Point Defects in Semiconductors 2: Experimental Aspects
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| creator | Cardona, Manuel Fulde, Peter Queisser, Hans-Joachim |
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| fulltext | fulltext |
| identifier | ISBN: 364281834X |
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| language | eng |
| recordid | cdi_proquest_ebookcentral_EBC3096722 |
| source | Springer Books |
| subjects | Defects Semiconductors |
| title | Point Defects in Semiconductors 2: Experimental Aspects |
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