The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films

The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films

In this paper the set of photoelectromagnetic methods for determination of recombination and diffusion parameters of charge carriers in p-type mercury cadmium telluride epitaxial thin films at temperature range 77–125 K is offered. The set of methods includes the photoconductivity in magnetic field...

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Veröffentlicht in:European physical journal. Applied physics 2013-06, Vol.62 (3), p.30104
Hauptverfasser: Protasov, D.Y., Trifanov, A.V., Kostyuchenko, V.Y.
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container_title European physical journal. Applied physics
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creator Protasov, D.Y.
Trifanov, A.V.
Kostyuchenko, V.Y.
description In this paper the set of photoelectromagnetic methods for determination of recombination and diffusion parameters of charge carriers in p-type mercury cadmium telluride epitaxial thin films at temperature range 77–125 K is offered. The set of methods includes the photoconductivity in magnetic field for Faraday and Voigt geometries, the photoelectromagnetic effect, the Hall effect and the measurements of magnetoconductivity. Such films parameters as concentrations and mobilities of heavy and light holes, mobility of minor electrons, electrons lifetime and ratio between holes and electrons lifetimes, surface recombination velocities can be determined with help of offered set.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1431069671</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3067174561</sourcerecordid><originalsourceid>FETCH-LOGICAL-c309t-a347987c87818e43df40425a26d05adf720bfb1558f151e68654fe18cc14a9143</originalsourceid><addsrcrecordid>eNpFkD1PwzAQhiMEEqWwM1piDvUlceKMUGgBFcEQxGi5yZm4NHGwXQH_nqSFMt3X-9zp3iA4B3oJlMEEu5XsJhGFGGIKKTsIRhDxNKSU0cN9nkTHwYlzK0p7DWej4LOokTj0xCjS1cYbXGPprWnkW4tel6RBX5vKEWUsqdCjbXQrvTbtQFgsTbP8a8i2IpVWauOGqpNWNgPgtrvDx2lBfK1bovS6cafBkZJrh2e_cRy8zG6L6V24eJrfT68WYRnT3IcyTrKcZyXPOHBM4kol_Q9MRmlFmaxUFtGlWgJjXAEDTHnKEoXAyxISmUMSj4OL3d7Omo8NOi9WZmPb_qTop0DTPM2gV9GdqrTGOYtKdFY30n4LoGKwV2ztFf_29ki4Q7Tz-LXXS_su0izOmOD0VSxuHmbFM7sW8_gHnVJ-kQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1431069671</pqid></control><display><type>article</type><title>The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films</title><source>Bacon EDP Sciences France Licence nationale-ISTEX-PS-Journals-PFISTEX</source><source>EDP Sciences</source><source>Cambridge Journals</source><creator>Protasov, D.Y. ; Trifanov, A.V. ; Kostyuchenko, V.Y.</creator><creatorcontrib>Protasov, D.Y. ; Trifanov, A.V. ; Kostyuchenko, V.Y.</creatorcontrib><description>In this paper the set of photoelectromagnetic methods for determination of recombination and diffusion parameters of charge carriers in p-type mercury cadmium telluride epitaxial thin films at temperature range 77–125 K is offered. The set of methods includes the photoconductivity in magnetic field for Faraday and Voigt geometries, the photoelectromagnetic effect, the Hall effect and the measurements of magnetoconductivity. Such films parameters as concentrations and mobilities of heavy and light holes, mobility of minor electrons, electrons lifetime and ratio between holes and electrons lifetimes, surface recombination velocities can be determined with help of offered set.</description><identifier>ISSN: 1286-0042</identifier><identifier>EISSN: 1286-0050</identifier><identifier>DOI: 10.1051/epjap/2013130165</identifier><language>eng</language><publisher>Les Ulis: EDP Sciences</publisher><ispartof>European physical journal. Applied physics, 2013-06, Vol.62 (3), p.30104</ispartof><rights>EDP Sciences, 2013</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c309t-a347987c87818e43df40425a26d05adf720bfb1558f151e68654fe18cc14a9143</citedby><cites>FETCH-LOGICAL-c309t-a347987c87818e43df40425a26d05adf720bfb1558f151e68654fe18cc14a9143</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,3714,27901,27902</link.rule.ids></links><search><creatorcontrib>Protasov, D.Y.</creatorcontrib><creatorcontrib>Trifanov, A.V.</creatorcontrib><creatorcontrib>Kostyuchenko, V.Y.</creatorcontrib><title>The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films</title><title>European physical journal. Applied physics</title><description>In this paper the set of photoelectromagnetic methods for determination of recombination and diffusion parameters of charge carriers in p-type mercury cadmium telluride epitaxial thin films at temperature range 77–125 K is offered. The set of methods includes the photoconductivity in magnetic field for Faraday and Voigt geometries, the photoelectromagnetic effect, the Hall effect and the measurements of magnetoconductivity. Such films parameters as concentrations and mobilities of heavy and light holes, mobility of minor electrons, electrons lifetime and ratio between holes and electrons lifetimes, surface recombination velocities can be determined with help of offered set.</description><issn>1286-0042</issn><issn>1286-0050</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNpFkD1PwzAQhiMEEqWwM1piDvUlceKMUGgBFcEQxGi5yZm4NHGwXQH_nqSFMt3X-9zp3iA4B3oJlMEEu5XsJhGFGGIKKTsIRhDxNKSU0cN9nkTHwYlzK0p7DWej4LOokTj0xCjS1cYbXGPprWnkW4tel6RBX5vKEWUsqdCjbXQrvTbtQFgsTbP8a8i2IpVWauOGqpNWNgPgtrvDx2lBfK1bovS6cafBkZJrh2e_cRy8zG6L6V24eJrfT68WYRnT3IcyTrKcZyXPOHBM4kol_Q9MRmlFmaxUFtGlWgJjXAEDTHnKEoXAyxISmUMSj4OL3d7Omo8NOi9WZmPb_qTop0DTPM2gV9GdqrTGOYtKdFY30n4LoGKwV2ztFf_29ki4Q7Tz-LXXS_su0izOmOD0VSxuHmbFM7sW8_gHnVJ-kQ</recordid><startdate>20130601</startdate><enddate>20130601</enddate><creator>Protasov, D.Y.</creator><creator>Trifanov, A.V.</creator><creator>Kostyuchenko, V.Y.</creator><general>EDP Sciences</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20130601</creationdate><title>The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films</title><author>Protasov, D.Y. ; Trifanov, A.V. ; Kostyuchenko, V.Y.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c309t-a347987c87818e43df40425a26d05adf720bfb1558f151e68654fe18cc14a9143</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Protasov, D.Y.</creatorcontrib><creatorcontrib>Trifanov, A.V.</creatorcontrib><creatorcontrib>Kostyuchenko, V.Y.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>European physical journal. Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Protasov, D.Y.</au><au>Trifanov, A.V.</au><au>Kostyuchenko, V.Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films</atitle><jtitle>European physical journal. Applied physics</jtitle><date>2013-06-01</date><risdate>2013</risdate><volume>62</volume><issue>3</issue><spage>30104</spage><pages>30104-</pages><issn>1286-0042</issn><eissn>1286-0050</eissn><abstract>In this paper the set of photoelectromagnetic methods for determination of recombination and diffusion parameters of charge carriers in p-type mercury cadmium telluride epitaxial thin films at temperature range 77–125 K is offered. The set of methods includes the photoconductivity in magnetic field for Faraday and Voigt geometries, the photoelectromagnetic effect, the Hall effect and the measurements of magnetoconductivity. Such films parameters as concentrations and mobilities of heavy and light holes, mobility of minor electrons, electrons lifetime and ratio between holes and electrons lifetimes, surface recombination velocities can be determined with help of offered set.</abstract><cop>Les Ulis</cop><pub>EDP Sciences</pub><doi>10.1051/epjap/2013130165</doi></addata></record>
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title The set of photoelectromagnetic methods for determination of recombination and diffusion parameters of p-MCT thin films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T03%3A27%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20set%20of%20photoelectromagnetic%20methods%20for%20determination%20of%20recombination%20and%20diffusion%20parameters%20of%20p-MCT%20thin%20films&rft.jtitle=European%20physical%20journal.%20Applied%20physics&rft.au=Protasov,%20D.Y.&rft.date=2013-06-01&rft.volume=62&rft.issue=3&rft.spage=30104&rft.pages=30104-&rft.issn=1286-0042&rft.eissn=1286-0050&rft_id=info:doi/10.1051/epjap/2013130165&rft_dat=%3Cproquest_cross%3E3067174561%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1431069671&rft_id=info:pmid/&rfr_iscdi=true