Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar
On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effe...
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Veröffentlicht in: | IEEE journal of oceanic engineering 2012-04, Vol.37 (2), p.236-243 |
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description | On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices. |
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Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.</description><identifier>ISSN: 0364-9059</identifier><identifier>ISSN: 1558-1691</identifier><identifier>EISSN: 1558-1691</identifier><identifier>DOI: 10.1109/JOE.2012.2188160</identifier><identifier>CODEN: IJOEDY</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acoustic beams ; Beam shape ; Beams (radiation) ; Devices ; Enclosure ; Engineering and Technology ; Engineering Science with specialization in Microsystems Technology ; Finite element analysis ; finite element analysis (FEA) ; Finite element method ; Imaging ; Marine ; Mathematical models ; Medical Engineering ; Medicinteknik ; miniaturize ; Schlieren ; Shape ; sidescan sonar ; Sonar ; Sonar equipment ; Sonar measurements ; Studies ; TECHNOLOGY ; Teknik ; TEKNIKVETENSKAP ; Teknisk fysik med inriktning mot mikrosystemteknik ; Transducers ; Walls</subject><ispartof>IEEE journal of oceanic engineering, 2012-04, Vol.37 (2), p.236-243</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c416t-1794f628659ecd89ee5416b1977aaa044d423dae7e4d766617fdbba3a9ff80e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6176264$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,792,881,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6176264$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-171730$$DView record from Swedish Publication Index$$Hfree_for_read</backlink><backlink>$$Uhttps://lup.lub.lu.se/record/2570346$$DView record from Swedish Publication Index$$Hfree_for_read</backlink></links><search><creatorcontrib>Jonsson, J.</creatorcontrib><creatorcontrib>Lekholm, V.</creatorcontrib><creatorcontrib>Kratz, H.</creatorcontrib><creatorcontrib>Almqvist, M.</creatorcontrib><creatorcontrib>Thornell, G.</creatorcontrib><title>Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar</title><title>IEEE journal of oceanic engineering</title><addtitle>JOE</addtitle><description>On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.</description><subject>Acoustic beams</subject><subject>Beam shape</subject><subject>Beams (radiation)</subject><subject>Devices</subject><subject>Enclosure</subject><subject>Engineering and Technology</subject><subject>Engineering Science with specialization in Microsystems Technology</subject><subject>Finite element analysis</subject><subject>finite element analysis (FEA)</subject><subject>Finite element method</subject><subject>Imaging</subject><subject>Marine</subject><subject>Mathematical models</subject><subject>Medical Engineering</subject><subject>Medicinteknik</subject><subject>miniaturize</subject><subject>Schlieren</subject><subject>Shape</subject><subject>sidescan sonar</subject><subject>Sonar</subject><subject>Sonar equipment</subject><subject>Sonar measurements</subject><subject>Studies</subject><subject>TECHNOLOGY</subject><subject>Teknik</subject><subject>TEKNIKVETENSKAP</subject><subject>Teknisk fysik med inriktning mot mikrosystemteknik</subject><subject>Transducers</subject><subject>Walls</subject><issn>0364-9059</issn><issn>1558-1691</issn><issn>1558-1691</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkkGLFDEQhRtRcFy9C14avHiwx1QnnXSOyzquIyN72MVrkU4qkqU3PSYdRH-9WWbZgyAeioLie4_i8ZrmNbAtANMfvlzttj2DftvDOIJkT5oNDMPYgdTwtNkwLkWn2aCfNy9yvmUMhFB601zuop2XXBJ1--iKJdfu40rJU6Joqd15T3bNbYitab-GGMxaUvhdsevgKFsT2-slmvSyeebNnOnVwz5rbj7tbi4-d4ery_3F-aGzAuTagdLCy36UgybrRk001PsEWiljDBPCiZ47Q4qEU1JKUN5Nk-FGez8y4mfN4WSbf9KxTHhM4c6kX7iYgHM51pnqYCYk7lRfRagc71EMZkBNSqN0mttJCW6Nq3bv_2n3MXw7xyV9x1IQFCjOKv7uhB_T8qNQXvEuZEvzbCItJSNIVTOvMPwfZTUKqbgeK_r2L_R2KSnWFCvFYNRMiqFS7ETZtOScyD8-CwzvG4C1AXjfAHxoQJW8OUkCET3iNVPZS8H_AAQhquY</recordid><startdate>20120401</startdate><enddate>20120401</enddate><creator>Jonsson, J.</creator><creator>Lekholm, V.</creator><creator>Kratz, H.</creator><creator>Almqvist, M.</creator><creator>Thornell, G.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JOE.2012.2188160</doi><tpages>8</tpages></addata></record> |
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subjects | Acoustic beams Beam shape Beams (radiation) Devices Enclosure Engineering and Technology Engineering Science with specialization in Microsystems Technology Finite element analysis finite element analysis (FEA) Finite element method Imaging Marine Mathematical models Medical Engineering Medicinteknik miniaturize Schlieren Shape sidescan sonar Sonar Sonar equipment Sonar measurements Studies TECHNOLOGY Teknik TEKNIKVETENSKAP Teknisk fysik med inriktning mot mikrosystemteknik Transducers Walls |
title | Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar |
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