Switching Activity as a Test Compaction Heuristic for Transition Faults

The switching activity of scan-based tests for delay faults is considered as a test compaction heuristic. Two test compaction processes based on the switching activity are described. The results of several experiments are presented where test sets consisting of tests with different switching activit...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2010-09, Vol.18 (9), p.1357-1361
Hauptverfasser:	Pomeranz, I, Reddy, S M
Format:	Artikel
Sprache:	eng
Schlagworte:	Broadside tests Circuit faults Circuit testing Cities and towns Compaction Delay Electrical fault detection Fault detection Fault diagnosis functional broadside tests Object detection switching activity test compaction transition faults Upper bound
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