Recrystallization as a Growth Mechanism for Whiskers on Plastically Deformed Sn Films

Sn whiskers are becoming a serious reliability issue in Pb-free electronic packaging applications. Sn whiskers are also observed in connector parts of electronics as well as on electroplated surface finishes. Sn whiskers found in connector parts are known to behave differently from the typical Sn wh...

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Veröffentlicht in:	Journal of electronic materials 2015-10, Vol.44 (10), p.3486-3499
Hauptverfasser:	Chang, Jaewon, Kang, Sung K., Lee, Jae-Ho, Kim, Keun-Soo, Lee, Hyuck Mo
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Crystallization Electronics and Microelectronics Instrumentation Kinetics Materials Science Optical and Electronic Materials Plastics Solid State Physics Thin films
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