Characterization by Nuclear and Spectrophotometric Analysis of Near-Surface Modifications of Glass Implanted with Heavy Ions

A soda‐lime‐silica glass was irradiated by different heavy ion (N, Ne, Ar, and Kr) with energies chosen in order to obtain the same penetration depth. The near‐surface sodium depletion layer, characterized by nuclear analysis and infrared reflectance spectrophotometry (IRRS), is deeper than the impl...

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Veröffentlicht in:J. Am. Ceram. Soc.; (United States) 1987-10, Vol.70 (10), p.775-779
Hauptverfasser: POLATO, PIETRO, MAZZOLDI, PAOLO, BOSCOLETTO, ANGELO BOSCOLO
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container_title J. Am. Ceram. Soc.; (United States)
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creator POLATO, PIETRO
MAZZOLDI, PAOLO
BOSCOLETTO, ANGELO BOSCOLO
description A soda‐lime‐silica glass was irradiated by different heavy ion (N, Ne, Ar, and Kr) with energies chosen in order to obtain the same penetration depth. The near‐surface sodium depletion layer, characterized by nuclear analysis and infrared reflectance spectrophotometry (IRRS), is deeper than the implanted‐ion range and grows with increasing incident‐ion mass at the same dose and current density. By using reflectance spectrophotometry in the solar range, the formation of a near‐surface perturbed layer having a modified refractive index as compared to the bulk and a thickness comparable to the sodium depletion layer was confirmed.
doi_str_mv 10.1111/j.1151-2916.1987.tb04878.x
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The near‐surface sodium depletion layer, characterized by nuclear analysis and infrared reflectance spectrophotometry (IRRS), is deeper than the implanted‐ion range and grows with increasing incident‐ion mass at the same dose and current density. By using reflectance spectrophotometry in the solar range, the formation of a near‐surface perturbed layer having a modified refractive index as compared to the bulk and a thickness comparable to the sodium depletion layer was confirmed.</description><identifier>ISSN: 0002-7820</identifier><identifier>EISSN: 1551-2916</identifier><identifier>DOI: 10.1111/j.1151-2916.1987.tb04878.x</identifier><identifier>CODEN: JACTAW</identifier><language>eng</language><publisher>Oxford, UK: Blackwell Publishing Ltd</publisher><subject>360201 - Ceramics, Cermets, &amp; Refractories- Preparation &amp; Fabrication ; 400102 - Chemical &amp; Spectral Procedures ; Applied sciences ; ARGON IONS ; Building materials. Ceramics. Glasses ; CHALCOGENIDES ; CHARGED PARTICLES ; Chemical industry and chemicals ; Exact sciences and technology ; GLASS ; Glasses ; HEAVY IONS ; INFRARED SPECTRA ; INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY ; ION IMPLANTATION ; IONS ; KRYPTON IONS ; MATERIALS SCIENCE ; MINERALS ; MODIFICATIONS ; NEON IONS ; NITROGEN IONS ; NUCLEI ; OPTICAL PROPERTIES ; OXIDE MINERALS ; OXIDES ; OXYGEN COMPOUNDS ; PENETRATION DEPTH ; PHYSICAL PROPERTIES ; PHYSICAL RADIATION EFFECTS ; RADIATION EFFECTS ; REFRACTIVITY ; SILICA ; SILICON COMPOUNDS ; SILICON OXIDES ; SPECTRA ; Structure, analysis, properties ; SURFACES</subject><ispartof>J. Am. Ceram. 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Am. Ceram. Soc.; (United States)</title><description>A soda‐lime‐silica glass was irradiated by different heavy ion (N, Ne, Ar, and Kr) with energies chosen in order to obtain the same penetration depth. The near‐surface sodium depletion layer, characterized by nuclear analysis and infrared reflectance spectrophotometry (IRRS), is deeper than the implanted‐ion range and grows with increasing incident‐ion mass at the same dose and current density. By using reflectance spectrophotometry in the solar range, the formation of a near‐surface perturbed layer having a modified refractive index as compared to the bulk and a thickness comparable to the sodium depletion layer was confirmed.</description><subject>360201 - Ceramics, Cermets, &amp; Refractories- Preparation &amp; Fabrication</subject><subject>400102 - Chemical &amp; Spectral Procedures</subject><subject>Applied sciences</subject><subject>ARGON IONS</subject><subject>Building materials. Ceramics. 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Am. Ceram. Soc.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>POLATO, PIETRO</au><au>MAZZOLDI, PAOLO</au><au>BOSCOLETTO, ANGELO BOSCOLO</au><aucorp>Stazione Sperimentale del Vetro, Murano-Venice (IT)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization by Nuclear and Spectrophotometric Analysis of Near-Surface Modifications of Glass Implanted with Heavy Ions</atitle><jtitle>J. Am. Ceram. Soc.; (United States)</jtitle><date>1987-10</date><risdate>1987</risdate><volume>70</volume><issue>10</issue><spage>775</spage><epage>779</epage><pages>775-779</pages><issn>0002-7820</issn><eissn>1551-2916</eissn><coden>JACTAW</coden><abstract>A soda‐lime‐silica glass was irradiated by different heavy ion (N, Ne, Ar, and Kr) with energies chosen in order to obtain the same penetration depth. The near‐surface sodium depletion layer, characterized by nuclear analysis and infrared reflectance spectrophotometry (IRRS), is deeper than the implanted‐ion range and grows with increasing incident‐ion mass at the same dose and current density. By using reflectance spectrophotometry in the solar range, the formation of a near‐surface perturbed layer having a modified refractive index as compared to the bulk and a thickness comparable to the sodium depletion layer was confirmed.</abstract><cop>Oxford, UK</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1111/j.1151-2916.1987.tb04878.x</doi><tpages>5</tpages></addata></record>
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subjects 360201 - Ceramics, Cermets, & Refractories- Preparation & Fabrication
400102 - Chemical & Spectral Procedures
Applied sciences
ARGON IONS
Building materials. Ceramics. Glasses
CHALCOGENIDES
CHARGED PARTICLES
Chemical industry and chemicals
Exact sciences and technology
GLASS
Glasses
HEAVY IONS
INFRARED SPECTRA
INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY
ION IMPLANTATION
IONS
KRYPTON IONS
MATERIALS SCIENCE
MINERALS
MODIFICATIONS
NEON IONS
NITROGEN IONS
NUCLEI
OPTICAL PROPERTIES
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PENETRATION DEPTH
PHYSICAL PROPERTIES
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
REFRACTIVITY
SILICA
SILICON COMPOUNDS
SILICON OXIDES
SPECTRA
Structure, analysis, properties
SURFACES
title Characterization by Nuclear and Spectrophotometric Analysis of Near-Surface Modifications of Glass Implanted with Heavy Ions
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