Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method
Residual stress determination by X-ray diffraction is theoretically analyzed. Using stress of two directions analysis method, the magnitude and direction of the principal stress which is induced by laser shocked wave can be calculated. The results indicate that the calculated value consists with tha...
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| Veröffentlicht in: | Applied Mechanics and Materials 2011-01, Vol.43, p.569-572 |
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| container_title | Applied Mechanics and Materials |
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| creator | Sun, Huai Yang Ni, Gui Fen Cao, Yu Peng Xu, Chuan Chao Feng, Ai Xin Wang, Jun Wei Zhou, Peng Chen |
| description | Residual stress determination by X-ray diffraction is theoretically analyzed. Using stress of two directions analysis method, the magnitude and direction of the principal stress which is induced by laser shocked wave can be calculated. The results indicate that the calculated value consists with that of the experimental data, which shows that the surface stresses state comprehensively. Meanwhile, the relationship between the principle stress and single stress with different energies are analyzed. |
| doi_str_mv | 10.4028/www.scientific.net/AMM.43.569 |
| format | Article |
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Using stress of two directions analysis method, the magnitude and direction of the principal stress which is induced by laser shocked wave can be calculated. The results indicate that the calculated value consists with that of the experimental data, which shows that the surface stresses state comprehensively. Meanwhile, the relationship between the principle stress and single stress with different energies are analyzed.</description><identifier>ISSN: 1660-9336</identifier><identifier>ISSN: 1662-7482</identifier><identifier>ISBN: 9783037850008</identifier><identifier>ISBN: 3037850000</identifier><identifier>EISSN: 1662-7482</identifier><identifier>DOI: 10.4028/www.scientific.net/AMM.43.569</identifier><language>eng</language><publisher>Zurich: Trans Tech Publications Ltd</publisher><ispartof>Applied Mechanics and Materials, 2011-01, Vol.43, p.569-572</ispartof><rights>2011 Trans Tech Publications Ltd</rights><rights>Copyright Trans Tech Publications Ltd. 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| title | Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method |
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