Design of bipolar imaging devices (BASIS): analysis of random noise

A design methodology for a bipolar imaging device, the base-stored image sensor (BASIS), has been established by theoretical analysis and experimental verification for random noise. The random noise in BASIS is dominated by the shot noise in readout and transient reset operation. The theoretical ana...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on electron devices 1992-06, Vol.39 (6), p.1341-1349
Hauptverfasser:	Nakamura, Y., Ohzu, H., Miyawaki, M., Ishizaki, A., Kochi, T., Ohmi, T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Capacitance Capacitors Circuit noise Computed tomography Design methodology Electronics Exact sciences and technology Image analysis Imaging devices Semiconductor device noise Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal to noise ratio Silicon compounds Voltage
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!