Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry

The energy spectrum of uranium in irradiated fuels is known to give key information on the oxidation state of uranium at the sample surface. In this respect, it is essential to know the operating conditions applied to measure energy spectra by secondary ion mass spectrometry in order to obtain relia...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Surface and interface analysis 2013-01, Vol.45 (1), p.427-429
Hauptverfasser:	Roure, I., Pasquet, B., Desgranges, L., Bienvenu, Ph
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic, molecular, and ion beam impact and interactions with surfaces Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron and ion emission by liquids and solids impact phenomena energy spectrum Exact sciences and technology Impact phenomena (including electron spectra and sputtering) Physics polycrystal SIMS UO2
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	429
container_issue	1
container_start_page	427
container_title	Surface and interface analysis
container_volume	45
creator	Roure, I. Pasquet, B. Desgranges, L. Bienvenu, Ph
description	The energy spectrum of uranium in irradiated fuels is known to give key information on the oxidation state of uranium at the sample surface. In this respect, it is essential to know the operating conditions applied to measure energy spectra by secondary ion mass spectrometry in order to obtain reliable data. Using a focussed beam on CAMECA IMS6f, the acquisition of an energy spectrum is performed along a line on the sample surface because the primary beam position moves as a function of the high voltage. Depending on the size of UO2 grains, the analysed area can be limited within one single grain or spread among many grains. The consequences of such acquisition conditions are discussed in this paper. Copyright © 2012 John Wiley & Sons, Ltd.
doi_str_mv	10.1002/sia.5115
format	Article
fullrecord	<record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_proquest_journals_1239644605</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2844420631</sourcerecordid><originalsourceid>FETCH-LOGICAL-i2895-5743b97d76d42c4aa9d3ef4008d6b30ec569fdd452fb540f207984b0260f141f3</originalsourceid><addsrcrecordid>eNpFkEtv2zAQhImgBeK6AfITCBQ9KuFb4jE1GtdAHofESG4ELS4DpnqVK6PVv6-MGMlpDvvt7M4Qcs7ZBWdMXGLyF5pzfUIWnFlTWMurT2TBuBKFUIKfki-Ir4yxSlZmQdpb8LjP0EI30j5S6CC_TBQHqMfsad_RlLMPyY8Q6NA3U50nHH3TpA7o9l5Q9O3QANI9pu6FItR9F3yeaJpXW494tOpbGPP0lXyOvkE4O-qSbK9_Pq5-FTf3683q6qZIorK60KWSO1uG0gQlauW9DRKimn8OZicZ1NrYGILSIu60YlGw0lZqx4RhkSse5ZJ8e_Mdcv9nDzi6136fu_mk40Jao5Rheqa-HymPtW9i9l2d0A05tXMCJ0xVaiXszBVv3N_UwPQ-58wdGndz4-7QuHvYXB30g084wr933uffzpSy1O7pbu1WQt49r37cOib_Awa6hTc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1239644605</pqid></control><display><type>article</type><title>Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry</title><source>Wiley Online Library All Journals</source><creator>Roure, I. ; Pasquet, B. ; Desgranges, L. ; Bienvenu, Ph</creator><creatorcontrib>Roure, I. ; Pasquet, B. ; Desgranges, L. ; Bienvenu, Ph</creatorcontrib><description>The energy spectrum of uranium in irradiated fuels is known to give key information on the oxidation state of uranium at the sample surface. In this respect, it is essential to know the operating conditions applied to measure energy spectra by secondary ion mass spectrometry in order to obtain reliable data. Using a focussed beam on CAMECA IMS6f, the acquisition of an energy spectrum is performed along a line on the sample surface because the primary beam position moves as a function of the high voltage. Depending on the size of UO2 grains, the analysed area can be limited within one single grain or spread among many grains. The consequences of such acquisition conditions are discussed in this paper. Copyright © 2012 John Wiley & Sons, Ltd.</description><identifier>ISSN: 0142-2421</identifier><identifier>EISSN: 1096-9918</identifier><identifier>DOI: 10.1002/sia.5115</identifier><identifier>CODEN: SIANDQ</identifier><language>eng</language><publisher>Chichester: Blackwell Publishing Ltd</publisher><subject>Atomic, molecular, and ion beam impact and interactions with surfaces ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Electron and ion emission by liquids and solids; impact phenomena ; energy spectrum ; Exact sciences and technology ; Impact phenomena (including electron spectra and sputtering) ; Physics ; polycrystal ; SIMS ; UO2</subject><ispartof>Surface and interface analysis, 2013-01, Vol.45 (1), p.427-429</ispartof><rights>Copyright © 2012 John Wiley & Sons, Ltd.</rights><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsia.5115$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsia.5115$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,1417,4050,4051,23930,23931,25140,27924,27925,45574,45575</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26875429$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Roure, I.</creatorcontrib><creatorcontrib>Pasquet, B.</creatorcontrib><creatorcontrib>Desgranges, L.</creatorcontrib><creatorcontrib>Bienvenu, Ph</creatorcontrib><title>Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry</title><title>Surface and interface analysis</title><addtitle>Surf. Interface Anal</addtitle><description>The energy spectrum of uranium in irradiated fuels is known to give key information on the oxidation state of uranium at the sample surface. In this respect, it is essential to know the operating conditions applied to measure energy spectra by secondary ion mass spectrometry in order to obtain reliable data. Using a focussed beam on CAMECA IMS6f, the acquisition of an energy spectrum is performed along a line on the sample surface because the primary beam position moves as a function of the high voltage. Depending on the size of UO2 grains, the analysed area can be limited within one single grain or spread among many grains. The consequences of such acquisition conditions are discussed in this paper. Copyright © 2012 John Wiley & Sons, Ltd.</description><subject>Atomic, molecular, and ion beam impact and interactions with surfaces</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Electron and ion emission by liquids and solids; impact phenomena</subject><subject>energy spectrum</subject><subject>Exact sciences and technology</subject><subject>Impact phenomena (including electron spectra and sputtering)</subject><subject>Physics</subject><subject>polycrystal</subject><subject>SIMS</subject><subject>UO2</subject><issn>0142-2421</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNpFkEtv2zAQhImgBeK6AfITCBQ9KuFb4jE1GtdAHofESG4ELS4DpnqVK6PVv6-MGMlpDvvt7M4Qcs7ZBWdMXGLyF5pzfUIWnFlTWMurT2TBuBKFUIKfki-Ir4yxSlZmQdpb8LjP0EI30j5S6CC_TBQHqMfsad_RlLMPyY8Q6NA3U50nHH3TpA7o9l5Q9O3QANI9pu6FItR9F3yeaJpXW494tOpbGPP0lXyOvkE4O-qSbK9_Pq5-FTf3683q6qZIorK60KWSO1uG0gQlauW9DRKimn8OZicZ1NrYGILSIu60YlGw0lZqx4RhkSse5ZJ8e_Mdcv9nDzi6136fu_mk40Jao5Rheqa-HymPtW9i9l2d0A05tXMCJ0xVaiXszBVv3N_UwPQ-58wdGndz4-7QuHvYXB30g084wr933uffzpSy1O7pbu1WQt49r37cOib_Awa6hTc</recordid><startdate>201301</startdate><enddate>201301</enddate><creator>Roure, I.</creator><creator>Pasquet, B.</creator><creator>Desgranges, L.</creator><creator>Bienvenu, Ph</creator><general>Blackwell Publishing Ltd</general><general>Wiley</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>IQODW</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>201301</creationdate><title>Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry</title><author>Roure, I. ; Pasquet, B. ; Desgranges, L. ; Bienvenu, Ph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i2895-5743b97d76d42c4aa9d3ef4008d6b30ec569fdd452fb540f207984b0260f141f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Atomic, molecular, and ion beam impact and interactions with surfaces</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Electron and ion emission by liquids and solids; impact phenomena</topic><topic>energy spectrum</topic><topic>Exact sciences and technology</topic><topic>Impact phenomena (including electron spectra and sputtering)</topic><topic>Physics</topic><topic>polycrystal</topic><topic>SIMS</topic><topic>UO2</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Roure, I.</creatorcontrib><creatorcontrib>Pasquet, B.</creatorcontrib><creatorcontrib>Desgranges, L.</creatorcontrib><creatorcontrib>Bienvenu, Ph</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Roure, I.</au><au>Pasquet, B.</au><au>Desgranges, L.</au><au>Bienvenu, Ph</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry</atitle><jtitle>Surface and interface analysis</jtitle><addtitle>Surf. Interface Anal</addtitle><date>2013-01</date><risdate>2013</risdate><volume>45</volume><issue>1</issue><spage>427</spage><epage>429</epage><pages>427-429</pages><issn>0142-2421</issn><eissn>1096-9918</eissn><coden>SIANDQ</coden><abstract>The energy spectrum of uranium in irradiated fuels is known to give key information on the oxidation state of uranium at the sample surface. In this respect, it is essential to know the operating conditions applied to measure energy spectra by secondary ion mass spectrometry in order to obtain reliable data. Using a focussed beam on CAMECA IMS6f, the acquisition of an energy spectrum is performed along a line on the sample surface because the primary beam position moves as a function of the high voltage. Depending on the size of UO2 grains, the analysed area can be limited within one single grain or spread among many grains. The consequences of such acquisition conditions are discussed in this paper. Copyright © 2012 John Wiley & Sons, Ltd.</abstract><cop>Chichester</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1002/sia.5115</doi><tpages>3</tpages></addata></record>
fulltext	fulltext
identifier	ISSN: 0142-2421
ispartof	Surface and interface analysis, 2013-01, Vol.45 (1), p.427-429
issn	0142-2421 1096-9918
language	eng
recordid	cdi_proquest_journals_1239644605
source	Wiley Online Library All Journals
subjects	Atomic, molecular, and ion beam impact and interactions with surfaces Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron and ion emission by liquids and solids impact phenomena energy spectrum Exact sciences and technology Impact phenomena (including electron spectra and sputtering) Physics polycrystal SIMS UO2
title	Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T02%3A06%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20energy%20spectra%20on%20irradiated%20polycrystalline%20UO2%20samples%20using%20secondary%20ion%20mass%20spectrometry&rft.jtitle=Surface%20and%20interface%20analysis&rft.au=Roure,%20I.&rft.date=2013-01&rft.volume=45&rft.issue=1&rft.spage=427&rft.epage=429&rft.pages=427-429&rft.issn=0142-2421&rft.eissn=1096-9918&rft.coden=SIANDQ&rft_id=info:doi/10.1002/sia.5115&rft_dat=%3Cproquest_pasca%3E2844420631%3C/proquest_pasca%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1239644605&rft_id=info:pmid/&rfr_iscdi=true