Modeling and Measured Verification of Stored Energy and Loss in MEMS Toroidal Inductors
This paper presents the derivation and verification of a sinusoidal steady-state equivalent-circuit model for microfabricated inductors developed for use in integrated power electronics. These inductors have a low profile, a toroidal air core, and a single-layer winding fabricated via high-aspect-ra...
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Veröffentlicht in: | IEEE transactions on industry applications 2014-05, Vol.50 (3), p.2029-2038 |
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creator | Araghchini, Mohammad Xuehong Yu Min Soo Kim Jizheng Qiu Herrault, Florian Sullivan, Charles R. Allen, Mark G. Lang, Jeffrey H. |
description | This paper presents the derivation and verification of a sinusoidal steady-state equivalent-circuit model for microfabricated inductors developed for use in integrated power electronics. These inductors have a low profile, a toroidal air core, and a single-layer winding fabricated via high-aspect-ratio molding and electroplating. Such inductors inevitably have a significant gap between winding turns. This makes the equivalent resistance more difficult to model. The low profile increases the significance of the energy that is stored in the winding, which together with the winding gap makes the equivalent inductance more difficult to model. The models presented here account for these effects. Finally, the models are verified against results from 2-D and 3-D finite-element analysis (2-D FEA and 3-D FEA) direct measurement, and from in-circuit experimentation. In all cases, the equivalent-circuit model is observed to be accurate to within several percentage. |
doi_str_mv | 10.1109/TIA.2013.2291991 |
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fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_1545973785</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6670798</ieee_id><sourcerecordid>1671504254</sourcerecordid><originalsourceid>FETCH-LOGICAL-c324t-6e0225e8da54159900f92e65bd53ae8770ce123d0d9eec65d298173672e7429a3</originalsourceid><addsrcrecordid>eNpdkE1LAzEQhoMoWD_ugpeAFy9b87nZORapWmjxYNVjiJtZSdluatI9-O_d2uLB08DwvMO8DyFXnI05Z3C3nE3GgnE5FgI4AD8iIw4SCpClOSYjxkAWAKBOyVnOK8a40lyNyPsiemxD90ld5-kCXe4TevqGKTShdtsQOxob-rKNu_W0w_T5_YvOY840dHQxXbzQZUwxeNfSWef7emDzBTlpXJvx8jDPyevDdHn_VMyfH2f3k3lRS6G2RYlMCI2Vd1pxDcBYAwJL_eG1dFgZw2rkQnrmAbEutRdQcTNUEmiUACfPye3-7ibFrx7z1q5DrrFtXYexz5aXhmumhFYDevMPXcU-dcN3lmulwUhT6YFie6pOQ8OEjd2ksHbp23Jmd6btYNruTNuD6SFyvY8ERPzDy9IwA5X8AeGJd6E</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1545973785</pqid></control><display><type>article</type><title>Modeling and Measured Verification of Stored Energy and Loss in MEMS Toroidal Inductors</title><source>IEEE Electronic Library (IEL)</source><creator>Araghchini, Mohammad ; Xuehong Yu ; Min Soo Kim ; Jizheng Qiu ; Herrault, Florian ; Sullivan, Charles R. ; Allen, Mark G. ; Lang, Jeffrey H.</creator><creatorcontrib>Araghchini, Mohammad ; Xuehong Yu ; Min Soo Kim ; Jizheng Qiu ; Herrault, Florian ; Sullivan, Charles R. ; Allen, Mark G. ; Lang, Jeffrey H.</creatorcontrib><description>This paper presents the derivation and verification of a sinusoidal steady-state equivalent-circuit model for microfabricated inductors developed for use in integrated power electronics. These inductors have a low profile, a toroidal air core, and a single-layer winding fabricated via high-aspect-ratio molding and electroplating. Such inductors inevitably have a significant gap between winding turns. This makes the equivalent resistance more difficult to model. The low profile increases the significance of the energy that is stored in the winding, which together with the winding gap makes the equivalent inductance more difficult to model. The models presented here account for these effects. Finally, the models are verified against results from 2-D and 3-D finite-element analysis (2-D FEA and 3-D FEA) direct measurement, and from in-circuit experimentation. In all cases, the equivalent-circuit model is observed to be accurate to within several percentage.</description><identifier>ISSN: 0093-9994</identifier><identifier>EISSN: 1939-9367</identifier><identifier>DOI: 10.1109/TIA.2013.2291991</identifier><identifier>CODEN: ITIACR</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Circuits ; Conductors ; Equivalence ; Finite element analysis ; Finite element method ; Inductance ; Inductors ; Integrated circuit modeling ; Internal energy ; Magnetics ; Mathematical models ; Substrates ; Three dimensional ; Winding ; Windings</subject><ispartof>IEEE transactions on industry applications, 2014-05, Vol.50 (3), p.2029-2038</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) May 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c324t-6e0225e8da54159900f92e65bd53ae8770ce123d0d9eec65d298173672e7429a3</citedby><cites>FETCH-LOGICAL-c324t-6e0225e8da54159900f92e65bd53ae8770ce123d0d9eec65d298173672e7429a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6670798$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6670798$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Araghchini, Mohammad</creatorcontrib><creatorcontrib>Xuehong Yu</creatorcontrib><creatorcontrib>Min Soo Kim</creatorcontrib><creatorcontrib>Jizheng Qiu</creatorcontrib><creatorcontrib>Herrault, Florian</creatorcontrib><creatorcontrib>Sullivan, Charles R.</creatorcontrib><creatorcontrib>Allen, Mark G.</creatorcontrib><creatorcontrib>Lang, Jeffrey H.</creatorcontrib><title>Modeling and Measured Verification of Stored Energy and Loss in MEMS Toroidal Inductors</title><title>IEEE transactions on industry applications</title><addtitle>TIA</addtitle><description>This paper presents the derivation and verification of a sinusoidal steady-state equivalent-circuit model for microfabricated inductors developed for use in integrated power electronics. These inductors have a low profile, a toroidal air core, and a single-layer winding fabricated via high-aspect-ratio molding and electroplating. Such inductors inevitably have a significant gap between winding turns. This makes the equivalent resistance more difficult to model. The low profile increases the significance of the energy that is stored in the winding, which together with the winding gap makes the equivalent inductance more difficult to model. The models presented here account for these effects. Finally, the models are verified against results from 2-D and 3-D finite-element analysis (2-D FEA and 3-D FEA) direct measurement, and from in-circuit experimentation. In all cases, the equivalent-circuit model is observed to be accurate to within several percentage.</description><subject>Circuits</subject><subject>Conductors</subject><subject>Equivalence</subject><subject>Finite element analysis</subject><subject>Finite element method</subject><subject>Inductance</subject><subject>Inductors</subject><subject>Integrated circuit modeling</subject><subject>Internal energy</subject><subject>Magnetics</subject><subject>Mathematical models</subject><subject>Substrates</subject><subject>Three dimensional</subject><subject>Winding</subject><subject>Windings</subject><issn>0093-9994</issn><issn>1939-9367</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWD_ugpeAFy9b87nZORapWmjxYNVjiJtZSdluatI9-O_d2uLB08DwvMO8DyFXnI05Z3C3nE3GgnE5FgI4AD8iIw4SCpClOSYjxkAWAKBOyVnOK8a40lyNyPsiemxD90ld5-kCXe4TevqGKTShdtsQOxob-rKNu_W0w_T5_YvOY840dHQxXbzQZUwxeNfSWef7emDzBTlpXJvx8jDPyevDdHn_VMyfH2f3k3lRS6G2RYlMCI2Vd1pxDcBYAwJL_eG1dFgZw2rkQnrmAbEutRdQcTNUEmiUACfPye3-7ibFrx7z1q5DrrFtXYexz5aXhmumhFYDevMPXcU-dcN3lmulwUhT6YFie6pOQ8OEjd2ksHbp23Jmd6btYNruTNuD6SFyvY8ERPzDy9IwA5X8AeGJd6E</recordid><startdate>20140501</startdate><enddate>20140501</enddate><creator>Araghchini, Mohammad</creator><creator>Xuehong Yu</creator><creator>Min Soo Kim</creator><creator>Jizheng Qiu</creator><creator>Herrault, Florian</creator><creator>Sullivan, Charles R.</creator><creator>Allen, Mark G.</creator><creator>Lang, Jeffrey H.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20140501</creationdate><title>Modeling and Measured Verification of Stored Energy and Loss in MEMS Toroidal Inductors</title><author>Araghchini, Mohammad ; Xuehong Yu ; Min Soo Kim ; Jizheng Qiu ; Herrault, Florian ; Sullivan, Charles R. ; Allen, Mark G. ; Lang, Jeffrey H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c324t-6e0225e8da54159900f92e65bd53ae8770ce123d0d9eec65d298173672e7429a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Circuits</topic><topic>Conductors</topic><topic>Equivalence</topic><topic>Finite element analysis</topic><topic>Finite element method</topic><topic>Inductance</topic><topic>Inductors</topic><topic>Integrated circuit modeling</topic><topic>Internal energy</topic><topic>Magnetics</topic><topic>Mathematical models</topic><topic>Substrates</topic><topic>Three dimensional</topic><topic>Winding</topic><topic>Windings</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Araghchini, Mohammad</creatorcontrib><creatorcontrib>Xuehong Yu</creatorcontrib><creatorcontrib>Min Soo Kim</creatorcontrib><creatorcontrib>Jizheng Qiu</creatorcontrib><creatorcontrib>Herrault, Florian</creatorcontrib><creatorcontrib>Sullivan, Charles R.</creatorcontrib><creatorcontrib>Allen, Mark G.</creatorcontrib><creatorcontrib>Lang, Jeffrey H.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on industry applications</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Araghchini, Mohammad</au><au>Xuehong Yu</au><au>Min Soo Kim</au><au>Jizheng Qiu</au><au>Herrault, Florian</au><au>Sullivan, Charles R.</au><au>Allen, Mark G.</au><au>Lang, Jeffrey H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modeling and Measured Verification of Stored Energy and Loss in MEMS Toroidal Inductors</atitle><jtitle>IEEE transactions on industry applications</jtitle><stitle>TIA</stitle><date>2014-05-01</date><risdate>2014</risdate><volume>50</volume><issue>3</issue><spage>2029</spage><epage>2038</epage><pages>2029-2038</pages><issn>0093-9994</issn><eissn>1939-9367</eissn><coden>ITIACR</coden><abstract>This paper presents the derivation and verification of a sinusoidal steady-state equivalent-circuit model for microfabricated inductors developed for use in integrated power electronics. These inductors have a low profile, a toroidal air core, and a single-layer winding fabricated via high-aspect-ratio molding and electroplating. Such inductors inevitably have a significant gap between winding turns. This makes the equivalent resistance more difficult to model. The low profile increases the significance of the energy that is stored in the winding, which together with the winding gap makes the equivalent inductance more difficult to model. The models presented here account for these effects. Finally, the models are verified against results from 2-D and 3-D finite-element analysis (2-D FEA and 3-D FEA) direct measurement, and from in-circuit experimentation. In all cases, the equivalent-circuit model is observed to be accurate to within several percentage.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIA.2013.2291991</doi><tpages>10</tpages></addata></record> |
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subjects | Circuits Conductors Equivalence Finite element analysis Finite element method Inductance Inductors Integrated circuit modeling Internal energy Magnetics Mathematical models Substrates Three dimensional Winding Windings |
title | Modeling and Measured Verification of Stored Energy and Loss in MEMS Toroidal Inductors |
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