Interface Effects on Static and Dynamic Properties of Multiferroic BiFeO3
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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| Veröffentlicht in: | Microscopy and microanalysis 2012-07, Vol.18 (S2), p.320-321 |
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| container_end_page | 321 |
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| container_issue | S2 |
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| container_title | Microscopy and microanalysis |
| container_volume | 18 |
| creator | Nelson, C.T. Gao, P. Jokisaari, J.R. Pan, X. Heikes, C. Adamo, C. Melville, A. Schlom, D.G. Baek, S. Folkman, C.M. Eom, C. Winchester, B. Gu, Y. Chen, L. Liu, Y. Li, J. |
| description | Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. |
| doi_str_mv | 10.1017/S1431927612003455 |
| format | Article |
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| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.320-321 |
| issn | 1431-9276 1435-8115 |
| language | eng |
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| source | Alma/SFX Local Collection |
| subjects | Applications of Aberration-Corrected STEM and SEM-03 Instrumentation Symposium |
| title | Interface Effects on Static and Dynamic Properties of Multiferroic BiFeO3 |
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