Surface characterization of nanoparticles: different surface analytical techniques compared
The rapidly growing interest in nanoparticles (NPs) as part of technical products conflicts with the limited knowledge about potential health risks. This dilemma is the initial point of the project NanoPaCT where, based on the chemical composition of NPs and toxicological tests, a forecast on their...
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Veröffentlicht in: | Surface and interface analysis 2013-01, Vol.45 (1), p.503-505 |
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creator | Kersting, R. Breitenstein, D. Hagenhoff, B. Fartmann, M. Heller, D. Grehl, T. Brüner, P. Niehuis, E. |
description | The rapidly growing interest in nanoparticles (NPs) as part of technical products conflicts with the limited knowledge about potential health risks. This dilemma is the initial point of the project NanoPaCT where, based on the chemical composition of NPs and toxicological tests, a forecast on their biological activity should be made. For the chemical characterization of the outer surface of core‐shell NPs, an excellent surface sensitivity of the applied analytical techniques is required. In this article, we will present data on an approach to optimise time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to this need. The effect of primary ion parameters (species, energy) was studied on a model system (HfO2 on Si) as well as on Lumidot core‐shell NPs. The full layer closure of both films was proofed by means of low energy ion scattering. On the flat high‐K sample, a clear variation of surface sensitivity could be observed as function of primary ion (PI) parameters. In contrast to this, almost no effect was found on core‐shell NPs which behave in the experiment like homogeneous particles. These results indicate that NPs probably melt‐up or evaporate after direct or grazing impact of PI at typical energies used in ToF‐SIMS. Copyright © 2012 John Wiley & Sons, Ltd. |
doi_str_mv | 10.1002/sia.5117 |
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This dilemma is the initial point of the project NanoPaCT where, based on the chemical composition of NPs and toxicological tests, a forecast on their biological activity should be made. For the chemical characterization of the outer surface of core‐shell NPs, an excellent surface sensitivity of the applied analytical techniques is required. In this article, we will present data on an approach to optimise time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to this need. The effect of primary ion parameters (species, energy) was studied on a model system (HfO2 on Si) as well as on Lumidot core‐shell NPs. The full layer closure of both films was proofed by means of low energy ion scattering. On the flat high‐K sample, a clear variation of surface sensitivity could be observed as function of primary ion (PI) parameters. In contrast to this, almost no effect was found on core‐shell NPs which behave in the experiment like homogeneous particles. These results indicate that NPs probably melt‐up or evaporate after direct or grazing impact of PI at typical energies used in ToF‐SIMS. Copyright © 2012 John Wiley & Sons, Ltd.</description><identifier>ISSN: 0142-2421</identifier><identifier>EISSN: 1096-9918</identifier><identifier>DOI: 10.1002/sia.5117</identifier><identifier>CODEN: SIANDQ</identifier><language>eng</language><publisher>Chichester: Blackwell Publishing Ltd</publisher><subject>atomic layer deposition ; Atomic, molecular, and ion beam impact and interactions with surfaces ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; core-shell nanoparticle ; Electron and ion emission by liquids and solids; impact phenomena ; Exact sciences and technology ; Impact phenomena (including electron spectra and sputtering) ; information depth ; LEIS ; Physics ; surface sensitivity ; thin film characterization ; ToF-SIMS</subject><ispartof>Surface and interface analysis, 2013-01, Vol.45 (1), p.503-505</ispartof><rights>Copyright © 2012 John Wiley & Sons, Ltd.</rights><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3617-23aafe1ad355c38fe5517e3826ba944a912584fba7670c31d0cfb6f8206207b23</citedby><cites>FETCH-LOGICAL-c3617-23aafe1ad355c38fe5517e3826ba944a912584fba7670c31d0cfb6f8206207b23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsia.5117$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsia.5117$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>309,310,314,777,781,786,787,1412,4036,4037,23911,23912,25121,27905,27906,45555,45556</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26875448$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kersting, R.</creatorcontrib><creatorcontrib>Breitenstein, D.</creatorcontrib><creatorcontrib>Hagenhoff, B.</creatorcontrib><creatorcontrib>Fartmann, M.</creatorcontrib><creatorcontrib>Heller, D.</creatorcontrib><creatorcontrib>Grehl, T.</creatorcontrib><creatorcontrib>Brüner, P.</creatorcontrib><creatorcontrib>Niehuis, E.</creatorcontrib><title>Surface characterization of nanoparticles: different surface analytical techniques compared</title><title>Surface and interface analysis</title><addtitle>Surf. Interface Anal</addtitle><description>The rapidly growing interest in nanoparticles (NPs) as part of technical products conflicts with the limited knowledge about potential health risks. This dilemma is the initial point of the project NanoPaCT where, based on the chemical composition of NPs and toxicological tests, a forecast on their biological activity should be made. For the chemical characterization of the outer surface of core‐shell NPs, an excellent surface sensitivity of the applied analytical techniques is required. In this article, we will present data on an approach to optimise time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to this need. The effect of primary ion parameters (species, energy) was studied on a model system (HfO2 on Si) as well as on Lumidot core‐shell NPs. The full layer closure of both films was proofed by means of low energy ion scattering. On the flat high‐K sample, a clear variation of surface sensitivity could be observed as function of primary ion (PI) parameters. In contrast to this, almost no effect was found on core‐shell NPs which behave in the experiment like homogeneous particles. These results indicate that NPs probably melt‐up or evaporate after direct or grazing impact of PI at typical energies used in ToF‐SIMS. Copyright © 2012 John Wiley & Sons, Ltd.</description><subject>atomic layer deposition</subject><subject>Atomic, molecular, and ion beam impact and interactions with surfaces</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>core-shell nanoparticle</subject><subject>Electron and ion emission by liquids and solids; impact phenomena</subject><subject>Exact sciences and technology</subject><subject>Impact phenomena (including electron spectra and sputtering)</subject><subject>information depth</subject><subject>LEIS</subject><subject>Physics</subject><subject>surface sensitivity</subject><subject>thin film characterization</subject><subject>ToF-SIMS</subject><issn>0142-2421</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LAzEQhoMoWKvgT1gQwcvWfOwmWW9FtK2UCrZW0EOYpglN3e7WZIvWX--WLr15msM878PMi9AlwR2CMb0NDjopIeIItQjOeJxlRB6jFiYJjWlCySk6C2GJMZZM8hb6GG-8BW0ivQAPujLe_ULlyiIqbVRAUa7BV07nJtxFc2et8aaootCEoIB8W68hjyqjF4X72pgQ6XJVp8z8HJ1YyIO5aGYbvT4-TO778fC5N7jvDmPNOBExZQDWEJizNNVMWpOmRBgmKZ9BliSQEZrKxM5AcIE1I3Os7YxbSTGnWMwoa6OrvXfty90BlVqWG1-fFhShLOOSsPrbNrrZU9qXIXhj1dq7FfitIljtqlN1dWpXXY1eN0II9W_WQ6FdOPCUS5EmyU4Z77lvl5vtvz41HnQbb8O7UJmfAw_-U3HBRKreRj31NO3130cvEzVlfyVjjLM</recordid><startdate>201301</startdate><enddate>201301</enddate><creator>Kersting, R.</creator><creator>Breitenstein, D.</creator><creator>Hagenhoff, B.</creator><creator>Fartmann, M.</creator><creator>Heller, D.</creator><creator>Grehl, T.</creator><creator>Brüner, P.</creator><creator>Niehuis, E.</creator><general>Blackwell Publishing Ltd</general><general>Wiley</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>201301</creationdate><title>Surface characterization of nanoparticles: different surface analytical techniques compared</title><author>Kersting, R. ; Breitenstein, D. ; Hagenhoff, B. ; Fartmann, M. ; Heller, D. ; Grehl, T. ; Brüner, P. ; Niehuis, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3617-23aafe1ad355c38fe5517e3826ba944a912584fba7670c31d0cfb6f8206207b23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>atomic layer deposition</topic><topic>Atomic, molecular, and ion beam impact and interactions with surfaces</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>core-shell nanoparticle</topic><topic>Electron and ion emission by liquids and solids; impact phenomena</topic><topic>Exact sciences and technology</topic><topic>Impact phenomena (including electron spectra and sputtering)</topic><topic>information depth</topic><topic>LEIS</topic><topic>Physics</topic><topic>surface sensitivity</topic><topic>thin film characterization</topic><topic>ToF-SIMS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kersting, R.</creatorcontrib><creatorcontrib>Breitenstein, D.</creatorcontrib><creatorcontrib>Hagenhoff, B.</creatorcontrib><creatorcontrib>Fartmann, M.</creatorcontrib><creatorcontrib>Heller, D.</creatorcontrib><creatorcontrib>Grehl, T.</creatorcontrib><creatorcontrib>Brüner, P.</creatorcontrib><creatorcontrib>Niehuis, E.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kersting, R.</au><au>Breitenstein, D.</au><au>Hagenhoff, B.</au><au>Fartmann, M.</au><au>Heller, D.</au><au>Grehl, T.</au><au>Brüner, P.</au><au>Niehuis, E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface characterization of nanoparticles: different surface analytical techniques compared</atitle><jtitle>Surface and interface analysis</jtitle><addtitle>Surf. Interface Anal</addtitle><date>2013-01</date><risdate>2013</risdate><volume>45</volume><issue>1</issue><spage>503</spage><epage>505</epage><pages>503-505</pages><issn>0142-2421</issn><eissn>1096-9918</eissn><coden>SIANDQ</coden><abstract>The rapidly growing interest in nanoparticles (NPs) as part of technical products conflicts with the limited knowledge about potential health risks. This dilemma is the initial point of the project NanoPaCT where, based on the chemical composition of NPs and toxicological tests, a forecast on their biological activity should be made. For the chemical characterization of the outer surface of core‐shell NPs, an excellent surface sensitivity of the applied analytical techniques is required. In this article, we will present data on an approach to optimise time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to this need. The effect of primary ion parameters (species, energy) was studied on a model system (HfO2 on Si) as well as on Lumidot core‐shell NPs. The full layer closure of both films was proofed by means of low energy ion scattering. On the flat high‐K sample, a clear variation of surface sensitivity could be observed as function of primary ion (PI) parameters. In contrast to this, almost no effect was found on core‐shell NPs which behave in the experiment like homogeneous particles. These results indicate that NPs probably melt‐up or evaporate after direct or grazing impact of PI at typical energies used in ToF‐SIMS. Copyright © 2012 John Wiley & Sons, Ltd.</abstract><cop>Chichester</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1002/sia.5117</doi><tpages>3</tpages></addata></record> |
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subjects | atomic layer deposition Atomic, molecular, and ion beam impact and interactions with surfaces Condensed matter: electronic structure, electrical, magnetic, and optical properties core-shell nanoparticle Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology Impact phenomena (including electron spectra and sputtering) information depth LEIS Physics surface sensitivity thin film characterization ToF-SIMS |
title | Surface characterization of nanoparticles: different surface analytical techniques compared |
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