Radio-Frequency Electromagnetic Characterization in Factory Infrastructures
In recent years, industrial wireless applications have emerged rapidly. The use of short-range radio communication systems in factories increases the flexibility in industrial processes by reducing the use of cables. However, the technological challenges involved in wireless communication in industr...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 2012-06, Vol.54 (3), p.708-711 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 711 |
|---|---|
| container_issue | 3 |
| container_start_page | 708 |
| container_title | IEEE transactions on electromagnetic compatibility |
| container_volume | 54 |
| creator | Coll, J. F. Chilo, J. Slimane, B. |
| description | In recent years, industrial wireless applications have emerged rapidly. The use of short-range radio communication systems in factories increases the flexibility in industrial processes by reducing the use of cables. However, the technological challenges involved in wireless communication in industrial environments are not trivial; they result in disadvantages with respect to reliability and security because of electromagnetic interference. To gain an understanding of the performance limits of these wireless applications, knowing the characteristics of these environments is essential. In this approach, amplitude probability distribution and rms delay spread measurements have been used to perform electromagnetic site surveys in three factory automation infrastructures. |
| doi_str_mv | 10.1109/TEMC.2012.2197753 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_1081843418</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6203403</ieee_id><sourcerecordid>2776712251</sourcerecordid><originalsourceid>FETCH-LOGICAL-c360t-9f4b37d0fad6960c28056c91fea859782fea4ddabd148fb92d65e13f229f1c763</originalsourceid><addsrcrecordid>eNo9kE1LAzEQhoMoWD9-gHhZEG9uzSSbbHKU2mpREUTFW0izSY3UTU12kfrrTWnpKZPMMy-TB6EzwEMALK9fx0-jIcFAhgRkXTO6hwbAmChB1B_7aIAxiFLSmh2io5S-8rVihA7Qw4tufCgn0f70tjWrYrywpovhW89b23lTjD511Kaz0f_pzoe28G0xyQ8hropp66JOXexN10ebTtCB04tkT7fnMXqbjF9H9-Xj8910dPNYGspxV0pXzWjdYKcbLjk2RGDGjQRntWCyFiQXVdPoWQOVcDNJGs4sUEeIdGBqTo_R1SY3_dplP1PL6L91XKmgvbr17zcqxLn69HMFhNeQ8YsNvowhfzJ16iv0sc0bKsACREUrEJmCDWViSClat4sFrNaK1VqxWitWW8V55nKbrJPRiyyjNT7tBgnHwATDmTvfcN5au2tzgmmFKf0H0keFnA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1081843418</pqid></control><display><type>article</type><title>Radio-Frequency Electromagnetic Characterization in Factory Infrastructures</title><source>IEEE Electronic Library (IEL)</source><creator>Coll, J. F. ; Chilo, J. ; Slimane, B.</creator><creatorcontrib>Coll, J. F. ; Chilo, J. ; Slimane, B.</creatorcontrib><description>In recent years, industrial wireless applications have emerged rapidly. The use of short-range radio communication systems in factories increases the flexibility in industrial processes by reducing the use of cables. However, the technological challenges involved in wireless communication in industrial environments are not trivial; they result in disadvantages with respect to reliability and security because of electromagnetic interference. To gain an understanding of the performance limits of these wireless applications, knowing the characteristics of these environments is essential. In this approach, amplitude probability distribution and rms delay spread measurements have been used to perform electromagnetic site surveys in three factory automation infrastructures.</description><identifier>ISSN: 0018-9375</identifier><identifier>ISSN: 1558-187X</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2012.2197753</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Amplitude probability distribution (APD) ; Applied classical electromagnetism ; Applied sciences ; Delay ; Electromagnetic compatibility ; electromagnetic interference ; Electromagnetic wave propagation, radiowave propagation ; Electromagnetics ; Electromagnetism; electron and ion optics ; Electronics ; Exact sciences and technology ; Frequency measurement ; Fundamental areas of phenomenology (including applications) ; industrial applications ; Information, signal and communications theory ; Interference ; Manufacturing automation ; Optoelectronic devices ; Physics ; Production facilities ; rms delay spread ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Telecommunications and information theory ; Wireless communication ; wireless communications</subject><ispartof>IEEE transactions on electromagnetic compatibility, 2012-06, Vol.54 (3), p.708-711</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c360t-9f4b37d0fad6960c28056c91fea859782fea4ddabd148fb92d65e13f229f1c763</citedby><cites>FETCH-LOGICAL-c360t-9f4b37d0fad6960c28056c91fea859782fea4ddabd148fb92d65e13f229f1c763</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6203403$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,792,881,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6203403$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26015850$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://urn.kb.se/resolve?urn=urn:nbn:se:hig:diva-12671$$DView record from Swedish Publication Index$$Hfree_for_read</backlink></links><search><creatorcontrib>Coll, J. F.</creatorcontrib><creatorcontrib>Chilo, J.</creatorcontrib><creatorcontrib>Slimane, B.</creatorcontrib><title>Radio-Frequency Electromagnetic Characterization in Factory Infrastructures</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>In recent years, industrial wireless applications have emerged rapidly. The use of short-range radio communication systems in factories increases the flexibility in industrial processes by reducing the use of cables. However, the technological challenges involved in wireless communication in industrial environments are not trivial; they result in disadvantages with respect to reliability and security because of electromagnetic interference. To gain an understanding of the performance limits of these wireless applications, knowing the characteristics of these environments is essential. In this approach, amplitude probability distribution and rms delay spread measurements have been used to perform electromagnetic site surveys in three factory automation infrastructures.</description><subject>Amplitude probability distribution (APD)</subject><subject>Applied classical electromagnetism</subject><subject>Applied sciences</subject><subject>Delay</subject><subject>Electromagnetic compatibility</subject><subject>electromagnetic interference</subject><subject>Electromagnetic wave propagation, radiowave propagation</subject><subject>Electromagnetics</subject><subject>Electromagnetism; electron and ion optics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency measurement</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>industrial applications</subject><subject>Information, signal and communications theory</subject><subject>Interference</subject><subject>Manufacturing automation</subject><subject>Optoelectronic devices</subject><subject>Physics</subject><subject>Production facilities</subject><subject>rms delay spread</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Telecommunications and information theory</subject><subject>Wireless communication</subject><subject>wireless communications</subject><issn>0018-9375</issn><issn>1558-187X</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1LAzEQhoMoWD9-gHhZEG9uzSSbbHKU2mpREUTFW0izSY3UTU12kfrrTWnpKZPMMy-TB6EzwEMALK9fx0-jIcFAhgRkXTO6hwbAmChB1B_7aIAxiFLSmh2io5S-8rVihA7Qw4tufCgn0f70tjWrYrywpovhW89b23lTjD511Kaz0f_pzoe28G0xyQ8hropp66JOXexN10ebTtCB04tkT7fnMXqbjF9H9-Xj8910dPNYGspxV0pXzWjdYKcbLjk2RGDGjQRntWCyFiQXVdPoWQOVcDNJGs4sUEeIdGBqTo_R1SY3_dplP1PL6L91XKmgvbr17zcqxLn69HMFhNeQ8YsNvowhfzJ16iv0sc0bKsACREUrEJmCDWViSClat4sFrNaK1VqxWitWW8V55nKbrJPRiyyjNT7tBgnHwATDmTvfcN5au2tzgmmFKf0H0keFnA</recordid><startdate>20120601</startdate><enddate>20120601</enddate><creator>Coll, J. F.</creator><creator>Chilo, J.</creator><creator>Slimane, B.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>ADTPV</scope><scope>AOWAS</scope><scope>D8W</scope></search><sort><creationdate>20120601</creationdate><title>Radio-Frequency Electromagnetic Characterization in Factory Infrastructures</title><author>Coll, J. F. ; Chilo, J. ; Slimane, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c360t-9f4b37d0fad6960c28056c91fea859782fea4ddabd148fb92d65e13f229f1c763</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Amplitude probability distribution (APD)</topic><topic>Applied classical electromagnetism</topic><topic>Applied sciences</topic><topic>Delay</topic><topic>Electromagnetic compatibility</topic><topic>electromagnetic interference</topic><topic>Electromagnetic wave propagation, radiowave propagation</topic><topic>Electromagnetics</topic><topic>Electromagnetism; electron and ion optics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency measurement</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>industrial applications</topic><topic>Information, signal and communications theory</topic><topic>Interference</topic><topic>Manufacturing automation</topic><topic>Optoelectronic devices</topic><topic>Physics</topic><topic>Production facilities</topic><topic>rms delay spread</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Telecommunications and information theory</topic><topic>Wireless communication</topic><topic>wireless communications</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Coll, J. F.</creatorcontrib><creatorcontrib>Chilo, J.</creatorcontrib><creatorcontrib>Slimane, B.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005–Present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>SwePub</collection><collection>SwePub Articles</collection><collection>SWEPUB Högskolan i Gävle</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Coll, J. F.</au><au>Chilo, J.</au><au>Slimane, B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Radio-Frequency Electromagnetic Characterization in Factory Infrastructures</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>2012-06-01</date><risdate>2012</risdate><volume>54</volume><issue>3</issue><spage>708</spage><epage>711</epage><pages>708-711</pages><issn>0018-9375</issn><issn>1558-187X</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>In recent years, industrial wireless applications have emerged rapidly. The use of short-range radio communication systems in factories increases the flexibility in industrial processes by reducing the use of cables. However, the technological challenges involved in wireless communication in industrial environments are not trivial; they result in disadvantages with respect to reliability and security because of electromagnetic interference. To gain an understanding of the performance limits of these wireless applications, knowing the characteristics of these environments is essential. In this approach, amplitude probability distribution and rms delay spread measurements have been used to perform electromagnetic site surveys in three factory automation infrastructures.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TEMC.2012.2197753</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9375 |
| ispartof | IEEE transactions on electromagnetic compatibility, 2012-06, Vol.54 (3), p.708-711 |
| issn | 0018-9375 1558-187X 1558-187X |
| language | eng |
| recordid | cdi_proquest_journals_1081843418 |
| source | IEEE Electronic Library (IEL) |
| subjects | Amplitude probability distribution (APD) Applied classical electromagnetism Applied sciences Delay Electromagnetic compatibility electromagnetic interference Electromagnetic wave propagation, radiowave propagation Electromagnetics Electromagnetism electron and ion optics Electronics Exact sciences and technology Frequency measurement Fundamental areas of phenomenology (including applications) industrial applications Information, signal and communications theory Interference Manufacturing automation Optoelectronic devices Physics Production facilities rms delay spread Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Telecommunications and information theory Wireless communication wireless communications |
| title | Radio-Frequency Electromagnetic Characterization in Factory Infrastructures |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T13%3A02%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Radio-Frequency%20Electromagnetic%20Characterization%20in%20Factory%20Infrastructures&rft.jtitle=IEEE%20transactions%20on%20electromagnetic%20compatibility&rft.au=Coll,%20J.%20F.&rft.date=2012-06-01&rft.volume=54&rft.issue=3&rft.spage=708&rft.epage=711&rft.pages=708-711&rft.issn=0018-9375&rft.eissn=1558-187X&rft.coden=IEMCAE&rft_id=info:doi/10.1109/TEMC.2012.2197753&rft_dat=%3Cproquest_RIE%3E2776712251%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1081843418&rft_id=info:pmid/&rft_ieee_id=6203403&rfr_iscdi=true |