Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar

On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effe...

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Veröffentlicht in:IEEE journal of oceanic engineering 2012-04, Vol.37 (2), p.236-243
Hauptverfasser: Jonsson, J., Lekholm, V., Kratz, H., Almqvist, M., Thornell, G.
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container_issue 2
container_start_page 236
container_title IEEE journal of oceanic engineering
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creator Jonsson, J.
Lekholm, V.
Kratz, H.
Almqvist, M.
Thornell, G.
description On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_1001890645</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6176264</ieee_id><sourcerecordid>1017967398</sourcerecordid><originalsourceid>FETCH-LOGICAL-c416t-1794f628659ecd89ee5416b1977aaa044d423dae7e4d766617fdbba3a9ff80e3</originalsourceid><addsrcrecordid>eNqFkkGLFDEQhRtRcFy9C14avHiwx1QnnXSOyzquIyN72MVrkU4qkqU3PSYdRH-9WWbZgyAeioLie4_i8ZrmNbAtANMfvlzttj2DftvDOIJkT5oNDMPYgdTwtNkwLkWn2aCfNy9yvmUMhFB601zuop2XXBJ1--iKJdfu40rJU6Joqd15T3bNbYitab-GGMxaUvhdsevgKFsT2-slmvSyeebNnOnVwz5rbj7tbi4-d4ery_3F-aGzAuTagdLCy36UgybrRk001PsEWiljDBPCiZ47Q4qEU1JKUN5Nk-FGez8y4mfN4WSbf9KxTHhM4c6kX7iYgHM51pnqYCYk7lRfRagc71EMZkBNSqN0mttJCW6Nq3bv_2n3MXw7xyV9x1IQFCjOKv7uhB_T8qNQXvEuZEvzbCItJSNIVTOvMPwfZTUKqbgeK_r2L_R2KSnWFCvFYNRMiqFS7ETZtOScyD8-CwzvG4C1AXjfAHxoQJW8OUkCET3iNVPZS8H_AAQhquY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1001890645</pqid></control><display><type>article</type><title>Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar</title><source>IEEE Electronic Library (IEL)</source><creator>Jonsson, J. ; Lekholm, V. ; Kratz, H. ; Almqvist, M. ; Thornell, G.</creator><creatorcontrib>Jonsson, J. ; Lekholm, V. ; Kratz, H. ; Almqvist, M. ; Thornell, G.</creatorcontrib><description>On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.</description><identifier>ISSN: 0364-9059</identifier><identifier>ISSN: 1558-1691</identifier><identifier>EISSN: 1558-1691</identifier><identifier>DOI: 10.1109/JOE.2012.2188160</identifier><identifier>CODEN: IJOEDY</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acoustic beams ; Beam shape ; Beams (radiation) ; Devices ; Enclosure ; Engineering and Technology ; Engineering Science with specialization in Microsystems Technology ; Finite element analysis ; finite element analysis (FEA) ; Finite element method ; Imaging ; Marine ; Mathematical models ; Medical Engineering ; Medicinteknik ; miniaturize ; Schlieren ; Shape ; sidescan sonar ; Sonar ; Sonar equipment ; Sonar measurements ; Studies ; TECHNOLOGY ; Teknik ; TEKNIKVETENSKAP ; Teknisk fysik med inriktning mot mikrosystemteknik ; Transducers ; Walls</subject><ispartof>IEEE journal of oceanic engineering, 2012-04, Vol.37 (2), p.236-243</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c416t-1794f628659ecd89ee5416b1977aaa044d423dae7e4d766617fdbba3a9ff80e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6176264$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,792,881,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6176264$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-171730$$DView record from Swedish Publication Index$$Hfree_for_read</backlink><backlink>$$Uhttps://lup.lub.lu.se/record/2570346$$DView record from Swedish Publication Index$$Hfree_for_read</backlink></links><search><creatorcontrib>Jonsson, J.</creatorcontrib><creatorcontrib>Lekholm, V.</creatorcontrib><creatorcontrib>Kratz, H.</creatorcontrib><creatorcontrib>Almqvist, M.</creatorcontrib><creatorcontrib>Thornell, G.</creatorcontrib><title>Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar</title><title>IEEE journal of oceanic engineering</title><addtitle>JOE</addtitle><description>On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.</description><subject>Acoustic beams</subject><subject>Beam shape</subject><subject>Beams (radiation)</subject><subject>Devices</subject><subject>Enclosure</subject><subject>Engineering and Technology</subject><subject>Engineering Science with specialization in Microsystems Technology</subject><subject>Finite element analysis</subject><subject>finite element analysis (FEA)</subject><subject>Finite element method</subject><subject>Imaging</subject><subject>Marine</subject><subject>Mathematical models</subject><subject>Medical Engineering</subject><subject>Medicinteknik</subject><subject>miniaturize</subject><subject>Schlieren</subject><subject>Shape</subject><subject>sidescan sonar</subject><subject>Sonar</subject><subject>Sonar equipment</subject><subject>Sonar measurements</subject><subject>Studies</subject><subject>TECHNOLOGY</subject><subject>Teknik</subject><subject>TEKNIKVETENSKAP</subject><subject>Teknisk fysik med inriktning mot mikrosystemteknik</subject><subject>Transducers</subject><subject>Walls</subject><issn>0364-9059</issn><issn>1558-1691</issn><issn>1558-1691</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkkGLFDEQhRtRcFy9C14avHiwx1QnnXSOyzquIyN72MVrkU4qkqU3PSYdRH-9WWbZgyAeioLie4_i8ZrmNbAtANMfvlzttj2DftvDOIJkT5oNDMPYgdTwtNkwLkWn2aCfNy9yvmUMhFB601zuop2XXBJ1--iKJdfu40rJU6Joqd15T3bNbYitab-GGMxaUvhdsevgKFsT2-slmvSyeebNnOnVwz5rbj7tbi4-d4ery_3F-aGzAuTagdLCy36UgybrRk001PsEWiljDBPCiZ47Q4qEU1JKUN5Nk-FGez8y4mfN4WSbf9KxTHhM4c6kX7iYgHM51pnqYCYk7lRfRagc71EMZkBNSqN0mttJCW6Nq3bv_2n3MXw7xyV9x1IQFCjOKv7uhB_T8qNQXvEuZEvzbCItJSNIVTOvMPwfZTUKqbgeK_r2L_R2KSnWFCvFYNRMiqFS7ETZtOScyD8-CwzvG4C1AXjfAHxoQJW8OUkCET3iNVPZS8H_AAQhquY</recordid><startdate>20120401</startdate><enddate>20120401</enddate><creator>Jonsson, J.</creator><creator>Lekholm, V.</creator><creator>Kratz, H.</creator><creator>Almqvist, M.</creator><creator>Thornell, G.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7TB</scope><scope>7TN</scope><scope>8FD</scope><scope>F1W</scope><scope>FR3</scope><scope>H96</scope><scope>JQ2</scope><scope>KR7</scope><scope>L.G</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>F28</scope><scope>ADTPV</scope><scope>AOWAS</scope><scope>DF2</scope><scope>D95</scope></search><sort><creationdate>20120401</creationdate><title>Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar</title><author>Jonsson, J. ; Lekholm, V. ; Kratz, H. ; Almqvist, M. ; Thornell, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c416t-1794f628659ecd89ee5416b1977aaa044d423dae7e4d766617fdbba3a9ff80e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Acoustic beams</topic><topic>Beam shape</topic><topic>Beams (radiation)</topic><topic>Devices</topic><topic>Enclosure</topic><topic>Engineering and Technology</topic><topic>Engineering Science with specialization in Microsystems Technology</topic><topic>Finite element analysis</topic><topic>finite element analysis (FEA)</topic><topic>Finite element method</topic><topic>Imaging</topic><topic>Marine</topic><topic>Mathematical models</topic><topic>Medical Engineering</topic><topic>Medicinteknik</topic><topic>miniaturize</topic><topic>Schlieren</topic><topic>Shape</topic><topic>sidescan sonar</topic><topic>Sonar</topic><topic>Sonar equipment</topic><topic>Sonar measurements</topic><topic>Studies</topic><topic>TECHNOLOGY</topic><topic>Teknik</topic><topic>TEKNIKVETENSKAP</topic><topic>Teknisk fysik med inriktning mot mikrosystemteknik</topic><topic>Transducers</topic><topic>Walls</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jonsson, J.</creatorcontrib><creatorcontrib>Lekholm, V.</creatorcontrib><creatorcontrib>Kratz, H.</creatorcontrib><creatorcontrib>Almqvist, M.</creatorcontrib><creatorcontrib>Thornell, G.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Oceanic Abstracts</collection><collection>Technology Research Database</collection><collection>ASFA: Aquatic Sciences and Fisheries Abstracts</collection><collection>Engineering Research Database</collection><collection>Aquatic Science &amp; Fisheries Abstracts (ASFA) 2: Ocean Technology, Policy &amp; Non-Living Resources</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Aquatic Science &amp; Fisheries Abstracts (ASFA) Professional</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>SwePub</collection><collection>SwePub Articles</collection><collection>SWEPUB Uppsala universitet</collection><collection>SWEPUB Lunds universitet</collection><jtitle>IEEE journal of oceanic engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jonsson, J.</au><au>Lekholm, V.</au><au>Kratz, H.</au><au>Almqvist, M.</au><au>Thornell, G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar</atitle><jtitle>IEEE journal of oceanic engineering</jtitle><stitle>JOE</stitle><date>2012-04-01</date><risdate>2012</risdate><volume>37</volume><issue>2</issue><spage>236</spage><epage>243</epage><pages>236-243</pages><issn>0364-9059</issn><issn>1558-1691</issn><eissn>1558-1691</eissn><coden>IJOEDY</coden><abstract>On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JOE.2012.2188160</doi><tpages>8</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0364-9059
ispartof IEEE journal of oceanic engineering, 2012-04, Vol.37 (2), p.236-243
issn 0364-9059
1558-1691
1558-1691
language eng
recordid cdi_proquest_journals_1001890645
source IEEE Electronic Library (IEL)
subjects Acoustic beams
Beam shape
Beams (radiation)
Devices
Enclosure
Engineering and Technology
Engineering Science with specialization in Microsystems Technology
Finite element analysis
finite element analysis (FEA)
Finite element method
Imaging
Marine
Mathematical models
Medical Engineering
Medicinteknik
miniaturize
Schlieren
Shape
sidescan sonar
Sonar
Sonar equipment
Sonar measurements
Studies
TECHNOLOGY
Teknik
TEKNIKVETENSKAP
Teknisk fysik med inriktning mot mikrosystemteknik
Transducers
Walls
title Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T16%3A19%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Enclosure-Induced%20Interference%20Effects%20in%20a%20Miniaturized%20Sidescan%20Sonar&rft.jtitle=IEEE%20journal%20of%20oceanic%20engineering&rft.au=Jonsson,%20J.&rft.date=2012-04-01&rft.volume=37&rft.issue=2&rft.spage=236&rft.epage=243&rft.pages=236-243&rft.issn=0364-9059&rft.eissn=1558-1691&rft.coden=IJOEDY&rft_id=info:doi/10.1109/JOE.2012.2188160&rft_dat=%3Cproquest_RIE%3E1017967398%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1001890645&rft_id=info:pmid/&rft_ieee_id=6176264&rfr_iscdi=true