Aggravated Electromigration of Power Distribution Networks in ULSI Devices Due to Local Resonant Oscillations
In this paper, the impact of resonant voltage oscillations, triggered on on-die power supply and ground grids by switching of active elements, upon electromigration (EM) and Joule heating of the interconnects, constituting the grids, has been studied. The recorded voltage waveforms inside a working...
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| Veröffentlicht in: | IEEE transactions on device and materials reliability 2012-06, Vol.12 (2), p.363-368 |
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| creator | Livshits, P. Rysin, A. Sofer, S. |
| description | In this paper, the impact of resonant voltage oscillations, triggered on on-die power supply and ground grids by switching of active elements, upon electromigration (EM) and Joule heating of the interconnects, constituting the grids, has been studied. The recorded voltage waveforms inside a working microchip reveal that the voltage oscillations on these grids can locally attain amplitude that is even higher than 10% with regard to the supply voltage. It was observed that these oscillations can appear with an opposite phase at two adjacent power grid areas, thus giving rise to strong currents. These experimentally measured waveforms have been taken as a basis for our calculations. The results reveal that resonant voltage oscillations on both power supply and ground grids lead to a substantial aggravation of both EM and Joule heating. Furthermore, it was found that the situation is aggravated with the growth of the voltage oscillations' frequency. |
| doi_str_mv | 10.1109/TDMR.2012.2187058 |
| format | Magazinearticle |
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The recorded voltage waveforms inside a working microchip reveal that the voltage oscillations on these grids can locally attain amplitude that is even higher than 10% with regard to the supply voltage. It was observed that these oscillations can appear with an opposite phase at two adjacent power grid areas, thus giving rise to strong currents. These experimentally measured waveforms have been taken as a basis for our calculations. The results reveal that resonant voltage oscillations on both power supply and ground grids lead to a substantial aggravation of both EM and Joule heating. Furthermore, it was found that the situation is aggravated with the growth of the voltage oscillations' frequency.</description><identifier>ISSN: 1530-4388</identifier><identifier>EISSN: 1558-2574</identifier><identifier>DOI: 10.1109/TDMR.2012.2187058</identifier><identifier>CODEN: ITDMA2</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>CMOS integrated circuits ; Electric potential ; Electromigration ; Electromigration (EM) and Joule heating ; Grounds ; Integrated circuit interconnections ; Joule heating ; Magnetic fields ; on-die power supply and ground grids ; Oscillations ; Oscillators ; Power supplies ; Power supply ; Reliability ; resonant voltage oscillations ; ULSI microchips' reliability ; Voltage ; Voltage measurement ; Waveforms</subject><ispartof>IEEE transactions on device and materials reliability, 2012-06, Vol.12 (2), p.363-368</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c278t-2acb142742e8d03a0bff35c635624b9ef7c2d211a94cbc9dd52fe8a0268153bd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6151078$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>780,784,796,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6151078$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Livshits, P.</creatorcontrib><creatorcontrib>Rysin, A.</creatorcontrib><creatorcontrib>Sofer, S.</creatorcontrib><title>Aggravated Electromigration of Power Distribution Networks in ULSI Devices Due to Local Resonant Oscillations</title><title>IEEE transactions on device and materials reliability</title><addtitle>TDMR</addtitle><description>In this paper, the impact of resonant voltage oscillations, triggered on on-die power supply and ground grids by switching of active elements, upon electromigration (EM) and Joule heating of the interconnects, constituting the grids, has been studied. The recorded voltage waveforms inside a working microchip reveal that the voltage oscillations on these grids can locally attain amplitude that is even higher than 10% with regard to the supply voltage. It was observed that these oscillations can appear with an opposite phase at two adjacent power grid areas, thus giving rise to strong currents. These experimentally measured waveforms have been taken as a basis for our calculations. The results reveal that resonant voltage oscillations on both power supply and ground grids lead to a substantial aggravation of both EM and Joule heating. Furthermore, it was found that the situation is aggravated with the growth of the voltage oscillations' frequency.</description><subject>CMOS integrated circuits</subject><subject>Electric potential</subject><subject>Electromigration</subject><subject>Electromigration (EM) and Joule heating</subject><subject>Grounds</subject><subject>Integrated circuit interconnections</subject><subject>Joule heating</subject><subject>Magnetic fields</subject><subject>on-die power supply and ground grids</subject><subject>Oscillations</subject><subject>Oscillators</subject><subject>Power supplies</subject><subject>Power supply</subject><subject>Reliability</subject><subject>resonant voltage oscillations</subject><subject>ULSI microchips' reliability</subject><subject>Voltage</subject><subject>Voltage measurement</subject><subject>Waveforms</subject><issn>1530-4388</issn><issn>1558-2574</issn><fulltext>true</fulltext><rsrctype>magazinearticle</rsrctype><creationdate>2012</creationdate><recordtype>magazinearticle</recordtype><sourceid>RIE</sourceid><recordid>eNpdkU1PwzAMhisEEmPwAxCXSFy4dCRp06bHiQ2YNBga27lKU3fKaJuRpJv492Qf4sDFtqzH1mu_QXBL8IAQnD0uRm_zAcWEDijhKWb8LOgRxnhIWRqf7-sIh3HE-WVwZe0aY5KlLOkFzXC1MmIrHJRoXIN0RjfKd5zSLdIV-tA7MGikrDOq6A7dd3A7bb4sUi1aTj8naARbJcGiUQfIaTTVUtRoDla3onVoZqWq68NCex1cVKK2cHPK_WD5PF48vYbT2cvkaTgNJU25C6mQBYlpGlPgJY4ELqoqYjKJWELjIoMqlbSkhIgsloXMypLRCrjANOH-zqKM-sHDce_G6O8OrMsbZSV4GS3ozuYkIizJfMg8ev8PXevOtF5dTvyTME_jjHmKHClptLUGqnxjVCPMj4fyvQH53oB8b0B-MsDP3B1nFAD88QlhBKc8-gVs-II6</recordid><startdate>20120601</startdate><enddate>20120601</enddate><creator>Livshits, P.</creator><creator>Rysin, A.</creator><creator>Sofer, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20120601</creationdate><title>Aggravated Electromigration of Power Distribution Networks in ULSI Devices Due to Local Resonant Oscillations</title><author>Livshits, P. ; Rysin, A. ; Sofer, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c278t-2acb142742e8d03a0bff35c635624b9ef7c2d211a94cbc9dd52fe8a0268153bd3</frbrgroupid><rsrctype>magazinearticle</rsrctype><prefilter>magazinearticle</prefilter><language>eng</language><creationdate>2012</creationdate><topic>CMOS integrated circuits</topic><topic>Electric potential</topic><topic>Electromigration</topic><topic>Electromigration (EM) and Joule heating</topic><topic>Grounds</topic><topic>Integrated circuit interconnections</topic><topic>Joule heating</topic><topic>Magnetic fields</topic><topic>on-die power supply and ground grids</topic><topic>Oscillations</topic><topic>Oscillators</topic><topic>Power supplies</topic><topic>Power supply</topic><topic>Reliability</topic><topic>resonant voltage oscillations</topic><topic>ULSI microchips' reliability</topic><topic>Voltage</topic><topic>Voltage measurement</topic><topic>Waveforms</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Livshits, P.</creatorcontrib><creatorcontrib>Rysin, A.</creatorcontrib><creatorcontrib>Sofer, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on device and materials reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Livshits, P.</au><au>Rysin, A.</au><au>Sofer, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Aggravated Electromigration of Power Distribution Networks in ULSI Devices Due to Local Resonant Oscillations</atitle><jtitle>IEEE transactions on device and materials reliability</jtitle><stitle>TDMR</stitle><date>2012-06-01</date><risdate>2012</risdate><volume>12</volume><issue>2</issue><spage>363</spage><epage>368</epage><pages>363-368</pages><issn>1530-4388</issn><eissn>1558-2574</eissn><coden>ITDMA2</coden><abstract>In this paper, the impact of resonant voltage oscillations, triggered on on-die power supply and ground grids by switching of active elements, upon electromigration (EM) and Joule heating of the interconnects, constituting the grids, has been studied. The recorded voltage waveforms inside a working microchip reveal that the voltage oscillations on these grids can locally attain amplitude that is even higher than 10% with regard to the supply voltage. It was observed that these oscillations can appear with an opposite phase at two adjacent power grid areas, thus giving rise to strong currents. These experimentally measured waveforms have been taken as a basis for our calculations. The results reveal that resonant voltage oscillations on both power supply and ground grids lead to a substantial aggravation of both EM and Joule heating. Furthermore, it was found that the situation is aggravated with the growth of the voltage oscillations' frequency.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TDMR.2012.2187058</doi><tpages>6</tpages></addata></record> |
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| subjects | CMOS integrated circuits Electric potential Electromigration Electromigration (EM) and Joule heating Grounds Integrated circuit interconnections Joule heating Magnetic fields on-die power supply and ground grids Oscillations Oscillators Power supplies Power supply Reliability resonant voltage oscillations ULSI microchips' reliability Voltage Voltage measurement Waveforms |
| title | Aggravated Electromigration of Power Distribution Networks in ULSI Devices Due to Local Resonant Oscillations |
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