System Testability Assessment and testing with Micro architectures

Testing is necessary to ensure software reliability and fidelity. however, testing activities are very expensive and difficult. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes....

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:International journal of advanced research in computer science 2011-11, Vol.2 (6)
Hauptverfasser: S, Ravi Kumar M, Jonnalagadda, V, Pamulapati, Ashok Reddy, Kumar, I Rajendra, Reddy, M Babu
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 6
container_start_page
container_title International journal of advanced research in computer science
container_volume 2
creator S, Ravi Kumar M
Jonnalagadda, V
Pamulapati, Ashok Reddy
Kumar, I Rajendra
Reddy, M Babu
description Testing is necessary to ensure software reliability and fidelity. however, testing activities are very expensive and difficult. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes. Our goal is to identify their impact on system testability and evaluate how they can be leveraged to reduce the testing effort while increasing the system reliability and fidelity. The proposed research aims at contributing to reduce complexity and increase testing efficiency by using micro architectures. We will base our work on the rich existing tools of micro architectures detection and code reverse-engineering. Keywords-Testing, testability, design patterns, anti-patterns test case generation.
format Article
fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_1443711712</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3105296631</sourcerecordid><originalsourceid>FETCH-proquest_journals_14437117123</originalsourceid><addsrcrecordid>eNqNi7EOgjAURRsTE4nyDy9xJqGCNB3VaFycZCcVn1ICRfseMfy9HfwAz3KHc89MRKlWRbIttFqImKhNA5nWRZ5GYn-diLGHEonNzXaWJ9gRIVGPjsG4O3BQ1j3hY7mBi639AMbXjWWsefRIKzF_mI4w_u1SrE_H8nBOXn54jyGu2mH0LqhK5nmmpFRyk_33-gInVDqU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1443711712</pqid></control><display><type>article</type><title>System Testability Assessment and testing with Micro architectures</title><source>EZB-FREE-00999 freely available EZB journals</source><creator>S, Ravi Kumar M ; Jonnalagadda, V ; Pamulapati, Ashok Reddy ; Kumar, I Rajendra ; Reddy, M Babu</creator><creatorcontrib>S, Ravi Kumar M ; Jonnalagadda, V ; Pamulapati, Ashok Reddy ; Kumar, I Rajendra ; Reddy, M Babu</creatorcontrib><description>Testing is necessary to ensure software reliability and fidelity. however, testing activities are very expensive and difficult. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes. Our goal is to identify their impact on system testability and evaluate how they can be leveraged to reduce the testing effort while increasing the system reliability and fidelity. The proposed research aims at contributing to reduce complexity and increase testing efficiency by using micro architectures. We will base our work on the rich existing tools of micro architectures detection and code reverse-engineering. Keywords-Testing, testability, design patterns, anti-patterns test case generation.</description><identifier>EISSN: 0976-5697</identifier><language>eng</language><publisher>Udaipur: International Journal of Advanced Research in Computer Science</publisher><subject>Computer science ; Software development ; Software engineering ; Software quality ; Software reliability ; Stereotypes</subject><ispartof>International journal of advanced research in computer science, 2011-11, Vol.2 (6)</ispartof><rights>Copyright International Journal of Advanced Research in Computer Science Nov 2011</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784</link.rule.ids></links><search><creatorcontrib>S, Ravi Kumar M</creatorcontrib><creatorcontrib>Jonnalagadda, V</creatorcontrib><creatorcontrib>Pamulapati, Ashok Reddy</creatorcontrib><creatorcontrib>Kumar, I Rajendra</creatorcontrib><creatorcontrib>Reddy, M Babu</creatorcontrib><title>System Testability Assessment and testing with Micro architectures</title><title>International journal of advanced research in computer science</title><description>Testing is necessary to ensure software reliability and fidelity. however, testing activities are very expensive and difficult. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes. Our goal is to identify their impact on system testability and evaluate how they can be leveraged to reduce the testing effort while increasing the system reliability and fidelity. The proposed research aims at contributing to reduce complexity and increase testing efficiency by using micro architectures. We will base our work on the rich existing tools of micro architectures detection and code reverse-engineering. Keywords-Testing, testability, design patterns, anti-patterns test case generation.</description><subject>Computer science</subject><subject>Software development</subject><subject>Software engineering</subject><subject>Software quality</subject><subject>Software reliability</subject><subject>Stereotypes</subject><issn>0976-5697</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNqNi7EOgjAURRsTE4nyDy9xJqGCNB3VaFycZCcVn1ICRfseMfy9HfwAz3KHc89MRKlWRbIttFqImKhNA5nWRZ5GYn-diLGHEonNzXaWJ9gRIVGPjsG4O3BQ1j3hY7mBi639AMbXjWWsefRIKzF_mI4w_u1SrE_H8nBOXn54jyGu2mH0LqhK5nmmpFRyk_33-gInVDqU</recordid><startdate>20111101</startdate><enddate>20111101</enddate><creator>S, Ravi Kumar M</creator><creator>Jonnalagadda, V</creator><creator>Pamulapati, Ashok Reddy</creator><creator>Kumar, I Rajendra</creator><creator>Reddy, M Babu</creator><general>International Journal of Advanced Research in Computer Science</general><scope>3V.</scope><scope>7SC</scope><scope>7XB</scope><scope>8AL</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M0N</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>Q9U</scope></search><sort><creationdate>20111101</creationdate><title>System Testability Assessment and testing with Micro architectures</title><author>S, Ravi Kumar M ; Jonnalagadda, V ; Pamulapati, Ashok Reddy ; Kumar, I Rajendra ; Reddy, M Babu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_14437117123</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Computer science</topic><topic>Software development</topic><topic>Software engineering</topic><topic>Software quality</topic><topic>Software reliability</topic><topic>Stereotypes</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>S, Ravi Kumar M</creatorcontrib><creatorcontrib>Jonnalagadda, V</creatorcontrib><creatorcontrib>Pamulapati, Ashok Reddy</creatorcontrib><creatorcontrib>Kumar, I Rajendra</creatorcontrib><creatorcontrib>Reddy, M Babu</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>Computer and Information Systems Abstracts</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Computing Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Computing Database</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>ProQuest Central Basic</collection><jtitle>International journal of advanced research in computer science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>S, Ravi Kumar M</au><au>Jonnalagadda, V</au><au>Pamulapati, Ashok Reddy</au><au>Kumar, I Rajendra</au><au>Reddy, M Babu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>System Testability Assessment and testing with Micro architectures</atitle><jtitle>International journal of advanced research in computer science</jtitle><date>2011-11-01</date><risdate>2011</risdate><volume>2</volume><issue>6</issue><eissn>0976-5697</eissn><abstract>Testing is necessary to ensure software reliability and fidelity. however, testing activities are very expensive and difficult. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes. Our goal is to identify their impact on system testability and evaluate how they can be leveraged to reduce the testing effort while increasing the system reliability and fidelity. The proposed research aims at contributing to reduce complexity and increase testing efficiency by using micro architectures. We will base our work on the rich existing tools of micro architectures detection and code reverse-engineering. Keywords-Testing, testability, design patterns, anti-patterns test case generation.</abstract><cop>Udaipur</cop><pub>International Journal of Advanced Research in Computer Science</pub><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier EISSN: 0976-5697
ispartof International journal of advanced research in computer science, 2011-11, Vol.2 (6)
issn 0976-5697
language eng
recordid cdi_proquest_journals_1443711712
source EZB-FREE-00999 freely available EZB journals
subjects Computer science
Software development
Software engineering
Software quality
Software reliability
Stereotypes
title System Testability Assessment and testing with Micro architectures
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T21%3A40%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=System%20Testability%20Assessment%20and%20testing%20with%20Micro%20architectures&rft.jtitle=International%20journal%20of%20advanced%20research%20in%20computer%20science&rft.au=S,%20Ravi%20Kumar%20M&rft.date=2011-11-01&rft.volume=2&rft.issue=6&rft.eissn=0976-5697&rft_id=info:doi/&rft_dat=%3Cproquest%3E3105296631%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1443711712&rft_id=info:pmid/&rfr_iscdi=true