An enhanced time-domain approach for dielectric characterization using stripline geometry
A time-domain approach for dielectric characterization using a stripline geometry is presented. The technique uses both time domain reflectometry (TDR) and time domain transmission (TDT) measurements for determining an optimum frequency-dependent lossy transmission line model for the stripline under...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1992-02, Vol.41 (1), p.132-136 |
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| container_end_page | 136 |
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| container_title | IEEE transactions on instrumentation and measurement |
| container_volume | 41 |
| creator | Fidanboylu, K.M. Riad, S.M. Elshabini-Riad, A. |
| description | A time-domain approach for dielectric characterization using a stripline geometry is presented. The technique uses both time domain reflectometry (TDR) and time domain transmission (TDT) measurements for determining an optimum frequency-dependent lossy transmission line model for the stripline under test. The optimization is done in the time domain by comparing the experimental TDR and TDT response waveforms with the simulated ones using a nonlinear least squares fit. The material properties such as the complex permittivity of the dielectric material are determined from the optimum lossy transmission line model. The authors present both simulated and experimental results.< > |
| doi_str_mv | 10.1109/19.126647 |
| format | Article |
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The technique uses both time domain reflectometry (TDR) and time domain transmission (TDT) measurements for determining an optimum frequency-dependent lossy transmission line model for the stripline under test. The optimization is done in the time domain by comparing the experimental TDR and TDT response waveforms with the simulated ones using a nonlinear least squares fit. The material properties such as the complex permittivity of the dielectric material are determined from the optimum lossy transmission line model. The authors present both simulated and experimental results.< ></description><subject>Applied sciences</subject><subject>Dielectric loss measurement</subject><subject>Dielectric measurements</subject><subject>Exact sciences and technology</subject><subject>Frequency measurement</subject><subject>Geometry</subject><subject>Permittivity measurement</subject><subject>Physicochemistry of polymers</subject><subject>Polymers and radiations</subject><subject>Propagation losses</subject><subject>Reflectometry</subject><subject>Stripline</subject><subject>Time domain analysis</subject><subject>Transmission line measurements</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNpFkD1PwzAQhi0EEqUwsDJ5QEgMKXbiOPZYVXxJlVhgYIou9rk1yhd2OpRfTyAVSCfdcM_76PQScsnZgnOm77he8FRKURyRGc_zItFSpsdkxhhXiRa5PCVnMX4wxooRmpH3ZUux3UJr0NLBN5jYrgHfUuj70IHZUtcFaj3WaIbgDTVbCGAGDP4LBt-1dBd9u6FxPPa1b5FusGtwCPtzcuKgjnhx2HPy9nD_unpK1i-Pz6vlOjEZk0PCtUKQWVVJhsKhBGmVzgpgwlSs4pYXRcYsOKNyp3MuUwWVLpQyTtvcppjNyc3kHf_93GEcysZHg3UNLXa7WKZKpCLlfARvJ9CELsaAruyDbyDsS87Kn_JKPs5veSN7fZBCNFC7MBbk418gz5UQjI3Y1YR5RPzXTY5vExF37w</recordid><startdate>19920201</startdate><enddate>19920201</enddate><creator>Fidanboylu, K.M.</creator><creator>Riad, S.M.</creator><creator>Elshabini-Riad, A.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19920201</creationdate><title>An enhanced time-domain approach for dielectric characterization using stripline geometry</title><author>Fidanboylu, K.M. ; Riad, S.M. ; Elshabini-Riad, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c306t-198ea63bb60e4fe6a6d8937a04cb0b1d17730dafc85f951628ab9788cf9d5d2e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Applied sciences</topic><topic>Dielectric loss measurement</topic><topic>Dielectric measurements</topic><topic>Exact sciences and technology</topic><topic>Frequency measurement</topic><topic>Geometry</topic><topic>Permittivity measurement</topic><topic>Physicochemistry of polymers</topic><topic>Polymers and radiations</topic><topic>Propagation losses</topic><topic>Reflectometry</topic><topic>Stripline</topic><topic>Time domain analysis</topic><topic>Transmission line measurements</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fidanboylu, K.M.</creatorcontrib><creatorcontrib>Riad, S.M.</creatorcontrib><creatorcontrib>Elshabini-Riad, A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fidanboylu, K.M.</au><au>Riad, S.M.</au><au>Elshabini-Riad, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An enhanced time-domain approach for dielectric characterization using stripline geometry</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1992-02-01</date><risdate>1992</risdate><volume>41</volume><issue>1</issue><spage>132</spage><epage>136</epage><pages>132-136</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>A time-domain approach for dielectric characterization using a stripline geometry is presented. The technique uses both time domain reflectometry (TDR) and time domain transmission (TDT) measurements for determining an optimum frequency-dependent lossy transmission line model for the stripline under test. The optimization is done in the time domain by comparing the experimental TDR and TDT response waveforms with the simulated ones using a nonlinear least squares fit. The material properties such as the complex permittivity of the dielectric material are determined from the optimum lossy transmission line model. The authors present both simulated and experimental results.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/19.126647</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 0018-9456 |
| ispartof | IEEE transactions on instrumentation and measurement, 1992-02, Vol.41 (1), p.132-136 |
| issn | 0018-9456 1557-9662 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_5584400 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Dielectric loss measurement Dielectric measurements Exact sciences and technology Frequency measurement Geometry Permittivity measurement Physicochemistry of polymers Polymers and radiations Propagation losses Reflectometry Stripline Time domain analysis Transmission line measurements |
| title | An enhanced time-domain approach for dielectric characterization using stripline geometry |
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