Mutation Testing

This article gives a short overview of the main characteristics of mutation tools. If a test suite finds all the artificial errors inserted in the mutants and finds no fault in the original, it's likely that the program under test is free of them. Obviously, the validity of this affirmation dep...

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Veröffentlicht in:IEEE software 2014-05, Vol.31 (3), p.30-35
Hauptverfasser: Reales, Pedro, Polo, Macario, Fernandez-Aleman, Jose Luis, Toval, Ambrosio, Piattini, Mario
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container_issue 3
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creator Reales, Pedro
Polo, Macario
Fernandez-Aleman, Jose Luis
Toval, Ambrosio
Piattini, Mario
description This article gives a short overview of the main characteristics of mutation tools. If a test suite finds all the artificial errors inserted in the mutants and finds no fault in the original, it's likely that the program under test is free of them. Obviously, the validity of this affirmation depends on the nature of the artificial fault: some of them are better than others. This testing technique has been used in the research arena to check the effectiveness of new proposed testing techniques, but it hasn't been used until recently in industry due to its costs and the lack of knowledge and industrial tools.
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_1520793075</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6802989</ieee_id><sourcerecordid>1671600776</sourcerecordid><originalsourceid>FETCH-LOGICAL-c342t-173cb840b169e9eb8f43c45a9308eec42dbcb439b7b3429d0e0eeda6376b66273</originalsourceid><addsrcrecordid>eNpdkE1LAzEQhoMoWKsgXr0IIoiwdfKx-ThK8QtaPLSeQ5LOypbtbk12D_57U1o8eJrDPPO8w0vIFYUJpWAe54sJAyomUh-RETVcFYIacUxGoAQUSpTmlJyltAaAknIYkcv50Lu-7tqbJaa-br_OyUnlmoQXhzkmny_Py-lbMft4fZ8-zYrABesLqnjwWoCn0qBBryvBgyid4aARg2ArH7zgxiufebMCBMSVk1xJLyVTfEzu995t7L6HnG03dQrYNK7FbkiWSkUlgFIyo7f_0HU3xDZ_Z2nJQOVMVWbqYU-F2KUUsbLbWG9c_LEU7K4cO1_YXTlW6gzfHZQuBddU0bWhTn8XTOemNNtJr_dcjYh_a6mBGW34LyBkaSA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1520793075</pqid></control><display><type>article</type><title>Mutation Testing</title><source>IEEE Electronic Library (IEL)</source><creator>Reales, Pedro ; Polo, Macario ; Fernandez-Aleman, Jose Luis ; Toval, Ambrosio ; Piattini, Mario</creator><creatorcontrib>Reales, Pedro ; Polo, Macario ; Fernandez-Aleman, Jose Luis ; Toval, Ambrosio ; Piattini, Mario</creatorcontrib><description>This article gives a short overview of the main characteristics of mutation tools. If a test suite finds all the artificial errors inserted in the mutants and finds no fault in the original, it's likely that the program under test is free of them. Obviously, the validity of this affirmation depends on the nature of the artificial fault: some of them are better than others. This testing technique has been used in the research arena to check the effectiveness of new proposed testing techniques, but it hasn't been used until recently in industry due to its costs and the lack of knowledge and industrial tools.</description><identifier>ISSN: 0740-7459</identifier><identifier>EISSN: 1937-4194</identifier><identifier>DOI: 10.1109/MS.2014.68</identifier><identifier>CODEN: IESOEG</identifier><language>eng</language><publisher>Los Alamitos, CA: IEEE</publisher><subject>Applied sciences ; Arenas ; Computer programs ; Computer science; control theory; systems ; Computer systems performance. Reliability ; Costs ; Debugging ; Error analysis ; Errors ; Exact sciences and technology ; Fault diagnosis ; Faults ; Industries ; Java ; mutation testing ; Mutations ; Optimization ; Program processors ; Software ; Software engineering ; software testing ; Studies ; Test methods ; test suite ; Testing</subject><ispartof>IEEE software, 2014-05, Vol.31 (3), p.30-35</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright IEEE Computer Society May/Jun 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c342t-173cb840b169e9eb8f43c45a9308eec42dbcb439b7b3429d0e0eeda6376b66273</citedby><cites>FETCH-LOGICAL-c342t-173cb840b169e9eb8f43c45a9308eec42dbcb439b7b3429d0e0eeda6376b66273</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6802989$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6802989$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=28459825$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Reales, Pedro</creatorcontrib><creatorcontrib>Polo, Macario</creatorcontrib><creatorcontrib>Fernandez-Aleman, Jose Luis</creatorcontrib><creatorcontrib>Toval, Ambrosio</creatorcontrib><creatorcontrib>Piattini, Mario</creatorcontrib><title>Mutation Testing</title><title>IEEE software</title><addtitle>S-M</addtitle><description>This article gives a short overview of the main characteristics of mutation tools. If a test suite finds all the artificial errors inserted in the mutants and finds no fault in the original, it's likely that the program under test is free of them. Obviously, the validity of this affirmation depends on the nature of the artificial fault: some of them are better than others. This testing technique has been used in the research arena to check the effectiveness of new proposed testing techniques, but it hasn't been used until recently in industry due to its costs and the lack of knowledge and industrial tools.</description><subject>Applied sciences</subject><subject>Arenas</subject><subject>Computer programs</subject><subject>Computer science; control theory; systems</subject><subject>Computer systems performance. Reliability</subject><subject>Costs</subject><subject>Debugging</subject><subject>Error analysis</subject><subject>Errors</subject><subject>Exact sciences and technology</subject><subject>Fault diagnosis</subject><subject>Faults</subject><subject>Industries</subject><subject>Java</subject><subject>mutation testing</subject><subject>Mutations</subject><subject>Optimization</subject><subject>Program processors</subject><subject>Software</subject><subject>Software engineering</subject><subject>software testing</subject><subject>Studies</subject><subject>Test methods</subject><subject>test suite</subject><subject>Testing</subject><issn>0740-7459</issn><issn>1937-4194</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWKsgXr0IIoiwdfKx-ThK8QtaPLSeQ5LOypbtbk12D_57U1o8eJrDPPO8w0vIFYUJpWAe54sJAyomUh-RETVcFYIacUxGoAQUSpTmlJyltAaAknIYkcv50Lu-7tqbJaa-br_OyUnlmoQXhzkmny_Py-lbMft4fZ8-zYrABesLqnjwWoCn0qBBryvBgyid4aARg2ArH7zgxiufebMCBMSVk1xJLyVTfEzu995t7L6HnG03dQrYNK7FbkiWSkUlgFIyo7f_0HU3xDZ_Z2nJQOVMVWbqYU-F2KUUsbLbWG9c_LEU7K4cO1_YXTlW6gzfHZQuBddU0bWhTn8XTOemNNtJr_dcjYh_a6mBGW34LyBkaSA</recordid><startdate>20140501</startdate><enddate>20140501</enddate><creator>Reales, Pedro</creator><creator>Polo, Macario</creator><creator>Fernandez-Aleman, Jose Luis</creator><creator>Toval, Ambrosio</creator><creator>Piattini, Mario</creator><general>IEEE</general><general>IEEE Computer Society</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>JQ2</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20140501</creationdate><title>Mutation Testing</title><author>Reales, Pedro ; Polo, Macario ; Fernandez-Aleman, Jose Luis ; Toval, Ambrosio ; Piattini, Mario</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c342t-173cb840b169e9eb8f43c45a9308eec42dbcb439b7b3429d0e0eeda6376b66273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Applied sciences</topic><topic>Arenas</topic><topic>Computer programs</topic><topic>Computer science; control theory; systems</topic><topic>Computer systems performance. Reliability</topic><topic>Costs</topic><topic>Debugging</topic><topic>Error analysis</topic><topic>Errors</topic><topic>Exact sciences and technology</topic><topic>Fault diagnosis</topic><topic>Faults</topic><topic>Industries</topic><topic>Java</topic><topic>mutation testing</topic><topic>Mutations</topic><topic>Optimization</topic><topic>Program processors</topic><topic>Software</topic><topic>Software engineering</topic><topic>software testing</topic><topic>Studies</topic><topic>Test methods</topic><topic>test suite</topic><topic>Testing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Reales, Pedro</creatorcontrib><creatorcontrib>Polo, Macario</creatorcontrib><creatorcontrib>Fernandez-Aleman, Jose Luis</creatorcontrib><creatorcontrib>Toval, Ambrosio</creatorcontrib><creatorcontrib>Piattini, Mario</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE software</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Reales, Pedro</au><au>Polo, Macario</au><au>Fernandez-Aleman, Jose Luis</au><au>Toval, Ambrosio</au><au>Piattini, Mario</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mutation Testing</atitle><jtitle>IEEE software</jtitle><stitle>S-M</stitle><date>2014-05-01</date><risdate>2014</risdate><volume>31</volume><issue>3</issue><spage>30</spage><epage>35</epage><pages>30-35</pages><issn>0740-7459</issn><eissn>1937-4194</eissn><coden>IESOEG</coden><abstract>This article gives a short overview of the main characteristics of mutation tools. If a test suite finds all the artificial errors inserted in the mutants and finds no fault in the original, it's likely that the program under test is free of them. Obviously, the validity of this affirmation depends on the nature of the artificial fault: some of them are better than others. This testing technique has been used in the research arena to check the effectiveness of new proposed testing techniques, but it hasn't been used until recently in industry due to its costs and the lack of knowledge and industrial tools.</abstract><cop>Los Alamitos, CA</cop><pub>IEEE</pub><doi>10.1109/MS.2014.68</doi><tpages>6</tpages></addata></record>
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1937-4194
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subjects Applied sciences
Arenas
Computer programs
Computer science
control theory
systems
Computer systems performance. Reliability
Costs
Debugging
Error analysis
Errors
Exact sciences and technology
Fault diagnosis
Faults
Industries
Java
mutation testing
Mutations
Optimization
Program processors
Software
Software engineering
software testing
Studies
Test methods
test suite
Testing
title Mutation Testing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T13%3A43%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Mutation%20Testing&rft.jtitle=IEEE%20software&rft.au=Reales,%20Pedro&rft.date=2014-05-01&rft.volume=31&rft.issue=3&rft.spage=30&rft.epage=35&rft.pages=30-35&rft.issn=0740-7459&rft.eissn=1937-4194&rft.coden=IESOEG&rft_id=info:doi/10.1109/MS.2014.68&rft_dat=%3Cproquest_RIE%3E1671600776%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1520793075&rft_id=info:pmid/&rft_ieee_id=6802989&rfr_iscdi=true