Toward Spectral-Domain Optical Coherence Tomography on a Chip
We present experimental results of a spectral-domain optical coherence tomography system based on an integrated optical spectrometer. A 195-channel arrayed-waveguide-grating (AWG) spectrometer with 0.4-nm channel spacing centered at 1300 nm and a 125-channel AWG with 0.16-nm channel spacing centered...
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| Veröffentlicht in: | IEEE journal of selected topics in quantum electronics 2012-05, Vol.18 (3), p.1223-1233 |
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| container_title | IEEE journal of selected topics in quantum electronics |
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| creator | Akca, B. Imran Worhoff, Kerstin de Ridder, Rene M. Nguyen, Van Duc Kalkman, Jeroen Ismail, Nur Sengo, Gabriel Sun, Fei Driessen, Alfred van Leeuwen, Ton G. Pollnau, Markus |
| description | We present experimental results of a spectral-domain optical coherence tomography system based on an integrated optical spectrometer. A 195-channel arrayed-waveguide-grating (AWG) spectrometer with 0.4-nm channel spacing centered at 1300 nm and a 125-channel AWG with 0.16-nm channel spacing centered at 800 nm have been fabricated in silicon oxynitride waveguide technology. Interferometric distance measurements have been performed by launching light from a broadband source into a free-space Michelson interferometer, with its output coupled into the AWG. A maximum imaging depth of 1 mm and axial resolution of 25 and 20 μm in air are demonstrated for the 800- and 1300-nm ranges, respectively. |
| doi_str_mv | 10.1109/JSTQE.2011.2171674 |
| format | Article |
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Imran ; Worhoff, Kerstin ; de Ridder, Rene M. ; Nguyen, Van Duc ; Kalkman, Jeroen ; Ismail, Nur ; Sengo, Gabriel ; Sun, Fei ; Driessen, Alfred ; van Leeuwen, Ton G. ; Pollnau, Markus</creator><creatorcontrib>Akca, B. Imran ; Worhoff, Kerstin ; de Ridder, Rene M. ; Nguyen, Van Duc ; Kalkman, Jeroen ; Ismail, Nur ; Sengo, Gabriel ; Sun, Fei ; Driessen, Alfred ; van Leeuwen, Ton G. ; Pollnau, Markus</creatorcontrib><description>We present experimental results of a spectral-domain optical coherence tomography system based on an integrated optical spectrometer. A 195-channel arrayed-waveguide-grating (AWG) spectrometer with 0.4-nm channel spacing centered at 1300 nm and a 125-channel AWG with 0.16-nm channel spacing centered at 800 nm have been fabricated in silicon oxynitride waveguide technology. Interferometric distance measurements have been performed by launching light from a broadband source into a free-space Michelson interferometer, with its output coupled into the AWG. 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A maximum imaging depth of 1 mm and axial resolution of 25 and 20 μm in air are demonstrated for the 800- and 1300-nm ranges, respectively.</description><subject>Arrayed waveguide grating (AWG)</subject><subject>Arrayed waveguide gratings</subject><subject>Bandwidth</subject><subject>Broadband</subject><subject>Channels</subject><subject>Crosstalk</subject><subject>Image resolution</subject><subject>Imaging</subject><subject>Light sources</subject><subject>Michelson interferometers</subject><subject>Optical Coherence Tomography</subject><subject>optical coherence tomography (OCT)</subject><subject>optical waveguides</subject><subject>Quantum electronics</subject><subject>Silicon oxynitride</subject><subject>silicon oxynitride (SiON)</subject><subject>Spectra</subject><subject>spectrometer</subject><subject>Spectrometers</subject><issn>1077-260X</issn><issn>1558-4542</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1Lw0AQhhdRsFb_gF4CXrykzn4kuzl4kLR-USjSCN7CdjO1KUk27qZI_73pBx48zTA87zDzEHJNYUQpJPdv8-x9MmJA6YhRSWMpTsiARpEKRSTYad-DlCGL4fOcXHi_BgAlFAzIQ2Z_tCuCeYumc7oKx7bWZRPM2q40ugpSu0KHjcEgs7X9crpdbQPbBDpIV2V7Sc6WuvJ4daxD8vE0ydKXcDp7fk0fp6HhTHVhbIzURVIohUoKTpN-WhQQg4AFBxGrgqOJxFIJ0JEpqES5oDFHlIzGBgQfkrvD3tbZ7w36Lq9Lb7CqdIN243MKXDHOkz16-w9d241r-ut2lJQyAUV7ih0o46z3Dpd568pau20P5Tuj-d5ovjOaH432oZtDqETEv0D_BVeR4r9cFW_C</recordid><startdate>20120501</startdate><enddate>20120501</enddate><creator>Akca, B. 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Imran ; Worhoff, Kerstin ; de Ridder, Rene M. ; Nguyen, Van Duc ; Kalkman, Jeroen ; Ismail, Nur ; Sengo, Gabriel ; Sun, Fei ; Driessen, Alfred ; van Leeuwen, Ton G. ; Pollnau, Markus</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c328t-6cc7ad9d88e874319328dd06040b30468d3ec54f840a5cd17e7b163ee7216c043</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Arrayed waveguide grating (AWG)</topic><topic>Arrayed waveguide gratings</topic><topic>Bandwidth</topic><topic>Broadband</topic><topic>Channels</topic><topic>Crosstalk</topic><topic>Image resolution</topic><topic>Imaging</topic><topic>Light sources</topic><topic>Michelson interferometers</topic><topic>Optical Coherence Tomography</topic><topic>optical coherence tomography (OCT)</topic><topic>optical waveguides</topic><topic>Quantum electronics</topic><topic>Silicon oxynitride</topic><topic>silicon oxynitride (SiON)</topic><topic>Spectra</topic><topic>spectrometer</topic><topic>Spectrometers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Akca, B. 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| identifier | ISSN: 1077-260X |
| ispartof | IEEE journal of selected topics in quantum electronics, 2012-05, Vol.18 (3), p.1223-1233 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Arrayed waveguide grating (AWG) Arrayed waveguide gratings Bandwidth Broadband Channels Crosstalk Image resolution Imaging Light sources Michelson interferometers Optical Coherence Tomography optical coherence tomography (OCT) optical waveguides Quantum electronics Silicon oxynitride silicon oxynitride (SiON) Spectra spectrometer Spectrometers |
| title | Toward Spectral-Domain Optical Coherence Tomography on a Chip |
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