The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneous distributed defects

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physica status solidi. A, Applied research Applied research, 1985, Vol.87 (2), p.597-608
Hauptverfasser: MOLODKIN, V. B, OLIKHOVSKII, S. I, OSINOVSKII, M. E, GUREEV, A. N, DATSENKO, L. I, NIZKOVA, A. I, ZHURAVLEV, B. F
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 608
container_issue 2
container_start_page 597
container_title Physica status solidi. A, Applied research
container_volume 87
creator MOLODKIN, V. B
OLIKHOVSKII, S. I
OSINOVSKII, M. E
GUREEV, A. N
DATSENKO, L. I
NIZKOVA, A. I
ZHURAVLEV, B. F
description
format Article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_9248630</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>9248630</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_92486303</originalsourceid><addsrcrecordid>eNqNjbFOw0AQRE8RSDGQf7iC9qRznJi4jkAUlCnSRct5z1lk31q758I9H46D-ACqGWme3qxMUe63paua-nxnCu-r0h2aer82D6pf3vudf_GF-T5d0VLK2AlkbH9rUsqEajnavKwfMKFrKUaBcEPOTmBWG1nswImDzJqhVxs4ZaBEqbMDBGENPFKAvp_tlQfuMCFPalvSLPQ53VQtRgxZn8x9XAy4-ctH8_z2ejq-uxF0ESzHKZBeRqEBZL40292hrnz1T-wHpttXIg</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneous distributed defects</title><source>Access via Wiley Online Library</source><creator>MOLODKIN, V. B ; OLIKHOVSKII, S. I ; OSINOVSKII, M. E ; GUREEV, A. N ; DATSENKO, L. I ; NIZKOVA, A. I ; ZHURAVLEV, B. F</creator><creatorcontrib>MOLODKIN, V. B ; OLIKHOVSKII, S. I ; OSINOVSKII, M. E ; GUREEV, A. N ; DATSENKO, L. I ; NIZKOVA, A. I ; ZHURAVLEV, B. F</creatorcontrib><identifier>ISSN: 0031-8965</identifier><identifier>EISSN: 1521-396X</identifier><identifier>CODEN: PSSABA</identifier><language>eng</language><publisher>Berlin: Wiley-VCH</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Defects and impurities in crystals; microstructure ; Exact sciences and technology ; Physics ; Structure of solids and liquids; crystallography</subject><ispartof>Physica status solidi. A, Applied research, 1985, Vol.87 (2), p.597-608</ispartof><rights>1985 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,781,785,4025</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=9248630$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>MOLODKIN, V. B</creatorcontrib><creatorcontrib>OLIKHOVSKII, S. I</creatorcontrib><creatorcontrib>OSINOVSKII, M. E</creatorcontrib><creatorcontrib>GUREEV, A. N</creatorcontrib><creatorcontrib>DATSENKO, L. I</creatorcontrib><creatorcontrib>NIZKOVA, A. I</creatorcontrib><creatorcontrib>ZHURAVLEV, B. F</creatorcontrib><title>The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneous distributed defects</title><title>Physica status solidi. A, Applied research</title><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Defects and impurities in crystals; microstructure</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Structure of solids and liquids; crystallography</subject><issn>0031-8965</issn><issn>1521-396X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNqNjbFOw0AQRE8RSDGQf7iC9qRznJi4jkAUlCnSRct5z1lk31q758I9H46D-ACqGWme3qxMUe63paua-nxnCu-r0h2aer82D6pf3vudf_GF-T5d0VLK2AlkbH9rUsqEajnavKwfMKFrKUaBcEPOTmBWG1nswImDzJqhVxs4ZaBEqbMDBGENPFKAvp_tlQfuMCFPalvSLPQ53VQtRgxZn8x9XAy4-ctH8_z2ejq-uxF0ESzHKZBeRqEBZL40292hrnz1T-wHpttXIg</recordid><startdate>1985</startdate><enddate>1985</enddate><creator>MOLODKIN, V. B</creator><creator>OLIKHOVSKII, S. I</creator><creator>OSINOVSKII, M. E</creator><creator>GUREEV, A. N</creator><creator>DATSENKO, L. I</creator><creator>NIZKOVA, A. I</creator><creator>ZHURAVLEV, B. F</creator><general>Wiley-VCH</general><scope>IQODW</scope></search><sort><creationdate>1985</creationdate><title>The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneous distributed defects</title><author>MOLODKIN, V. B ; OLIKHOVSKII, S. I ; OSINOVSKII, M. E ; GUREEV, A. N ; DATSENKO, L. I ; NIZKOVA, A. I ; ZHURAVLEV, B. F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_92486303</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Defects and impurities in crystals; microstructure</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Structure of solids and liquids; crystallography</topic><toplevel>online_resources</toplevel><creatorcontrib>MOLODKIN, V. B</creatorcontrib><creatorcontrib>OLIKHOVSKII, S. I</creatorcontrib><creatorcontrib>OSINOVSKII, M. E</creatorcontrib><creatorcontrib>GUREEV, A. N</creatorcontrib><creatorcontrib>DATSENKO, L. I</creatorcontrib><creatorcontrib>NIZKOVA, A. I</creatorcontrib><creatorcontrib>ZHURAVLEV, B. F</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Physica status solidi. A, Applied research</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MOLODKIN, V. B</au><au>OLIKHOVSKII, S. I</au><au>OSINOVSKII, M. E</au><au>GUREEV, A. N</au><au>DATSENKO, L. I</au><au>NIZKOVA, A. I</au><au>ZHURAVLEV, B. F</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneous distributed defects</atitle><jtitle>Physica status solidi. A, Applied research</jtitle><date>1985</date><risdate>1985</risdate><volume>87</volume><issue>2</issue><spage>597</spage><epage>608</epage><pages>597-608</pages><issn>0031-8965</issn><eissn>1521-396X</eissn><coden>PSSABA</coden><cop>Berlin</cop><pub>Wiley-VCH</pub></addata></record>
fulltext fulltext
identifier ISSN: 0031-8965
ispartof Physica status solidi. A, Applied research, 1985, Vol.87 (2), p.597-608
issn 0031-8965
1521-396X
language eng
recordid cdi_pascalfrancis_primary_9248630
source Access via Wiley Online Library
subjects Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Physics
Structure of solids and liquids
crystallography
title The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneous distributed defects
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T12%3A21%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20integrated%20intensities%20of%20the%20Laue-diffracted%20X-rays%20for%20monocrystals%20containing%20macroscopically%20homogeneous%20distributed%20defects&rft.jtitle=Physica%20status%20solidi.%20A,%20Applied%20research&rft.au=MOLODKIN,%20V.%20B&rft.date=1985&rft.volume=87&rft.issue=2&rft.spage=597&rft.epage=608&rft.pages=597-608&rft.issn=0031-8965&rft.eissn=1521-396X&rft.coden=PSSABA&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E9248630%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true