Engineering anisotropic dielectric response through amorphous laminate structures
Nanolaminates built from ultra‐thin, ultra‐smooth films of amorphous metals, and solution‐processed oxides represent a new platform for dispersion engineering. Materials exhibiting anisotropic elliptical dispersion and hyperbolic dispersion with positive refraction are realized through choice of amo...
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Veröffentlicht in: | Physica status solidi. A, Applications and materials science Applications and materials science, 2012-04, Vol.209 (4), p.777-784 |
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creator | Cowell III, E. William Knutson, Christopher C. Kuhta, Nicholas A. Stickle, William Keszler, Douglas A. Wager, John F. |
description | Nanolaminates built from ultra‐thin, ultra‐smooth films of amorphous metals, and solution‐processed oxides represent a new platform for dispersion engineering. Materials exhibiting anisotropic elliptical dispersion and hyperbolic dispersion with positive refraction are realized through choice of amorphous metal and laminate design. Transmission electron microscopy (TEM), X‐ray photoelectron spectroscopy (XPS), polarized reflectance measurements, and effective medium theory are combined to demonstrate the precision and predictability of the fabrication techniques and optical properties from ultra‐violet to infra‐red frequencies.
Engineering anisotropic dielectric response through amorphous laminate structures. |
doi_str_mv | 10.1002/pssa.201127616 |
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Engineering anisotropic dielectric response through amorphous laminate structures.</description><subject>anisotropic</subject><subject>dielectrics</subject><subject>metamaterials</subject><subject>nanolaminates</subject><subject>Spectrum analysis</subject><subject>X-rays</subject><issn>1862-6300</issn><issn>1862-6319</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqFkM9LwzAYhoMoOKdXzwXPnfnRpM1xjLk5hk6meAxpmm6ZXVOTFN1_b0dlePP0vR88z_fBC8AtgiMEIb5vvJcjDBHCKUPsDAxQxnDMCOLnpwzhJbjyfgdhQpMUDcDLtN6YWmtn6k0ka-NtcLYxKiqMrrQKrotO-8bWXkdh62y72UZyb12zta2PKrk3tQw68sG1KrQdeg0uSll5ffM7h-DtYfo6mcfL59njZLyMFeGUxTmDWaJllmuVl4gynigC84KWHOUJY1DCHEpaQJolnMuyW5OSEl4yjYlWsiBDcNffbZz9bLUPYmdbV3cvBSIYI5alKe-oUU8pZ713uhSNM3vpDgJBcaxNHGsTp9o6gffCl6n04R9arNbr8V837l3jg_4-udJ9CJaSlIr3p5lYw8UqnaOFwOQHyN-C-A</recordid><startdate>201204</startdate><enddate>201204</enddate><creator>Cowell III, E. William</creator><creator>Knutson, Christopher C.</creator><creator>Kuhta, Nicholas A.</creator><creator>Stickle, William</creator><creator>Keszler, Douglas A.</creator><creator>Wager, John F.</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>201204</creationdate><title>Engineering anisotropic dielectric response through amorphous laminate structures</title><author>Cowell III, E. William ; Knutson, Christopher C. ; Kuhta, Nicholas A. ; Stickle, William ; Keszler, Douglas A. ; Wager, John F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3956-b6084ea8becbf15694c30bd5f91b4660a0b0a5d058499afa0b4f539f6e23ecad3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>anisotropic</topic><topic>dielectrics</topic><topic>metamaterials</topic><topic>nanolaminates</topic><topic>Spectrum analysis</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cowell III, E. William</creatorcontrib><creatorcontrib>Knutson, Christopher C.</creatorcontrib><creatorcontrib>Kuhta, Nicholas A.</creatorcontrib><creatorcontrib>Stickle, William</creatorcontrib><creatorcontrib>Keszler, Douglas A.</creatorcontrib><creatorcontrib>Wager, John F.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica status solidi. A, Applications and materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cowell III, E. William</au><au>Knutson, Christopher C.</au><au>Kuhta, Nicholas A.</au><au>Stickle, William</au><au>Keszler, Douglas A.</au><au>Wager, John F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Engineering anisotropic dielectric response through amorphous laminate structures</atitle><jtitle>Physica status solidi. A, Applications and materials science</jtitle><addtitle>Phys. Status Solidi A</addtitle><date>2012-04</date><risdate>2012</risdate><volume>209</volume><issue>4</issue><spage>777</spage><epage>784</epage><pages>777-784</pages><issn>1862-6300</issn><eissn>1862-6319</eissn><abstract>Nanolaminates built from ultra‐thin, ultra‐smooth films of amorphous metals, and solution‐processed oxides represent a new platform for dispersion engineering. Materials exhibiting anisotropic elliptical dispersion and hyperbolic dispersion with positive refraction are realized through choice of amorphous metal and laminate design. Transmission electron microscopy (TEM), X‐ray photoelectron spectroscopy (XPS), polarized reflectance measurements, and effective medium theory are combined to demonstrate the precision and predictability of the fabrication techniques and optical properties from ultra‐violet to infra‐red frequencies.
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subjects | anisotropic dielectrics metamaterials nanolaminates Spectrum analysis X-rays |
title | Engineering anisotropic dielectric response through amorphous laminate structures |
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