A new metric between distributions of point processes

Most metrics between finite point measures currently used in the literature have the flaw that they do not treat differing total masses in an adequate manner for applications. This paper introduces a new metric d̅ 1 that combines positional differences of points under a closest match with the relati...

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Veröffentlicht in:	Advances in applied probability 2008-09, Vol.40 (3), p.651-672
Hauptverfasser:	Schuhmacher, Dominic, Xia, Aihua
Format:	Artikel
Sprache:	eng
Schlagworte:	60F05 60G55 62M30 Approximation Bernoulli process Cardinality Computational statistics Continuous functions distributional approximation Point estimators point process Poisson distribution Poisson point process Poisson process Probability Random variables Statistical analysis statistical analysis of point pattern data Stein's method Stochastic Geometry and Statistical Applications Studies Topological compactness Topology Wasserstein metric
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