Transient simulation of silicon devices and circuits
In this paper, we present an overview of the physical principles and numerical methods used to solve the coupled system of non-linear partial differential equations that model the transient behavior of silicon VLSI device structures. We also describe how the same techniques are applicable to circuit...
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Veröffentlicht in: | IEEE transactions on electron devices 1985-10, Vol.32 (10), p.1992-2007 |
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container_end_page | 2007 |
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container_issue | 10 |
container_start_page | 1992 |
container_title | IEEE transactions on electron devices |
container_volume | 32 |
creator | Bank, R.E. Coughran, W.M. Fichtner, W. Grosse, E.H. Rose, D.J. Smith, R.K. |
description | In this paper, we present an overview of the physical principles and numerical methods used to solve the coupled system of non-linear partial differential equations that model the transient behavior of silicon VLSI device structures. We also describe how the same techniques are applicable to circuit simulation. A composite linear multistep formula is introduced as the time-integration scheme. Newton-iterative methods are exploited to solve the nonlinear equations that arise at each time step. We also present a simple data structure for nonsymmetric matrices with symmetric nonzero structures that facilitates iterative or direct methods with substantial efficiency gains over other storage schemes. Several computational examples, including a CMOS latchup problem, are presented and discussed. |
doi_str_mv | 10.1109/T-ED.1985.22232 |
format | Article |
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We also describe how the same techniques are applicable to circuit simulation. A composite linear multistep formula is introduced as the time-integration scheme. Newton-iterative methods are exploited to solve the nonlinear equations that arise at each time step. We also present a simple data structure for nonsymmetric matrices with symmetric nonzero structures that facilitates iterative or direct methods with substantial efficiency gains over other storage schemes. Several computational examples, including a CMOS latchup problem, are presented and discussed.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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ispartof | IEEE transactions on electron devices, 1985-10, Vol.32 (10), p.1992-2007 |
issn | 0018-9383 1557-9646 |
language | eng |
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source | IEEE Electronic Library (IEL) |
subjects | Applied sciences Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Transient simulation of silicon devices and circuits |
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