The Defect Structure of Unintentionally Doped α-Al2O3 Crystals

Electrical conductivity and the ionic and electronic transference numbers were determined for two types of unintentionally doped single crystalline sapphire for current directions perpendicular to the r plane (1102). One was acceptor dominated and the other was initially donor (Hix) dominated, chang...

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Veröffentlicht in:Journal of the American Ceramic Society 1979-01, Vol.62 (1-2), p.50-57
Hauptverfasser: MOHAPATRA, S. K., TIKU, S. K., KRÖR, F. A.
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creator MOHAPATRA, S. K.
TIKU, S. K.
KRÖR, F. A.
description Electrical conductivity and the ionic and electronic transference numbers were determined for two types of unintentionally doped single crystalline sapphire for current directions perpendicular to the r plane (1102). One was acceptor dominated and the other was initially donor (Hix) dominated, changing to acceptor domination after a prolonged anneal at 1600°C. The positions of the electronic energy levels of dominant impurities and the constants regulating the oxidation‐reduction of these impurities and of pure Al2O3 are determined. The latter shows a discrepancy with an expression reported previously.
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title The Defect Structure of Unintentionally Doped α-Al2O3 Crystals
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