The effect of structural phase transition on the magnetic properties of BiFeO3 thin films
Bi 1-x Er x FeO 3 (x = 0, 0.05, 0.1 and 0.15 respectively) thin films were prepared by the ethylene glycol based sol–gel spin-coating method on cleaned Si (100) substrates. Effects of Er concentration on the phase formation, surface morphology and magnetic properties of BFO films were systematically...
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| Veröffentlicht in: | Journal of materials science. Materials in electronics 2015-03, Vol.26 (3), p.1283-1290 |
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| container_title | Journal of materials science. Materials in electronics |
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| creator | Liu, Y. Q. Wang, Y. J. Zhang, J. Wu, Y. H. Zhang, Y. J. Wei, M. B. Yang, J. H. |
| description | Bi
1-x
Er
x
FeO
3
(x = 0, 0.05, 0.1 and 0.15 respectively) thin films were prepared by the ethylene glycol based sol–gel spin-coating method on cleaned Si (100) substrates. Effects of Er concentration on the phase formation, surface morphology and magnetic properties of BFO films were systematically investigated. Moreover, the oxidation state of Fe ion was studied by X-ray photoemission spectroscopy. X-ray diffraction and Raman spectroscopy indicated the substitutions of Er into the Bi site and a phase transition from rhombohedral to orthorhombic with Er-substitution. Scanning electron microscope and transmission electron microscope used to analyze the morphologies and microstructures of the thin films. In comparison with the other thin films studied here, the Bi
0.9
Er
0.1
FeO
3
thin film exhibited the largest magnetization and a smooth morphology. The possible reasons for the enhancement of the magnetization of these films were discussed. |
| doi_str_mv | 10.1007/s10854-014-2608-5 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1657500016</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3602345491</sourcerecordid><originalsourceid>FETCH-LOGICAL-c338t-49c8aaecd6f783d2cdc0790a69c3de6f1eab2412a39cb9ce650f3fba3ddf974a3</originalsourceid><addsrcrecordid>eNp1kMtKAzEUhoMoWKsP4C7gOpr7zCy1WBUK3VTQVUgzJ21KOzMmmYVvb0pduBEOnM33ncuP0C2j94zS6iExWitJKJOEa1oTdYYmTFWCyJp_nKMJbVRFpOL8El2ltKOUainqCfpcbQGD9-Ay7j1OOY4uj9Hu8bC1CXCOtkshh77DpXKBD3bTQQ4OD7EfIOYA6Wg-hTksRSFCh33YH9I1uvB2n-Dmt0_R-_x5NXsli-XL2-xxQZwQdSaycbW14Frtq1q03LWOVg21unGiBe0Z2DWXjFvRuHXjQCvqhV9b0ba-qaQVU3R3mlvu-RohZbPrx9iVlYZpVanyKtOFYifKxT6lCN4MMRxs_DaMmmOC5pSgKQmaY4JGFYefnFTYbgPxz-R_pR-Je3Tr</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1657500016</pqid></control><display><type>article</type><title>The effect of structural phase transition on the magnetic properties of BiFeO3 thin films</title><source>Springer Nature - Complete Springer Journals</source><creator>Liu, Y. Q. ; Wang, Y. J. ; Zhang, J. ; Wu, Y. H. ; Zhang, Y. J. ; Wei, M. B. ; Yang, J. H.</creator><creatorcontrib>Liu, Y. Q. ; Wang, Y. J. ; Zhang, J. ; Wu, Y. H. ; Zhang, Y. J. ; Wei, M. B. ; Yang, J. H.</creatorcontrib><description>Bi
1-x
Er
x
FeO
3
(x = 0, 0.05, 0.1 and 0.15 respectively) thin films were prepared by the ethylene glycol based sol–gel spin-coating method on cleaned Si (100) substrates. Effects of Er concentration on the phase formation, surface morphology and magnetic properties of BFO films were systematically investigated. Moreover, the oxidation state of Fe ion was studied by X-ray photoemission spectroscopy. X-ray diffraction and Raman spectroscopy indicated the substitutions of Er into the Bi site and a phase transition from rhombohedral to orthorhombic with Er-substitution. Scanning electron microscope and transmission electron microscope used to analyze the morphologies and microstructures of the thin films. In comparison with the other thin films studied here, the Bi
0.9
Er
0.1
FeO
3
thin film exhibited the largest magnetization and a smooth morphology. The possible reasons for the enhancement of the magnetization of these films were discussed.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-014-2608-5</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Materials Science ; Optical and Electronic Materials ; Review</subject><ispartof>Journal of materials science. Materials in electronics, 2015-03, Vol.26 (3), p.1283-1290</ispartof><rights>Springer Science+Business Media New York 2014</rights><rights>Springer Science+Business Media New York 2015</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c338t-49c8aaecd6f783d2cdc0790a69c3de6f1eab2412a39cb9ce650f3fba3ddf974a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-014-2608-5$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-014-2608-5$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Liu, Y. Q.</creatorcontrib><creatorcontrib>Wang, Y. J.</creatorcontrib><creatorcontrib>Zhang, J.</creatorcontrib><creatorcontrib>Wu, Y. H.</creatorcontrib><creatorcontrib>Zhang, Y. J.</creatorcontrib><creatorcontrib>Wei, M. B.</creatorcontrib><creatorcontrib>Yang, J. H.</creatorcontrib><title>The effect of structural phase transition on the magnetic properties of BiFeO3 thin films</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Bi
1-x
Er
x
FeO
3
(x = 0, 0.05, 0.1 and 0.15 respectively) thin films were prepared by the ethylene glycol based sol–gel spin-coating method on cleaned Si (100) substrates. Effects of Er concentration on the phase formation, surface morphology and magnetic properties of BFO films were systematically investigated. Moreover, the oxidation state of Fe ion was studied by X-ray photoemission spectroscopy. X-ray diffraction and Raman spectroscopy indicated the substitutions of Er into the Bi site and a phase transition from rhombohedral to orthorhombic with Er-substitution. Scanning electron microscope and transmission electron microscope used to analyze the morphologies and microstructures of the thin films. In comparison with the other thin films studied here, the Bi
0.9
Er
0.1
FeO
3
thin film exhibited the largest magnetization and a smooth morphology. The possible reasons for the enhancement of the magnetization of these films were discussed.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Review</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp1kMtKAzEUhoMoWKsP4C7gOpr7zCy1WBUK3VTQVUgzJ21KOzMmmYVvb0pduBEOnM33ncuP0C2j94zS6iExWitJKJOEa1oTdYYmTFWCyJp_nKMJbVRFpOL8El2ltKOUainqCfpcbQGD9-Ay7j1OOY4uj9Hu8bC1CXCOtkshh77DpXKBD3bTQQ4OD7EfIOYA6Wg-hTksRSFCh33YH9I1uvB2n-Dmt0_R-_x5NXsli-XL2-xxQZwQdSaycbW14Frtq1q03LWOVg21unGiBe0Z2DWXjFvRuHXjQCvqhV9b0ba-qaQVU3R3mlvu-RohZbPrx9iVlYZpVanyKtOFYifKxT6lCN4MMRxs_DaMmmOC5pSgKQmaY4JGFYefnFTYbgPxz-R_pR-Je3Tr</recordid><startdate>20150301</startdate><enddate>20150301</enddate><creator>Liu, Y. Q.</creator><creator>Wang, Y. J.</creator><creator>Zhang, J.</creator><creator>Wu, Y. H.</creator><creator>Zhang, Y. J.</creator><creator>Wei, M. B.</creator><creator>Yang, J. H.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope></search><sort><creationdate>20150301</creationdate><title>The effect of structural phase transition on the magnetic properties of BiFeO3 thin films</title><author>Liu, Y. Q. ; Wang, Y. J. ; Zhang, J. ; Wu, Y. H. ; Zhang, Y. J. ; Wei, M. B. ; Yang, J. H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c338t-49c8aaecd6f783d2cdc0790a69c3de6f1eab2412a39cb9ce650f3fba3ddf974a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Review</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Y. Q.</creatorcontrib><creatorcontrib>Wang, Y. J.</creatorcontrib><creatorcontrib>Zhang, J.</creatorcontrib><creatorcontrib>Wu, Y. H.</creatorcontrib><creatorcontrib>Zhang, Y. J.</creatorcontrib><creatorcontrib>Wei, M. B.</creatorcontrib><creatorcontrib>Yang, J. H.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Y. Q.</au><au>Wang, Y. J.</au><au>Zhang, J.</au><au>Wu, Y. H.</au><au>Zhang, Y. J.</au><au>Wei, M. B.</au><au>Yang, J. H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The effect of structural phase transition on the magnetic properties of BiFeO3 thin films</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2015-03-01</date><risdate>2015</risdate><volume>26</volume><issue>3</issue><spage>1283</spage><epage>1290</epage><pages>1283-1290</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Bi
1-x
Er
x
FeO
3
(x = 0, 0.05, 0.1 and 0.15 respectively) thin films were prepared by the ethylene glycol based sol–gel spin-coating method on cleaned Si (100) substrates. Effects of Er concentration on the phase formation, surface morphology and magnetic properties of BFO films were systematically investigated. Moreover, the oxidation state of Fe ion was studied by X-ray photoemission spectroscopy. X-ray diffraction and Raman spectroscopy indicated the substitutions of Er into the Bi site and a phase transition from rhombohedral to orthorhombic with Er-substitution. Scanning electron microscope and transmission electron microscope used to analyze the morphologies and microstructures of the thin films. In comparison with the other thin films studied here, the Bi
0.9
Er
0.1
FeO
3
thin film exhibited the largest magnetization and a smooth morphology. The possible reasons for the enhancement of the magnetization of these films were discussed.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s10854-014-2608-5</doi><tpages>8</tpages></addata></record> |
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| source | Springer Nature - Complete Springer Journals |
| subjects | Characterization and Evaluation of Materials Chemistry and Materials Science Materials Science Optical and Electronic Materials Review |
| title | The effect of structural phase transition on the magnetic properties of BiFeO3 thin films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T15%3A53%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20effect%20of%20structural%20phase%20transition%20on%20the%20magnetic%20properties%20of%20BiFeO3%20thin%20films&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=Liu,%20Y.%20Q.&rft.date=2015-03-01&rft.volume=26&rft.issue=3&rft.spage=1283&rft.epage=1290&rft.pages=1283-1290&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-014-2608-5&rft_dat=%3Cproquest_cross%3E3602345491%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1657500016&rft_id=info:pmid/&rfr_iscdi=true |