Transmittance and reflectance in situ measurements of semicontinuous gold films during deposition

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of applied physics 1989, Vol.66 (7), p.3019-3025
Hauptverfasser:	GADENNE, P, YAGIL, Y, DEUTSCHER, G
Format:	Artikel
Sprache:	eng
Schlagworte:	Analysing. Testing. Standards Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Measurement of properties and materials state Metals, semimetals and alloys Metals. Metallurgy Nondestructive testing Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Physics Specific materials
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