and compare the model with two previously established capacitor life models. Failure was defined by a 30% decrease in capacitance or a 100% increase in equivalent series resistance.</description><subject>Accelerated aging</subject><subject>Capacitance</subject><subject>Capacitors</subject><subject>Life estimation</subject><subject>Lifetime estimation</subject><subject>Materials reliability</subject><subject>Resistance</subject><subject>Stress</subject><subject>Supercapacitors</subject><subject>Temperature measurement</subject><subject>Testing</subject><issn>1530-4388</issn><issn>1558-2574</issn><fulltext>true</fulltext><rsrctype>magazinearticle</rsrctype><creationdate>2015</creationdate><recordtype>magazinearticle</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE9LxDAUxIMouK5-APFS8Nz15V-THJfVVaGLoOs5pOkLdFltTdqD396WLp7eDMzMgx8htxRWlIJ52D_u3lcMqFwxoYwoijOyoFLqnEklzifNIRdc60tyldIBgBoliwXJ1lnZBMx2bY3HLLQx-xg6jN51zjd9G9M1uQjumPDmdJfkc_u037zk5dvz62Zd5p4Z3ucc60JXXgQtKioroxXzsg5KV4CjlTWORmoXpHAgvWcAKtSe6wp5CMLxJbmfd7vY_gyYentoh_g9vrRUCaE5SDBjis4pH9uUIgbbxebLxV9LwU4g7ATCTiDsCcTYuZs7DSL-5xVTdJzkf4xoWGE</recordid><startdate>201512</startdate><enddate>201512</enddate><creator>Williard, Nick</creator><creator>Dongcheon Baek</creator><creator>Jong Won Park</creator><creator>Byung-Oh Choi</creator><creator>Osterman, Michael</creator><creator>Pecht, Michael</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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The expected useful life of a supercapacitor is related to the oxidation of functional groups on the graphite electrode surface during usage, and it is highly dependent on operational voltage and temperature. In this paper, a life model is developed for commercial supercapacitors. The model incorporates a new voltage multiplier to describe the combined effects of temperature and voltage on supercapacitor life. Accelerated testing was conducted to obtain the time to failure of supercapacitors over a range of voltage and temperature conditions, validate the life model, and compare the model with two previously established capacitor life models. Failure was defined by a 30% decrease in capacitance or a 100% increase in equivalent series resistance.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TDMR.2015.2479466</doi><tpages>10</tpages></addata></record> |
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| language | eng |
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| subjects | Accelerated aging Capacitance Capacitors Life estimation Lifetime estimation Materials reliability Resistance Stress Supercapacitors Temperature measurement Testing |
| title | A Life Model for Supercapacitors |
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