Surface characterization of nanoparticles: different surface analytical techniques compared

The rapidly growing interest in nanoparticles (NPs) as part of technical products conflicts with the limited knowledge about potential health risks. This dilemma is the initial point of the project NanoPaCT where, based on the chemical composition of NPs and toxicological tests, a forecast on their...

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Veröffentlicht in:Surface and interface analysis 2013-01, Vol.45 (1), p.503-505
Hauptverfasser: Kersting, R., Breitenstein, D., Hagenhoff, B., Fartmann, M., Heller, D., Grehl, T., Brüner, P., Niehuis, E.
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container_end_page 505
container_issue 1
container_start_page 503
container_title Surface and interface analysis
container_volume 45
creator Kersting, R.
Breitenstein, D.
Hagenhoff, B.
Fartmann, M.
Heller, D.
Grehl, T.
Brüner, P.
Niehuis, E.
description The rapidly growing interest in nanoparticles (NPs) as part of technical products conflicts with the limited knowledge about potential health risks. This dilemma is the initial point of the project NanoPaCT where, based on the chemical composition of NPs and toxicological tests, a forecast on their biological activity should be made. For the chemical characterization of the outer surface of core‐shell NPs, an excellent surface sensitivity of the applied analytical techniques is required. In this article, we will present data on an approach to optimise time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to this need. The effect of primary ion parameters (species, energy) was studied on a model system (HfO2 on Si) as well as on Lumidot core‐shell NPs. The full layer closure of both films was proofed by means of low energy ion scattering. On the flat high‐K sample, a clear variation of surface sensitivity could be observed as function of primary ion (PI) parameters. In contrast to this, almost no effect was found on core‐shell NPs which behave in the experiment like homogeneous particles. These results indicate that NPs probably melt‐up or evaporate after direct or grazing impact of PI at typical energies used in ToF‐SIMS. Copyright © 2012 John Wiley & Sons, Ltd.
doi_str_mv 10.1002/sia.5117
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On the flat high‐K sample, a clear variation of surface sensitivity could be observed as function of primary ion (PI) parameters. In contrast to this, almost no effect was found on core‐shell NPs which behave in the experiment like homogeneous particles. These results indicate that NPs probably melt‐up or evaporate after direct or grazing impact of PI at typical energies used in ToF‐SIMS. 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source Wiley Online Library Journals Frontfile Complete
subjects atomic layer deposition
Atomic, molecular, and ion beam impact and interactions with surfaces
Condensed matter: electronic structure, electrical, magnetic, and optical properties
core-shell nanoparticle
Electron and ion emission by liquids and solids
impact phenomena
Exact sciences and technology
Impact phenomena (including electron spectra and sputtering)
information depth
LEIS
Physics
surface sensitivity
thin film characterization
ToF-SIMS
title Surface characterization of nanoparticles: different surface analytical techniques compared
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