Optimal design of the double sampling X¯ chart with estimated parameters based on median run length
•When parameters are estimated, the run length distribution is highly skewed.•The MRL is a more meaningful optimal design criterion to rely on compared to ARL.•We propose the MRL-based DS X¯ chart with known and estimated parameters.•A new optimization algorithm for minimizing MRL1(δopt) is develope...
Gespeichert in:
Veröffentlicht in: | Computers & industrial engineering 2014-01, Vol.67, p.104-115 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 115 |
---|---|
container_issue | |
container_start_page | 104 |
container_title | Computers & industrial engineering |
container_volume | 67 |
creator | Teoh, W.L. Khoo, Michael B.C. Castagliola, Philippe Chakraborti, S. |
description | •When parameters are estimated, the run length distribution is highly skewed.•The MRL is a more meaningful optimal design criterion to rely on compared to ARL.•We propose the MRL-based DS X¯ chart with known and estimated parameters.•A new optimization algorithm for minimizing MRL1(δopt) is developed.•New optimal chart parameters for practical number of Phase-I samples are given.
The double sampling (DS) X¯ chart when the process parameters are unknown and have to be estimated from a reference Phase-I dataset is studied. An expression for the run length distribution of the DS X¯ chart is derived, by conditioning and taking parameter estimation into account. Since the shape and the skewness of the run length distribution change with the magnitude of the mean shift, the number of Phase-I samples and sample sizes, it is shown that the traditional chart’s performance measure, i.e. the average run length, is confusing and not a good representation of a typical chart’s performance. To this end, because the run length distribution is highly right-skewed, especially when the shift is small, it is argued that the median run length (MRL) provides a more intuitive and credible interpretation. From this point of view, a new optimal design procedure for the DS X¯ chart with known and estimated parameters is developed to compute the chart’s optimal parameters for minimizing the out-of-control MRL, given that the values of the in-control MRL and average sample size are fixed. The optimal chart which provides the quickest out-of-control detection speed for a specified shift of interest is designed according to the number of Phase-I samples commonly used in practice. Tables are provided for the optimal chart parameters along with some empirical guidelines for practitioners to construct the optimal DS X¯ charts with estimated parameters. The optimal charts with estimated parameters are illustrated with a real application from a manufacturing company. |
doi_str_mv | 10.1016/j.cie.2013.11.001 |
format | Article |
fullrecord | <record><control><sourceid>proquest_elsev</sourceid><recordid>TN_cdi_proquest_journals_1476437304</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0360835213003586</els_id><sourcerecordid>3178054331</sourcerecordid><originalsourceid>FETCH-LOGICAL-e150t-c1be0afc6e4f08e5efe570a8c2326e46ee565bdccb8f5d7c792fe9e416f4414d3</originalsourceid><addsrcrecordid>eNotkN1KxDAQhYMouK4-gHcBr1tn2qQ_eCWLf7CwNwrehTSZblu6bW1SfSzfwSczi14NnDln5vAxdo0QI2B228WmpTgBTGPEGABP2AqLvIxASjhlK0gziIpUJufswrkOAIQsccXsbvLtQffckmv3Ax9r7hvidlyqnrjTh6lvhz1___nmptGz51-tbzi5Y8iT5ZOe9YE8zY5X2gVhHPiBbKsHPi8D72nY--aSndW6d3T1P9fs7fHhdfMcbXdPL5v7bUQowUcGKwJdm4xEDQVJqknmoAuTpEnQMiKZycoaUxW1tLnJy6SmkgRmtRAobLpmN393p3n8WEJJ1Y3LPISXCkWeiTRPQQTX3Z-LQpXPlmblArvBhNYzGa_s2CoEdcSqOhVW6ohVIaqANf0FeqFutQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1476437304</pqid></control><display><type>article</type><title>Optimal design of the double sampling X¯ chart with estimated parameters based on median run length</title><source>Elsevier ScienceDirect Journals</source><creator>Teoh, W.L. ; Khoo, Michael B.C. ; Castagliola, Philippe ; Chakraborti, S.</creator><creatorcontrib>Teoh, W.L. ; Khoo, Michael B.C. ; Castagliola, Philippe ; Chakraborti, S.</creatorcontrib><description>•When parameters are estimated, the run length distribution is highly skewed.•The MRL is a more meaningful optimal design criterion to rely on compared to ARL.•We propose the MRL-based DS X¯ chart with known and estimated parameters.•A new optimization algorithm for minimizing MRL1(δopt) is developed.•New optimal chart parameters for practical number of Phase-I samples are given.
The double sampling (DS) X¯ chart when the process parameters are unknown and have to be estimated from a reference Phase-I dataset is studied. An expression for the run length distribution of the DS X¯ chart is derived, by conditioning and taking parameter estimation into account. Since the shape and the skewness of the run length distribution change with the magnitude of the mean shift, the number of Phase-I samples and sample sizes, it is shown that the traditional chart’s performance measure, i.e. the average run length, is confusing and not a good representation of a typical chart’s performance. To this end, because the run length distribution is highly right-skewed, especially when the shift is small, it is argued that the median run length (MRL) provides a more intuitive and credible interpretation. From this point of view, a new optimal design procedure for the DS X¯ chart with known and estimated parameters is developed to compute the chart’s optimal parameters for minimizing the out-of-control MRL, given that the values of the in-control MRL and average sample size are fixed. The optimal chart which provides the quickest out-of-control detection speed for a specified shift of interest is designed according to the number of Phase-I samples commonly used in practice. Tables are provided for the optimal chart parameters along with some empirical guidelines for practitioners to construct the optimal DS X¯ charts with estimated parameters. The optimal charts with estimated parameters are illustrated with a real application from a manufacturing company.</description><identifier>ISSN: 0360-8352</identifier><identifier>EISSN: 1879-0550</identifier><identifier>DOI: 10.1016/j.cie.2013.11.001</identifier><identifier>CODEN: CINDDL</identifier><language>eng</language><publisher>New York: Elsevier Ltd</publisher><subject>Conditional run length ; Control charts ; Design optimization ; Double sampling (DS) [formula omitted] chart ; Operations research ; Optimal design ; Parameter estimation ; Probability distribution ; Sample size ; Statistical process control ; Studies ; Unconditional run length</subject><ispartof>Computers & industrial engineering, 2014-01, Vol.67, p.104-115</ispartof><rights>2013 Elsevier Ltd</rights><rights>Copyright Pergamon Press Inc. Jan 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0360835213003586$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,65309</link.rule.ids></links><search><creatorcontrib>Teoh, W.L.</creatorcontrib><creatorcontrib>Khoo, Michael B.C.</creatorcontrib><creatorcontrib>Castagliola, Philippe</creatorcontrib><creatorcontrib>Chakraborti, S.</creatorcontrib><title>Optimal design of the double sampling X¯ chart with estimated parameters based on median run length</title><title>Computers & industrial engineering</title><description>•When parameters are estimated, the run length distribution is highly skewed.•The MRL is a more meaningful optimal design criterion to rely on compared to ARL.•We propose the MRL-based DS X¯ chart with known and estimated parameters.•A new optimization algorithm for minimizing MRL1(δopt) is developed.•New optimal chart parameters for practical number of Phase-I samples are given.
The double sampling (DS) X¯ chart when the process parameters are unknown and have to be estimated from a reference Phase-I dataset is studied. An expression for the run length distribution of the DS X¯ chart is derived, by conditioning and taking parameter estimation into account. Since the shape and the skewness of the run length distribution change with the magnitude of the mean shift, the number of Phase-I samples and sample sizes, it is shown that the traditional chart’s performance measure, i.e. the average run length, is confusing and not a good representation of a typical chart’s performance. To this end, because the run length distribution is highly right-skewed, especially when the shift is small, it is argued that the median run length (MRL) provides a more intuitive and credible interpretation. From this point of view, a new optimal design procedure for the DS X¯ chart with known and estimated parameters is developed to compute the chart’s optimal parameters for minimizing the out-of-control MRL, given that the values of the in-control MRL and average sample size are fixed. The optimal chart which provides the quickest out-of-control detection speed for a specified shift of interest is designed according to the number of Phase-I samples commonly used in practice. Tables are provided for the optimal chart parameters along with some empirical guidelines for practitioners to construct the optimal DS X¯ charts with estimated parameters. The optimal charts with estimated parameters are illustrated with a real application from a manufacturing company.</description><subject>Conditional run length</subject><subject>Control charts</subject><subject>Design optimization</subject><subject>Double sampling (DS) [formula omitted] chart</subject><subject>Operations research</subject><subject>Optimal design</subject><subject>Parameter estimation</subject><subject>Probability distribution</subject><subject>Sample size</subject><subject>Statistical process control</subject><subject>Studies</subject><subject>Unconditional run length</subject><issn>0360-8352</issn><issn>1879-0550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNotkN1KxDAQhYMouK4-gHcBr1tn2qQ_eCWLf7CwNwrehTSZblu6bW1SfSzfwSczi14NnDln5vAxdo0QI2B228WmpTgBTGPEGABP2AqLvIxASjhlK0gziIpUJufswrkOAIQsccXsbvLtQffckmv3Ax9r7hvidlyqnrjTh6lvhz1___nmptGz51-tbzi5Y8iT5ZOe9YE8zY5X2gVhHPiBbKsHPi8D72nY--aSndW6d3T1P9fs7fHhdfMcbXdPL5v7bUQowUcGKwJdm4xEDQVJqknmoAuTpEnQMiKZycoaUxW1tLnJy6SmkgRmtRAobLpmN393p3n8WEJJ1Y3LPISXCkWeiTRPQQTX3Z-LQpXPlmblArvBhNYzGa_s2CoEdcSqOhVW6ohVIaqANf0FeqFutQ</recordid><startdate>201401</startdate><enddate>201401</enddate><creator>Teoh, W.L.</creator><creator>Khoo, Michael B.C.</creator><creator>Castagliola, Philippe</creator><creator>Chakraborti, S.</creator><general>Elsevier Ltd</general><general>Pergamon Press Inc</general><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>201401</creationdate><title>Optimal design of the double sampling X¯ chart with estimated parameters based on median run length</title><author>Teoh, W.L. ; Khoo, Michael B.C. ; Castagliola, Philippe ; Chakraborti, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-e150t-c1be0afc6e4f08e5efe570a8c2326e46ee565bdccb8f5d7c792fe9e416f4414d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Conditional run length</topic><topic>Control charts</topic><topic>Design optimization</topic><topic>Double sampling (DS) [formula omitted] chart</topic><topic>Operations research</topic><topic>Optimal design</topic><topic>Parameter estimation</topic><topic>Probability distribution</topic><topic>Sample size</topic><topic>Statistical process control</topic><topic>Studies</topic><topic>Unconditional run length</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Teoh, W.L.</creatorcontrib><creatorcontrib>Khoo, Michael B.C.</creatorcontrib><creatorcontrib>Castagliola, Philippe</creatorcontrib><creatorcontrib>Chakraborti, S.</creatorcontrib><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>Computers & industrial engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Teoh, W.L.</au><au>Khoo, Michael B.C.</au><au>Castagliola, Philippe</au><au>Chakraborti, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optimal design of the double sampling X¯ chart with estimated parameters based on median run length</atitle><jtitle>Computers & industrial engineering</jtitle><date>2014-01</date><risdate>2014</risdate><volume>67</volume><spage>104</spage><epage>115</epage><pages>104-115</pages><issn>0360-8352</issn><eissn>1879-0550</eissn><coden>CINDDL</coden><abstract>•When parameters are estimated, the run length distribution is highly skewed.•The MRL is a more meaningful optimal design criterion to rely on compared to ARL.•We propose the MRL-based DS X¯ chart with known and estimated parameters.•A new optimization algorithm for minimizing MRL1(δopt) is developed.•New optimal chart parameters for practical number of Phase-I samples are given.
The double sampling (DS) X¯ chart when the process parameters are unknown and have to be estimated from a reference Phase-I dataset is studied. An expression for the run length distribution of the DS X¯ chart is derived, by conditioning and taking parameter estimation into account. Since the shape and the skewness of the run length distribution change with the magnitude of the mean shift, the number of Phase-I samples and sample sizes, it is shown that the traditional chart’s performance measure, i.e. the average run length, is confusing and not a good representation of a typical chart’s performance. To this end, because the run length distribution is highly right-skewed, especially when the shift is small, it is argued that the median run length (MRL) provides a more intuitive and credible interpretation. From this point of view, a new optimal design procedure for the DS X¯ chart with known and estimated parameters is developed to compute the chart’s optimal parameters for minimizing the out-of-control MRL, given that the values of the in-control MRL and average sample size are fixed. The optimal chart which provides the quickest out-of-control detection speed for a specified shift of interest is designed according to the number of Phase-I samples commonly used in practice. Tables are provided for the optimal chart parameters along with some empirical guidelines for practitioners to construct the optimal DS X¯ charts with estimated parameters. The optimal charts with estimated parameters are illustrated with a real application from a manufacturing company.</abstract><cop>New York</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.cie.2013.11.001</doi><tpages>12</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0360-8352 |
ispartof | Computers & industrial engineering, 2014-01, Vol.67, p.104-115 |
issn | 0360-8352 1879-0550 |
language | eng |
recordid | cdi_proquest_journals_1476437304 |
source | Elsevier ScienceDirect Journals |
subjects | Conditional run length Control charts Design optimization Double sampling (DS) [formula omitted] chart Operations research Optimal design Parameter estimation Probability distribution Sample size Statistical process control Studies Unconditional run length |
title | Optimal design of the double sampling X¯ chart with estimated parameters based on median run length |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T14%3A33%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_elsev&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Optimal%20design%20of%20the%20double%20sampling%20X%C2%AF%20chart%20with%20estimated%20parameters%20based%20on%20median%20run%20length&rft.jtitle=Computers%20&%20industrial%20engineering&rft.au=Teoh,%20W.L.&rft.date=2014-01&rft.volume=67&rft.spage=104&rft.epage=115&rft.pages=104-115&rft.issn=0360-8352&rft.eissn=1879-0550&rft.coden=CINDDL&rft_id=info:doi/10.1016/j.cie.2013.11.001&rft_dat=%3Cproquest_elsev%3E3178054331%3C/proquest_elsev%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1476437304&rft_id=info:pmid/&rft_els_id=S0360835213003586&rfr_iscdi=true |