In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface
We report a phenomenological study of Cu(In,Ga)Se2 (CIGS) dots and their morphological transition into nano‐ridge shapes induced by application of a focused ion beam (IB) to CIGS film. Real‐time observations of nano‐structure evolution during IB irradiation were obtained by recording sequential imag...
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Veröffentlicht in: | Surface and interface analysis 2012-11, Vol.44 (11-12), p.1542-1546 |
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creator | Lee, Ji Yeong Seong, Won Kyung Joe, Minwoong Lee, Kwang-Ryeol Park, Jong-Ku Moon, Myoung-Woon Yang, Cheol-Woong |
description | We report a phenomenological study of Cu(In,Ga)Se2 (CIGS) dots and their morphological transition into nano‐ridge shapes induced by application of a focused ion beam (IB) to CIGS film. Real‐time observations of nano‐structure evolution during IB irradiation were obtained by recording sequential images at various ion energies of 1 to 30 keV. We observed that as irradiation time increased, the dots became larger and developed elongated ridge structures under continuous sputtering. This transition process was induced by a combination of the Ostwald ripening processes and cluster diffusion. Compositional analysis revealed that the nano‐dots changed from pristine CIGS to Cu‐rich CIGS. The Ga content of the dots was also found to increase due to sputtered implantation, while levels of In and Se decreased. Copyright © 2012 John Wiley & Sons, Ltd. |
doi_str_mv | 10.1002/sia.4996 |
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Real‐time observations of nano‐structure evolution during IB irradiation were obtained by recording sequential images at various ion energies of 1 to 30 keV. We observed that as irradiation time increased, the dots became larger and developed elongated ridge structures under continuous sputtering. This transition process was induced by a combination of the Ostwald ripening processes and cluster diffusion. Compositional analysis revealed that the nano‐dots changed from pristine CIGS to Cu‐rich CIGS. The Ga content of the dots was also found to increase due to sputtered implantation, while levels of In and Se decreased. Copyright © 2012 John Wiley & Sons, Ltd.</description><identifier>ISSN: 0142-2421</identifier><identifier>EISSN: 1096-9918</identifier><identifier>DOI: 10.1002/sia.4996</identifier><identifier>CODEN: SIANDQ</identifier><language>eng</language><publisher>Chichester, UK: John Wiley & Sons, Ltd</publisher><subject>CIGS ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; FIB ; in-situ SEM ; Ion beams ; nanostructure ; Physics ; self-assembly</subject><ispartof>Surface and interface analysis, 2012-11, Vol.44 (11-12), p.1542-1546</ispartof><rights>Copyright © 2012 John Wiley & Sons, Ltd.</rights><rights>2014 INIST-CNRS</rights><rights>Copyright 2012 John Wiley & Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsia.4996$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsia.4996$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,1417,23930,23931,25140,27924,27925,45574,45575</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26685922$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lee, Ji Yeong</creatorcontrib><creatorcontrib>Seong, Won Kyung</creatorcontrib><creatorcontrib>Joe, Minwoong</creatorcontrib><creatorcontrib>Lee, Kwang-Ryeol</creatorcontrib><creatorcontrib>Park, Jong-Ku</creatorcontrib><creatorcontrib>Moon, Myoung-Woon</creatorcontrib><creatorcontrib>Yang, Cheol-Woong</creatorcontrib><title>In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface</title><title>Surface and interface analysis</title><addtitle>Surf. Interface Anal</addtitle><description>We report a phenomenological study of Cu(In,Ga)Se2 (CIGS) dots and their morphological transition into nano‐ridge shapes induced by application of a focused ion beam (IB) to CIGS film. Real‐time observations of nano‐structure evolution during IB irradiation were obtained by recording sequential images at various ion energies of 1 to 30 keV. We observed that as irradiation time increased, the dots became larger and developed elongated ridge structures under continuous sputtering. This transition process was induced by a combination of the Ostwald ripening processes and cluster diffusion. Compositional analysis revealed that the nano‐dots changed from pristine CIGS to Cu‐rich CIGS. The Ga content of the dots was also found to increase due to sputtered implantation, while levels of In and Se decreased. Copyright © 2012 John Wiley & Sons, Ltd.</description><subject>CIGS</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>FIB</subject><subject>in-situ SEM</subject><subject>Ion beams</subject><subject>nanostructure</subject><subject>Physics</subject><subject>self-assembly</subject><issn>0142-2421</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNpFkF1LwzAUhoMoOKfgTyiIoGBnvpoml2NoHQwVq4hXIc1SyNzSmTTq_r0tG_PquTjPec_hBeAcwRGCEN8Gq0ZUCHYABggKlgqB-CEYQERxiilGx-AkhAWEkBPOBuBj6tJg25g0VTD-W7W2cUlTJz0qo1apdfOozTxxyjWh9VG30Zukbvxq57pEJZN4NXU3hbouDU7K6GulzSk4qtUymLMdh-Dt_u518pDOnorpZDxLLebdfxTVOYKcEoEJI8QgCo2qq5xgAzURyGQaa0SoEYIKogSuYLdQzVFmMNO8IkNwsc1d--YrmtDKRRO9605KhBnPu2CaddblzlJBq2XtldM2yLW3K-U3EjPGM4Fx56Vb78cuzWY_R1D27cquXdm3K8vpuOe_b0Nrfve-8p-S5STP5PtjIV-ei6yk2aOE5A9bfHtz</recordid><startdate>201211</startdate><enddate>201211</enddate><creator>Lee, Ji Yeong</creator><creator>Seong, Won Kyung</creator><creator>Joe, Minwoong</creator><creator>Lee, Kwang-Ryeol</creator><creator>Park, Jong-Ku</creator><creator>Moon, Myoung-Woon</creator><creator>Yang, Cheol-Woong</creator><general>John Wiley & Sons, Ltd</general><general>Wiley</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>IQODW</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>201211</creationdate><title>In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface</title><author>Lee, Ji Yeong ; Seong, Won Kyung ; Joe, Minwoong ; Lee, Kwang-Ryeol ; Park, Jong-Ku ; Moon, Myoung-Woon ; Yang, Cheol-Woong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i2896-41f710843923633e140eafb732e0c391e5c2c134e99493a92b0f71bd15e26c8b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>CIGS</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>FIB</topic><topic>in-situ SEM</topic><topic>Ion beams</topic><topic>nanostructure</topic><topic>Physics</topic><topic>self-assembly</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Ji Yeong</creatorcontrib><creatorcontrib>Seong, Won Kyung</creatorcontrib><creatorcontrib>Joe, Minwoong</creatorcontrib><creatorcontrib>Lee, Kwang-Ryeol</creatorcontrib><creatorcontrib>Park, Jong-Ku</creatorcontrib><creatorcontrib>Moon, Myoung-Woon</creatorcontrib><creatorcontrib>Yang, Cheol-Woong</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Ji Yeong</au><au>Seong, Won Kyung</au><au>Joe, Minwoong</au><au>Lee, Kwang-Ryeol</au><au>Park, Jong-Ku</au><au>Moon, Myoung-Woon</au><au>Yang, Cheol-Woong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface</atitle><jtitle>Surface and interface analysis</jtitle><addtitle>Surf. Interface Anal</addtitle><date>2012-11</date><risdate>2012</risdate><volume>44</volume><issue>11-12</issue><spage>1542</spage><epage>1546</epage><pages>1542-1546</pages><issn>0142-2421</issn><eissn>1096-9918</eissn><coden>SIANDQ</coden><abstract>We report a phenomenological study of Cu(In,Ga)Se2 (CIGS) dots and their morphological transition into nano‐ridge shapes induced by application of a focused ion beam (IB) to CIGS film. Real‐time observations of nano‐structure evolution during IB irradiation were obtained by recording sequential images at various ion energies of 1 to 30 keV. We observed that as irradiation time increased, the dots became larger and developed elongated ridge structures under continuous sputtering. This transition process was induced by a combination of the Ostwald ripening processes and cluster diffusion. Compositional analysis revealed that the nano‐dots changed from pristine CIGS to Cu‐rich CIGS. The Ga content of the dots was also found to increase due to sputtered implantation, while levels of In and Se decreased. Copyright © 2012 John Wiley & Sons, Ltd.</abstract><cop>Chichester, UK</cop><pub>John Wiley & Sons, Ltd</pub><doi>10.1002/sia.4996</doi><tpages>5</tpages></addata></record> |
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subjects | CIGS Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology FIB in-situ SEM Ion beams nanostructure Physics self-assembly |
title | In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface |
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