Electrical contact fabrication on vertically aligned ZnO nanowires investigated by current sensing AFM
We present a simple method for generating vertically aligned (VA) ZnO nanowire (NW) arrays with tailored electrical top contacts, suitable for photodetector and photovoltaic applications. ZnO NWs were synthesized on Si substrate in house using a hydro‐thermal method, producing dense and highly organ...
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Veröffentlicht in: | Physica status solidi. A, Applications and materials science Applications and materials science, 2013-10, Vol.210 (10), p.2153-2158 |
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creator | Jain, Vaibhav Kushto, Gary P. Wolak, Mason Mäkinen, Antti J. |
description | We present a simple method for generating vertically aligned (VA) ZnO nanowire (NW) arrays with tailored electrical top contacts, suitable for photodetector and photovoltaic applications. ZnO NWs were synthesized on Si substrate in house using a hydro‐thermal method, producing dense and highly organized vertical ZnO NW (∼50–100 nm) arrays. The vertical geometry of the NW arrays facilitated further processing of the NW structures and streamlined in situ characterization of individual NWs as well as entire NW ensembles. The top contact metallization involved depositing a thin film of low work function metals such as aluminum (5 nm) followed by a thin film of gold (15 nm) onto NW arrays, partially embedded in an insulating silsesquioxane‐based material (SOG‐400F). The I–V characteristics of individual ZnO NWs were measured using current sensing atomic force microscopy (CS‐AFM). Compared with arrays of as‐grown ZnO NWs, the metalized top contacts of NWs resulted in improved I–V characteristics with good Ohmic behavior at the metal‐semiconductor contact (MSC). |
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ZnO NWs were synthesized on Si substrate in house using a hydro‐thermal method, producing dense and highly organized vertical ZnO NW (∼50–100 nm) arrays. The vertical geometry of the NW arrays facilitated further processing of the NW structures and streamlined in situ characterization of individual NWs as well as entire NW ensembles. The top contact metallization involved depositing a thin film of low work function metals such as aluminum (5 nm) followed by a thin film of gold (15 nm) onto NW arrays, partially embedded in an insulating silsesquioxane‐based material (SOG‐400F). The I–V characteristics of individual ZnO NWs were measured using current sensing atomic force microscopy (CS‐AFM). Compared with arrays of as‐grown ZnO NWs, the metalized top contacts of NWs resulted in improved I–V characteristics with good Ohmic behavior at the metal‐semiconductor contact (MSC).</description><identifier>ISSN: 1862-6300</identifier><identifier>EISSN: 1862-6319</identifier><identifier>DOI: 10.1002/pssa.201228813</identifier><language>eng</language><publisher>Weinheim: Blackwell Publishing Ltd</publisher><subject>atomic force microscopy ; I-V characteristics ; metal-semiconductor contacts ; nanowires ; Ohmic contacts ; Photovoltaic cells ; Solar energy ; Thin films ; ZnO</subject><ispartof>Physica status solidi. A, Applications and materials science, 2013-10, Vol.210 (10), p.2153-2158</ispartof><rights>2013 WILEY-VCH Verlag GmbH & Co. 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Status Solidi A</addtitle><description>We present a simple method for generating vertically aligned (VA) ZnO nanowire (NW) arrays with tailored electrical top contacts, suitable for photodetector and photovoltaic applications. ZnO NWs were synthesized on Si substrate in house using a hydro‐thermal method, producing dense and highly organized vertical ZnO NW (∼50–100 nm) arrays. The vertical geometry of the NW arrays facilitated further processing of the NW structures and streamlined in situ characterization of individual NWs as well as entire NW ensembles. The top contact metallization involved depositing a thin film of low work function metals such as aluminum (5 nm) followed by a thin film of gold (15 nm) onto NW arrays, partially embedded in an insulating silsesquioxane‐based material (SOG‐400F). The I–V characteristics of individual ZnO NWs were measured using current sensing atomic force microscopy (CS‐AFM). Compared with arrays of as‐grown ZnO NWs, the metalized top contacts of NWs resulted in improved I–V characteristics with good Ohmic behavior at the metal‐semiconductor contact (MSC).</description><subject>atomic force microscopy</subject><subject>I-V characteristics</subject><subject>metal-semiconductor contacts</subject><subject>nanowires</subject><subject>Ohmic contacts</subject><subject>Photovoltaic cells</subject><subject>Solar energy</subject><subject>Thin films</subject><subject>ZnO</subject><issn>1862-6300</issn><issn>1862-6319</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNo9kEtLAzEQx4MoWKtXzwHPW_Pa17GUVsXWFqoUvIRsNimpa7Ymaet-e3epLAzM8zcz_AG4x2iEESKPe-_FiCBMSJZhegEGOEtIlFCcX_YxQtfgxvsdQixmKR4APa2UDM5IUUFZ2yBkgFoUXSGY2sLWjsqFrl81UFRma1UJP-0SWmHrk3HKQ2OPygezFaFtFQ2UB-eUDdAr643dwvFscQuutKi8uvv3Q_Axm75PnqP58ullMp5HhqSYRlRTVQjM4gwpmlJEVJnnqU6YzFnGMp3gUmMsZFpSirREZV6UcYcwpgsiJB2Ch_Pevat_Du1XfFcfnG1PcswYiZOcttoMQX6eOplKNXzvzLdwDceId0LyTkjeC8lX6_W4z1o2OrPGB_Xbs8J98SSlacw3b098sniN19lqw2f0D85kepo</recordid><startdate>201310</startdate><enddate>201310</enddate><creator>Jain, Vaibhav</creator><creator>Kushto, Gary P.</creator><creator>Wolak, Mason</creator><creator>Mäkinen, Antti J.</creator><general>Blackwell Publishing Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>201310</creationdate><title>Electrical contact fabrication on vertically aligned ZnO nanowires investigated by current sensing AFM</title><author>Jain, Vaibhav ; Kushto, Gary P. ; Wolak, Mason ; Mäkinen, Antti J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i2713-3f3eba14580e37302ed997f64c94848f61df11ac7d330fc0d9bd53eba44fb2ac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>atomic force microscopy</topic><topic>I-V characteristics</topic><topic>metal-semiconductor contacts</topic><topic>nanowires</topic><topic>Ohmic contacts</topic><topic>Photovoltaic cells</topic><topic>Solar energy</topic><topic>Thin films</topic><topic>ZnO</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jain, Vaibhav</creatorcontrib><creatorcontrib>Kushto, Gary P.</creatorcontrib><creatorcontrib>Wolak, Mason</creatorcontrib><creatorcontrib>Mäkinen, Antti J.</creatorcontrib><collection>Istex</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica status solidi. A, Applications and materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jain, Vaibhav</au><au>Kushto, Gary P.</au><au>Wolak, Mason</au><au>Mäkinen, Antti J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrical contact fabrication on vertically aligned ZnO nanowires investigated by current sensing AFM</atitle><jtitle>Physica status solidi. A, Applications and materials science</jtitle><addtitle>Phys. Status Solidi A</addtitle><date>2013-10</date><risdate>2013</risdate><volume>210</volume><issue>10</issue><spage>2153</spage><epage>2158</epage><pages>2153-2158</pages><issn>1862-6300</issn><eissn>1862-6319</eissn><abstract>We present a simple method for generating vertically aligned (VA) ZnO nanowire (NW) arrays with tailored electrical top contacts, suitable for photodetector and photovoltaic applications. ZnO NWs were synthesized on Si substrate in house using a hydro‐thermal method, producing dense and highly organized vertical ZnO NW (∼50–100 nm) arrays. The vertical geometry of the NW arrays facilitated further processing of the NW structures and streamlined in situ characterization of individual NWs as well as entire NW ensembles. The top contact metallization involved depositing a thin film of low work function metals such as aluminum (5 nm) followed by a thin film of gold (15 nm) onto NW arrays, partially embedded in an insulating silsesquioxane‐based material (SOG‐400F). The I–V characteristics of individual ZnO NWs were measured using current sensing atomic force microscopy (CS‐AFM). Compared with arrays of as‐grown ZnO NWs, the metalized top contacts of NWs resulted in improved I–V characteristics with good Ohmic behavior at the metal‐semiconductor contact (MSC).</abstract><cop>Weinheim</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1002/pssa.201228813</doi><tpages>6</tpages></addata></record> |
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subjects | atomic force microscopy I-V characteristics metal-semiconductor contacts nanowires Ohmic contacts Photovoltaic cells Solar energy Thin films ZnO |
title | Electrical contact fabrication on vertically aligned ZnO nanowires investigated by current sensing AFM |
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