In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface

We report a phenomenological study of Cu(In,Ga)Se2 (CIGS) dots and their morphological transition into nano‐ridge shapes induced by application of a focused ion beam (IB) to CIGS film. Real‐time observations of nano‐structure evolution during IB irradiation were obtained by recording sequential imag...

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Veröffentlicht in:Surface and interface analysis 2012-11, Vol.44 (11-12), p.1542-1546
Hauptverfasser: Lee, Ji Yeong, Seong, Won Kyung, Joe, Minwoong, Lee, Kwang-Ryeol, Park, Jong-Ku, Moon, Myoung-Woon, Yang, Cheol-Woong
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Sprache:eng
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