Effect of Initial Bulk Material Composition on Thermoelectric Properties of Bi^sub 2^Te^sub 3^ Thin Films

Issue Title: 2012 International Conference on Thermoelectrics. Guest Editors: Ryoji Funahashi, Donald Morelli, Lasse Rosendahl, and Jihui Yang V^sub 2^VI^sub 3^ compounds and solid solutions based on them are known to be the best low-temperature thermoelectric (TE) materials. The predicted possibili...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of electronic materials 2013-07, Vol.42 (7), p.1324
Hauptverfasser: Budnik, A V, Rogacheva, E I, Pinegin, V I, Sipatov, A Yu, Fedorov, A G
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 7
container_start_page 1324
container_title Journal of electronic materials
container_volume 42
creator Budnik, A V
Rogacheva, E I
Pinegin, V I
Sipatov, A Yu
Fedorov, A G
description Issue Title: 2012 International Conference on Thermoelectrics. Guest Editors: Ryoji Funahashi, Donald Morelli, Lasse Rosendahl, and Jihui Yang V^sub 2^VI^sub 3^ compounds and solid solutions based on them are known to be the best low-temperature thermoelectric (TE) materials. The predicted possibility of enhancement of the TE figure of merit in two-dimensional (2D) structures has stimulated studies of the properties of these materials in the thin-film state. The goal of the present work is to study the dependences of the Seebeck coefficient S, electrical conductivity σ, Hall coefficient R ^sub H^, charge carrier mobility [mu] ^sub H^, and TE power factor P = S ^sup 2^ σ of Bi^sub 2^Te^sub 3^ thin films on the composition of the initial bulk material used for preparing them. Thin films with thickness d = 200 nm to 250 nm were grown by thermal evaporation in vacuum of stoichiometric Bi^sub 2^Te^sub 3^ crystals (60.0 at.% Te) and of crystals with 62.8 at.% Te onto glass substrates at temperatures T ^sub S^ of 320 K to 500 K. It was established that the conductivity type of the initial material is reproduced in films fairly well. For both materials, an increase in T ^sub S^ leads to an increase in the thin-film structural perfection, better correspondence between the film composition and that of the initial material, and increase in S, R ^sub H^, [mu] ^sub H^, σ, and P. The room-temperature maximum values of P for the films grown from crystals with 60.0 at.% and 62.8 at.% Te are P = 7.5 × 10^sup -4^ W/K^sup 2^ m and 35 × 10^sup -4^ W/K^sup 2^ m, respectively. Thus, by using Bi^sub 2^Te^sub 3^ crystals with different stoichiometry as initial materials, one can control the conductivity type and TE parameters of the films, applying a simple and low-cost method of thermal evaporation from a single source.[PUBLICATION ABSTRACT]
doi_str_mv 10.1007/s11664-012-2439-1
format Article
fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_1370823170</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3003596741</sourcerecordid><originalsourceid>FETCH-proquest_journals_13708231703</originalsourceid><addsrcrecordid>eNqNTMtOwzAQtBCVGigf0Jslzqa7dl5cW7WCA1IPOXBKFaqNcHHi4HX-HxfxAUgjzYzmIcQa4QkBqg0jlmWuALXSuXlWeCMyLHKjsC7fb0UGpkRVaFMsxR3zBQALrDETdt_3dI7S9_J1tNF2Tm5n9yXfukjh6nZ-mDynxI8yofmkMHhyaRPsWR6DnyhES3x92NqW5w-p24Z-hWlT347yYN3AK7HoO8f08Mf34vGwb3Yvagr-eyaOp4ufw5iiE5oKam2wAvO_1g93mk21</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1370823170</pqid></control><display><type>article</type><title>Effect of Initial Bulk Material Composition on Thermoelectric Properties of Bi^sub 2^Te^sub 3^ Thin Films</title><source>SpringerNature Journals</source><creator>Budnik, A V ; Rogacheva, E I ; Pinegin, V I ; Sipatov, A Yu ; Fedorov, A G</creator><creatorcontrib>Budnik, A V ; Rogacheva, E I ; Pinegin, V I ; Sipatov, A Yu ; Fedorov, A G</creatorcontrib><description>Issue Title: 2012 International Conference on Thermoelectrics. Guest Editors: Ryoji Funahashi, Donald Morelli, Lasse Rosendahl, and Jihui Yang V^sub 2^VI^sub 3^ compounds and solid solutions based on them are known to be the best low-temperature thermoelectric (TE) materials. The predicted possibility of enhancement of the TE figure of merit in two-dimensional (2D) structures has stimulated studies of the properties of these materials in the thin-film state. The goal of the present work is to study the dependences of the Seebeck coefficient S, electrical conductivity σ, Hall coefficient R ^sub H^, charge carrier mobility [mu] ^sub H^, and TE power factor P = S ^sup 2^ σ of Bi^sub 2^Te^sub 3^ thin films on the composition of the initial bulk material used for preparing them. Thin films with thickness d = 200 nm to 250 nm were grown by thermal evaporation in vacuum of stoichiometric Bi^sub 2^Te^sub 3^ crystals (60.0 at.% Te) and of crystals with 62.8 at.% Te onto glass substrates at temperatures T ^sub S^ of 320 K to 500 K. It was established that the conductivity type of the initial material is reproduced in films fairly well. For both materials, an increase in T ^sub S^ leads to an increase in the thin-film structural perfection, better correspondence between the film composition and that of the initial material, and increase in S, R ^sub H^, [mu] ^sub H^, σ, and P. The room-temperature maximum values of P for the films grown from crystals with 60.0 at.% and 62.8 at.% Te are P = 7.5 × 10^sup -4^ W/K^sup 2^ m and 35 × 10^sup -4^ W/K^sup 2^ m, respectively. Thus, by using Bi^sub 2^Te^sub 3^ crystals with different stoichiometry as initial materials, one can control the conductivity type and TE parameters of the films, applying a simple and low-cost method of thermal evaporation from a single source.[PUBLICATION ABSTRACT]</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-012-2439-1</identifier><identifier>CODEN: JECMA5</identifier><language>eng</language><publisher>Warrendale: Springer Nature B.V</publisher><subject>Electric properties ; Materials science ; Semiconductor research ; Thin films</subject><ispartof>Journal of electronic materials, 2013-07, Vol.42 (7), p.1324</ispartof><rights>TMS 2013</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Budnik, A V</creatorcontrib><creatorcontrib>Rogacheva, E I</creatorcontrib><creatorcontrib>Pinegin, V I</creatorcontrib><creatorcontrib>Sipatov, A Yu</creatorcontrib><creatorcontrib>Fedorov, A G</creatorcontrib><title>Effect of Initial Bulk Material Composition on Thermoelectric Properties of Bi^sub 2^Te^sub 3^ Thin Films</title><title>Journal of electronic materials</title><description>Issue Title: 2012 International Conference on Thermoelectrics. Guest Editors: Ryoji Funahashi, Donald Morelli, Lasse Rosendahl, and Jihui Yang V^sub 2^VI^sub 3^ compounds and solid solutions based on them are known to be the best low-temperature thermoelectric (TE) materials. The predicted possibility of enhancement of the TE figure of merit in two-dimensional (2D) structures has stimulated studies of the properties of these materials in the thin-film state. The goal of the present work is to study the dependences of the Seebeck coefficient S, electrical conductivity σ, Hall coefficient R ^sub H^, charge carrier mobility [mu] ^sub H^, and TE power factor P = S ^sup 2^ σ of Bi^sub 2^Te^sub 3^ thin films on the composition of the initial bulk material used for preparing them. Thin films with thickness d = 200 nm to 250 nm were grown by thermal evaporation in vacuum of stoichiometric Bi^sub 2^Te^sub 3^ crystals (60.0 at.% Te) and of crystals with 62.8 at.% Te onto glass substrates at temperatures T ^sub S^ of 320 K to 500 K. It was established that the conductivity type of the initial material is reproduced in films fairly well. For both materials, an increase in T ^sub S^ leads to an increase in the thin-film structural perfection, better correspondence between the film composition and that of the initial material, and increase in S, R ^sub H^, [mu] ^sub H^, σ, and P. The room-temperature maximum values of P for the films grown from crystals with 60.0 at.% and 62.8 at.% Te are P = 7.5 × 10^sup -4^ W/K^sup 2^ m and 35 × 10^sup -4^ W/K^sup 2^ m, respectively. Thus, by using Bi^sub 2^Te^sub 3^ crystals with different stoichiometry as initial materials, one can control the conductivity type and TE parameters of the films, applying a simple and low-cost method of thermal evaporation from a single source.[PUBLICATION ABSTRACT]</description><subject>Electric properties</subject><subject>Materials science</subject><subject>Semiconductor research</subject><subject>Thin films</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNqNTMtOwzAQtBCVGigf0Jslzqa7dl5cW7WCA1IPOXBKFaqNcHHi4HX-HxfxAUgjzYzmIcQa4QkBqg0jlmWuALXSuXlWeCMyLHKjsC7fb0UGpkRVaFMsxR3zBQALrDETdt_3dI7S9_J1tNF2Tm5n9yXfukjh6nZ-mDynxI8yofmkMHhyaRPsWR6DnyhES3x92NqW5w-p24Z-hWlT347yYN3AK7HoO8f08Mf34vGwb3Yvagr-eyaOp4ufw5iiE5oKam2wAvO_1g93mk21</recordid><startdate>20130701</startdate><enddate>20130701</enddate><creator>Budnik, A V</creator><creator>Rogacheva, E I</creator><creator>Pinegin, V I</creator><creator>Sipatov, A Yu</creator><creator>Fedorov, A G</creator><general>Springer Nature B.V</general><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope></search><sort><creationdate>20130701</creationdate><title>Effect of Initial Bulk Material Composition on Thermoelectric Properties of Bi^sub 2^Te^sub 3^ Thin Films</title><author>Budnik, A V ; Rogacheva, E I ; Pinegin, V I ; Sipatov, A Yu ; Fedorov, A G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_13708231703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Electric properties</topic><topic>Materials science</topic><topic>Semiconductor research</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Budnik, A V</creatorcontrib><creatorcontrib>Rogacheva, E I</creatorcontrib><creatorcontrib>Pinegin, V I</creatorcontrib><creatorcontrib>Sipatov, A Yu</creatorcontrib><creatorcontrib>Fedorov, A G</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Budnik, A V</au><au>Rogacheva, E I</au><au>Pinegin, V I</au><au>Sipatov, A Yu</au><au>Fedorov, A G</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of Initial Bulk Material Composition on Thermoelectric Properties of Bi^sub 2^Te^sub 3^ Thin Films</atitle><jtitle>Journal of electronic materials</jtitle><date>2013-07-01</date><risdate>2013</risdate><volume>42</volume><issue>7</issue><spage>1324</spage><pages>1324-</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><coden>JECMA5</coden><abstract>Issue Title: 2012 International Conference on Thermoelectrics. Guest Editors: Ryoji Funahashi, Donald Morelli, Lasse Rosendahl, and Jihui Yang V^sub 2^VI^sub 3^ compounds and solid solutions based on them are known to be the best low-temperature thermoelectric (TE) materials. The predicted possibility of enhancement of the TE figure of merit in two-dimensional (2D) structures has stimulated studies of the properties of these materials in the thin-film state. The goal of the present work is to study the dependences of the Seebeck coefficient S, electrical conductivity σ, Hall coefficient R ^sub H^, charge carrier mobility [mu] ^sub H^, and TE power factor P = S ^sup 2^ σ of Bi^sub 2^Te^sub 3^ thin films on the composition of the initial bulk material used for preparing them. Thin films with thickness d = 200 nm to 250 nm were grown by thermal evaporation in vacuum of stoichiometric Bi^sub 2^Te^sub 3^ crystals (60.0 at.% Te) and of crystals with 62.8 at.% Te onto glass substrates at temperatures T ^sub S^ of 320 K to 500 K. It was established that the conductivity type of the initial material is reproduced in films fairly well. For both materials, an increase in T ^sub S^ leads to an increase in the thin-film structural perfection, better correspondence between the film composition and that of the initial material, and increase in S, R ^sub H^, [mu] ^sub H^, σ, and P. The room-temperature maximum values of P for the films grown from crystals with 60.0 at.% and 62.8 at.% Te are P = 7.5 × 10^sup -4^ W/K^sup 2^ m and 35 × 10^sup -4^ W/K^sup 2^ m, respectively. Thus, by using Bi^sub 2^Te^sub 3^ crystals with different stoichiometry as initial materials, one can control the conductivity type and TE parameters of the films, applying a simple and low-cost method of thermal evaporation from a single source.[PUBLICATION ABSTRACT]</abstract><cop>Warrendale</cop><pub>Springer Nature B.V</pub><doi>10.1007/s11664-012-2439-1</doi></addata></record>
fulltext fulltext
identifier ISSN: 0361-5235
ispartof Journal of electronic materials, 2013-07, Vol.42 (7), p.1324
issn 0361-5235
1543-186X
language eng
recordid cdi_proquest_journals_1370823170
source SpringerNature Journals
subjects Electric properties
Materials science
Semiconductor research
Thin films
title Effect of Initial Bulk Material Composition on Thermoelectric Properties of Bi^sub 2^Te^sub 3^ Thin Films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T18%3A22%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effect%20of%20Initial%20Bulk%20Material%20Composition%20on%20Thermoelectric%20Properties%20of%20Bi%5Esub%202%5ETe%5Esub%203%5E%20Thin%20Films&rft.jtitle=Journal%20of%20electronic%20materials&rft.au=Budnik,%20A%20V&rft.date=2013-07-01&rft.volume=42&rft.issue=7&rft.spage=1324&rft.pages=1324-&rft.issn=0361-5235&rft.eissn=1543-186X&rft.coden=JECMA5&rft_id=info:doi/10.1007/s11664-012-2439-1&rft_dat=%3Cproquest%3E3003596741%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1370823170&rft_id=info:pmid/&rfr_iscdi=true