Light-Strip Model Based Highlight-Line Method for Surface Interrogation
A method for surface interrogation named light-strip model based highlight-line technique is proposed. The principium of this method is: taking out a light-strip that includes axial line to replace light-cylinder, making all lines lie in a same light source plane, getting a series of highlight-point...
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| Veröffentlicht in: | Applied Mechanics and Materials 2010-10, Vol.33, p.688-694 |
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| container_title | Applied Mechanics and Materials |
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| creator | Zong, W.S. Shen, H.C. Yang, Bao Guo |
| description | A method for surface interrogation named light-strip model based highlight-line technique is proposed. The principium of this method is: taking out a light-strip that includes axial line to replace light-cylinder, making all lines lie in a same light source plane, getting a series of highlight-points on surface by intersecting distance function with different plains, using cubic Hermite interpolation to fit continuous highlight-line cluster passing through those highlight-points. Examples show this method is a comparative ideal surface interrogation technique, it overcomes the shortcoming of light-cylinder model based one as highlight-lines correlating with fiducially line, and the interrogation results cannot reflect the surface fairness of curvature acutely diversification regions. |
| doi_str_mv | 10.4028/www.scientific.net/AMM.33.688 |
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| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1443772192</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3105412321</sourcerecordid><originalsourceid>FETCH-LOGICAL-c293t-9febaf96fb2f389c65b4762c69faf1c2a99ba90066558f03f8850e511cc2ef7e3</originalsourceid><addsrcrecordid>eNqNkE1PAjEQhhs_EgH9D5sYj7v0a7vtwRgkCiS78YCem1JaWIJbbEuI_94KJnr0NMnMvO878wBwh2BBIebDw-FQBN2aLra21UVn4nDUNAUhBeP8DPQQYzivKMfnoA95xanAhNGL4wDmghB2BfohbCBkFFHeA5O6Xa1jPo--3WWNW5pt9qiCWWbT1N8eZ3Xbmawxce2WmXU-m--9Vdpksy4a791KxdZ11-DSqm0wNz91AN6en17H07x-mczGozrXWJCYC2sWygpmF9gSLjQrF7RiWDNhlUUaKyEWSqTrWFlyC4nlvISmREhrbGxlyADcnnx33n3sTYhy4_a-S5ESUUqqCqP08gDcn7a0dyF4Y-XOt-_Kf0oE5TdImUDKX5AygZQJpCREJpBJ_3DSR6-6EI1e_4n5l8MXwRKCZw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1443772192</pqid></control><display><type>article</type><title>Light-Strip Model Based Highlight-Line Method for Surface Interrogation</title><source>Scientific.net Journals</source><creator>Zong, W.S. ; Shen, H.C. ; Yang, Bao Guo</creator><creatorcontrib>Zong, W.S. ; Shen, H.C. ; Yang, Bao Guo</creatorcontrib><description>A method for surface interrogation named light-strip model based highlight-line technique is proposed. The principium of this method is: taking out a light-strip that includes axial line to replace light-cylinder, making all lines lie in a same light source plane, getting a series of highlight-points on surface by intersecting distance function with different plains, using cubic Hermite interpolation to fit continuous highlight-line cluster passing through those highlight-points. Examples show this method is a comparative ideal surface interrogation technique, it overcomes the shortcoming of light-cylinder model based one as highlight-lines correlating with fiducially line, and the interrogation results cannot reflect the surface fairness of curvature acutely diversification regions.</description><identifier>ISSN: 1660-9336</identifier><identifier>ISSN: 1662-7482</identifier><identifier>ISBN: 0878492364</identifier><identifier>ISBN: 9780878492367</identifier><identifier>EISSN: 1662-7482</identifier><identifier>DOI: 10.4028/www.scientific.net/AMM.33.688</identifier><language>eng</language><publisher>Zurich: Trans Tech Publications Ltd</publisher><ispartof>Applied Mechanics and Materials, 2010-10, Vol.33, p.688-694</ispartof><rights>2010 Trans Tech Publications Ltd</rights><rights>Copyright Trans Tech Publications Ltd. Oct 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c293t-9febaf96fb2f389c65b4762c69faf1c2a99ba90066558f03f8850e511cc2ef7e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/1016?width=600</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Zong, W.S.</creatorcontrib><creatorcontrib>Shen, H.C.</creatorcontrib><creatorcontrib>Yang, Bao Guo</creatorcontrib><title>Light-Strip Model Based Highlight-Line Method for Surface Interrogation</title><title>Applied Mechanics and Materials</title><description>A method for surface interrogation named light-strip model based highlight-line technique is proposed. The principium of this method is: taking out a light-strip that includes axial line to replace light-cylinder, making all lines lie in a same light source plane, getting a series of highlight-points on surface by intersecting distance function with different plains, using cubic Hermite interpolation to fit continuous highlight-line cluster passing through those highlight-points. Examples show this method is a comparative ideal surface interrogation technique, it overcomes the shortcoming of light-cylinder model based one as highlight-lines correlating with fiducially line, and the interrogation results cannot reflect the surface fairness of curvature acutely diversification regions.</description><issn>1660-9336</issn><issn>1662-7482</issn><issn>1662-7482</issn><isbn>0878492364</isbn><isbn>9780878492367</isbn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNkE1PAjEQhhs_EgH9D5sYj7v0a7vtwRgkCiS78YCem1JaWIJbbEuI_94KJnr0NMnMvO878wBwh2BBIebDw-FQBN2aLra21UVn4nDUNAUhBeP8DPQQYzivKMfnoA95xanAhNGL4wDmghB2BfohbCBkFFHeA5O6Xa1jPo--3WWNW5pt9qiCWWbT1N8eZ3Xbmawxce2WmXU-m--9Vdpksy4a791KxdZ11-DSqm0wNz91AN6en17H07x-mczGozrXWJCYC2sWygpmF9gSLjQrF7RiWDNhlUUaKyEWSqTrWFlyC4nlvISmREhrbGxlyADcnnx33n3sTYhy4_a-S5ESUUqqCqP08gDcn7a0dyF4Y-XOt-_Kf0oE5TdImUDKX5AygZQJpCREJpBJ_3DSR6-6EI1e_4n5l8MXwRKCZw</recordid><startdate>20101001</startdate><enddate>20101001</enddate><creator>Zong, W.S.</creator><creator>Shen, H.C.</creator><creator>Yang, Bao Guo</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7TB</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BFMQW</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>KR7</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20101001</creationdate><title>Light-Strip Model Based Highlight-Line Method for Surface Interrogation</title><author>Zong, W.S. ; Shen, H.C. ; Yang, Bao Guo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-9febaf96fb2f389c65b4762c69faf1c2a99ba90066558f03f8850e511cc2ef7e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zong, W.S.</creatorcontrib><creatorcontrib>Shen, H.C.</creatorcontrib><creatorcontrib>Yang, Bao Guo</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Continental Europe Database</collection><collection>Technology Collection (ProQuest)</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Civil Engineering Abstracts</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><jtitle>Applied Mechanics and Materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zong, W.S.</au><au>Shen, H.C.</au><au>Yang, Bao Guo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Light-Strip Model Based Highlight-Line Method for Surface Interrogation</atitle><jtitle>Applied Mechanics and Materials</jtitle><date>2010-10-01</date><risdate>2010</risdate><volume>33</volume><spage>688</spage><epage>694</epage><pages>688-694</pages><issn>1660-9336</issn><issn>1662-7482</issn><eissn>1662-7482</eissn><isbn>0878492364</isbn><isbn>9780878492367</isbn><abstract>A method for surface interrogation named light-strip model based highlight-line technique is proposed. The principium of this method is: taking out a light-strip that includes axial line to replace light-cylinder, making all lines lie in a same light source plane, getting a series of highlight-points on surface by intersecting distance function with different plains, using cubic Hermite interpolation to fit continuous highlight-line cluster passing through those highlight-points. Examples show this method is a comparative ideal surface interrogation technique, it overcomes the shortcoming of light-cylinder model based one as highlight-lines correlating with fiducially line, and the interrogation results cannot reflect the surface fairness of curvature acutely diversification regions.</abstract><cop>Zurich</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/AMM.33.688</doi><tpages>7</tpages></addata></record> |
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| title | Light-Strip Model Based Highlight-Line Method for Surface Interrogation |
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