Atomic force microscope with integrated optical microscope for biological applications

Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high‐resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned multiple times to pinpoint a sp...

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Veröffentlicht in:	Review of scientific instruments 1992-03, Vol.63 (3), p.1914-1917
Hauptverfasser:	Putman, Constant A. J., van der Werf, Kees O., de Grooth, Bart G., van Hulst, Niek F., Segerink, Frans B., Greve, Jan
Format:	Artikel
Sprache:	eng
Schlagworte:	Conventional optical microscopes Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optical instruments, equipment and techniques Physics
Online-Zugang:	Volltext
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