Comparisons of One-Volt Josephson-Array Voltage Standards with Sub-Nanovolt Accuracy

Comparisons of One-Volt Josephson-Array Voltage Standards with Sub-Nanovolt Accuracy

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Metrologia 1991, Vol.28 (2), p.99-102, Article 99
Hauptverfasser: Reymann, D, Holtoug, J U, Jensen, H D
Format: Artikel
Sprache:eng
Schlagworte:
Exact sciences and technology
Measurements common to several branches of physics and astronomy
Metrology, measurements and laboratory procedures
Physics
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 102
container_issue 2
container_start_page 99
container_title Metrologia
container_volume 28
creator Reymann, D
Holtoug, J U
Jensen, H D
description
doi_str_mv 10.1088/0026-1394/28/2/007
format Article
fullrecord <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_pascalfrancis_primary_5560736</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>5560736</sourcerecordid><originalsourceid>FETCH-LOGICAL-c346t-7c3371366201b101ed3b82a703b0987c12f8c7740bba87a4b38f1c79a0a728193</originalsourceid><addsrcrecordid>eNp9kD1PwzAQhi0EEqXwB5gysDCY-iPJOWNV8amKDi2s1sVJqFEaR3YA9d-TqKgDlTqd7vQ87-mOkGvO7jhTasKYSCmXWTwRaiL6Fk7IiKeKU0ggOSWjPXBOLkL4ZIyDSGBEVjO3adHb4JoQuSpaNCV9d3UXvbhQtut-TKfe4zYahvhRRssOmwJ9EaIf262j5VdOX7Fx34MzNebLo9lekrMK61Be_dUxeXu4X82e6Hzx-DybzqmRcdpRMFICl2kqGM8542UhcyUQmMxZpsBwUSkDELM8RwUY51JV3ECGDEEonskxEbtc410Ivqx06-0G_VZzpoe_6OFsPZythdKib6GXbnZSi8FgXXlsjA17M0nSHkp7TP3LNrbDzrqm82jr4xtud6p17T73kNNtUfUsPWSPZP8CFgGN8Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Comparisons of One-Volt Josephson-Array Voltage Standards with Sub-Nanovolt Accuracy</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Reymann, D ; Holtoug, J U ; Jensen, H D</creator><creatorcontrib>Reymann, D ; Holtoug, J U ; Jensen, H D</creatorcontrib><identifier>ISSN: 0026-1394</identifier><identifier>EISSN: 1681-7575</identifier><identifier>DOI: 10.1088/0026-1394/28/2/007</identifier><identifier>CODEN: MTRGAU</identifier><language>eng</language><publisher>Heidelberg: IOP Publishing</publisher><subject>Exact sciences and technology ; Measurements common to several branches of physics and astronomy ; Metrology, measurements and laboratory procedures ; Physics</subject><ispartof>Metrologia, 1991, Vol.28 (2), p.99-102, Article 99</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c346t-7c3371366201b101ed3b82a703b0987c12f8c7740bba87a4b38f1c79a0a728193</citedby><cites>FETCH-LOGICAL-c346t-7c3371366201b101ed3b82a703b0987c12f8c7740bba87a4b38f1c79a0a728193</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/0026-1394/28/2/007/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,4024,27923,27924,27925,53830,53910</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=5560736$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Reymann, D</creatorcontrib><creatorcontrib>Holtoug, J U</creatorcontrib><creatorcontrib>Jensen, H D</creatorcontrib><title>Comparisons of One-Volt Josephson-Array Voltage Standards with Sub-Nanovolt Accuracy</title><title>Metrologia</title><subject>Exact sciences and technology</subject><subject>Measurements common to several branches of physics and astronomy</subject><subject>Metrology, measurements and laboratory procedures</subject><subject>Physics</subject><issn>0026-1394</issn><issn>1681-7575</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNp9kD1PwzAQhi0EEqXwB5gysDCY-iPJOWNV8amKDi2s1sVJqFEaR3YA9d-TqKgDlTqd7vQ87-mOkGvO7jhTasKYSCmXWTwRaiL6Fk7IiKeKU0ggOSWjPXBOLkL4ZIyDSGBEVjO3adHb4JoQuSpaNCV9d3UXvbhQtut-TKfe4zYahvhRRssOmwJ9EaIf262j5VdOX7Fx34MzNebLo9lekrMK61Be_dUxeXu4X82e6Hzx-DybzqmRcdpRMFICl2kqGM8542UhcyUQmMxZpsBwUSkDELM8RwUY51JV3ECGDEEonskxEbtc410Ivqx06-0G_VZzpoe_6OFsPZythdKib6GXbnZSi8FgXXlsjA17M0nSHkp7TP3LNrbDzrqm82jr4xtud6p17T73kNNtUfUsPWSPZP8CFgGN8Q</recordid><startdate>1991</startdate><enddate>1991</enddate><creator>Reymann, D</creator><creator>Holtoug, J U</creator><creator>Jensen, H D</creator><general>IOP Publishing</general><general>Springer</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>1991</creationdate><title>Comparisons of One-Volt Josephson-Array Voltage Standards with Sub-Nanovolt Accuracy</title><author>Reymann, D ; Holtoug, J U ; Jensen, H D</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c346t-7c3371366201b101ed3b82a703b0987c12f8c7740bba87a4b38f1c79a0a728193</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Exact sciences and technology</topic><topic>Measurements common to several branches of physics and astronomy</topic><topic>Metrology, measurements and laboratory procedures</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Reymann, D</creatorcontrib><creatorcontrib>Holtoug, J U</creatorcontrib><creatorcontrib>Jensen, H D</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Metrologia</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Reymann, D</au><au>Holtoug, J U</au><au>Jensen, H D</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comparisons of One-Volt Josephson-Array Voltage Standards with Sub-Nanovolt Accuracy</atitle><jtitle>Metrologia</jtitle><date>1991</date><risdate>1991</risdate><volume>28</volume><issue>2</issue><spage>99</spage><epage>102</epage><pages>99-102</pages><artnum>99</artnum><issn>0026-1394</issn><eissn>1681-7575</eissn><coden>MTRGAU</coden><cop>Heidelberg</cop><cop>Berlin</cop><cop>New York, NY</cop><pub>IOP Publishing</pub><doi>10.1088/0026-1394/28/2/007</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0026-1394
ispartof Metrologia, 1991, Vol.28 (2), p.99-102, Article 99
issn 0026-1394
1681-7575
language eng
recordid cdi_pascalfrancis_primary_5560736
source IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
subjects Exact sciences and technology
Measurements common to several branches of physics and astronomy
Metrology, measurements and laboratory procedures
Physics
title Comparisons of One-Volt Josephson-Array Voltage Standards with Sub-Nanovolt Accuracy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T23%3A11%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comparisons%20of%20One-Volt%20Josephson-Array%20Voltage%20Standards%20with%20Sub-Nanovolt%20Accuracy&rft.jtitle=Metrologia&rft.au=Reymann,%20D&rft.date=1991&rft.volume=28&rft.issue=2&rft.spage=99&rft.epage=102&rft.pages=99-102&rft.artnum=99&rft.issn=0026-1394&rft.eissn=1681-7575&rft.coden=MTRGAU&rft_id=info:doi/10.1088/0026-1394/28/2/007&rft_dat=%3Cpascalfrancis_cross%3E5560736%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true