Lattice distortions induced by carbon in silicon

X-ray double-crystal diffractometry has been used to investigate the lattice distortions in silicon crystals containing carbon impurities. Precise lattice-spacing measurements have been carried out with a double-source double-crystal transmission technique. A linear correlation between the absolute...

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Veröffentlicht in:	Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties Physics of condensed matter. Defects and mechanical properties, 1988-08, Vol.58 (2), p.435-443
Hauptverfasser:	Windisch, D., Becker, P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Exact sciences and technology Impurities: concentration, distribution, and gradients Physics Structure of solids and liquids crystallography
Online-Zugang:	Volltext
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