More Accurate Breakdown Voltage Estimation for the New Step-up Test Method for Various Probability Distribution Models
The step-up method is used to estimate the impulse breakdown voltageswhen the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution inthe step-up method, when (1) the observed breakdown voltag...
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| Veröffentlicht in: | Denki Gakkai ronbunshi. A, Kiso zairyÅ 2004, Vol.124(7), pp.587-592 |
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| container_title | Denki Gakkai ronbunshi. A, Kiso zairyÅ |
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| creator | Hirose, Hideo |
| description | The step-up method is used to estimate the impulse breakdown voltageswhen the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution inthe step-up method, when (1) the observed breakdown voltage itself is available and (2)it is not available. The former case has many advantages compared to the latter case such that (1) the confidence intervals of the estimates become smaller and (2) theestimates can be obtained in stable. This paper summarizes the results of the three cases that the underlying probability distribution for the breakdown voltage is assumedto be normal, Weibull, and gumbel types. The optimal test method is simply and clearlydescribed for various distribution models. |
| doi_str_mv | 10.1541/ieejfms.124.587 |
| format | Article |
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A, Kiso zairyÅ</title><addtitle>IEEJ Trans. FM</addtitle><description>The step-up method is used to estimate the impulse breakdown voltageswhen the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution inthe step-up method, when (1) the observed breakdown voltage itself is available and (2)it is not available. The former case has many advantages compared to the latter case such that (1) the confidence intervals of the estimates become smaller and (2) theestimates can be obtained in stable. This paper summarizes the results of the three cases that the underlying probability distribution for the breakdown voltage is assumedto be normal, Weibull, and gumbel types. The optimal test method is simply and clearlydescribed for various distribution models.</description><subject>electrical insulation</subject><subject>gumbel distribution</subject><subject>impulse breakdown voltage</subject><subject>new step-up testmethod</subject><subject>normal distribution</subject><subject>optimal test</subject><subject>step-up test method</subject><subject>Weibull distribution</subject><issn>0385-4205</issn><issn>1347-5533</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNpVkElPwzAQhS0EEmU5c7XEOSXecHIsUBaJAhKFq-XYY-oS6mI7IP49Ka0qcZk5zHtvZj6ETkg5JIKTMw8wdx9pSCgfikruoAFhXBZCMLaLBiWrRMFpKfbRQUrzsmSUnbMB-pqECHhkTBd1BnwRQb_b8L3Ar6HN-g3wOGX_obMPC-xCxHkG-AG-8XOGZdEt8RRSxhPIs2D_5q86-tAl_BRDoxvf-vyDr3zK0TfdX8gkWGjTEdpzuk1wvOmH6OV6PL28Le4fb-4uR_eF4bKWhS0bSbkFXUpwVFChrQMGFSHcispyTWptiauMBHsuCdOaCCPAuLpxtHKcHaLTde4yhs-uv1XNQxcX_UpFeF1TzgkVvepsrTIxpBTBqWXsn44_ipRqBVdt4Koerurh9o7x2jFPK0pbvY7Zmxb-6eWm9r7t3Mx0VLBgv8Wwie4</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Hirose, Hideo</creator><general>The Institute of Electrical Engineers of Japan</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>2004</creationdate><title>More Accurate Breakdown Voltage Estimation for the New Step-up Test Method for Various Probability Distribution Models</title><author>Hirose, Hideo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4797-d0b724dea07ef2525adfe3e8114d58d4a19ad1f8c7ed6713aa15c5ecf9bf28f43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>electrical insulation</topic><topic>gumbel distribution</topic><topic>impulse breakdown voltage</topic><topic>new step-up testmethod</topic><topic>normal distribution</topic><topic>optimal test</topic><topic>step-up test method</topic><topic>Weibull distribution</topic><toplevel>online_resources</toplevel><creatorcontrib>Hirose, Hideo</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Denki Gakkai ronbunshi. A, Kiso zairyÅ</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hirose, Hideo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>More Accurate Breakdown Voltage Estimation for the New Step-up Test Method for Various Probability Distribution Models</atitle><jtitle>Denki Gakkai ronbunshi. A, Kiso zairyÅ</jtitle><addtitle>IEEJ Trans. FM</addtitle><date>2004</date><risdate>2004</risdate><volume>124</volume><issue>7</issue><spage>587</spage><epage>592</epage><pages>587-592</pages><issn>0385-4205</issn><eissn>1347-5533</eissn><abstract>The step-up method is used to estimate the impulse breakdown voltageswhen the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution inthe step-up method, when (1) the observed breakdown voltage itself is available and (2)it is not available. The former case has many advantages compared to the latter case such that (1) the confidence intervals of the estimates become smaller and (2) theestimates can be obtained in stable. This paper summarizes the results of the three cases that the underlying probability distribution for the breakdown voltage is assumedto be normal, Weibull, and gumbel types. The optimal test method is simply and clearlydescribed for various distribution models.</abstract><cop>Tokyo</cop><pub>The Institute of Electrical Engineers of Japan</pub><doi>10.1541/ieejfms.124.587</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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| issn | 0385-4205 1347-5533 |
| language | eng |
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| source | EZB Electronic Journals Library |
| subjects | electrical insulation gumbel distribution impulse breakdown voltage new step-up testmethod normal distribution optimal test step-up test method Weibull distribution |
| title | More Accurate Breakdown Voltage Estimation for the New Step-up Test Method for Various Probability Distribution Models |
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