Ionizing space radiation effects on surface acoustic wave resonators
Two available types of single pole 199 MHz SAW resonators were irradiated to determine space radiation performance, some fabricated on air-swept 40 degrees Y-rotated quartz substrate, and some fabricated on non-swept quartz. In addition, some of the resonators on non-swept quartz were coated with 40...
Gespeichert in:
| Veröffentlicht in: | IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1991-12, Vol.38 (6), p.1329-1335 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1335 |
|---|---|
| container_issue | 6 |
| container_start_page | 1329 |
| container_title | IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) |
| container_volume | 38 |
| creator | Stapor, W.J. Hines, J.H. Wilson, D.H. |
| description | Two available types of single pole 199 MHz SAW resonators were irradiated to determine space radiation performance, some fabricated on air-swept 40 degrees Y-rotated quartz substrate, and some fabricated on non-swept quartz. In addition, some of the resonators on non-swept quartz were coated with 400 AA RF sputtered layer of SiO/sub x/. It was found that sensitivity to radiation is substrate material dependent, with pure substrates showing less radiation degradation in performance. An unexpected reduction in sensitivity was found for the coated devices.< > |
| doi_str_mv | 10.1109/23.124113 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_pascalfrancis_primary_5164085</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>124113</ieee_id><sourcerecordid>28482106</sourcerecordid><originalsourceid>FETCH-LOGICAL-c395t-972764bba0a8b173e35a5e69d58fe7c2834d06d48168c8bd83ca5bf7c344549c3</originalsourceid><addsrcrecordid>eNqN0UtLAzEUBeAgCtbqwq2rQURwMTXPmWQp9VUouNF1yNzJaKRNajJV9NebMkWXukrC_XI4cBE6JnhCCFaXlE0I5YSwHTQiQsiSiFruohHGRJaKK7WPDlJ6zU8usBih61nw7sv55yKtDNgimtaZ3gVf2K6z0KciX9M6dpuhgbBOvYPiw7xnalPwpg8xHaK9ziySPdqeY_R0e_M4vS_nD3ez6dW8BKZEX6qa1hVvGoONbEjNLBNG2Eq1Qna2BioZb3HVckkqCbJpJQMjmq4GxrngCtgYnQ65IbfQCVxv4QWC97moFpJRRlhG5wNaxfC2tqnXS5fALhbG21xfU1lXiqj_QC4pwdXfUDDBMOUZXgwQYkgp2k6volua-KkJ1pv1aMr0sJ5sz7ahJoFZdNF4cOnngyAVx1JkdjIwZ639jRsyvgGofpVu</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25353024</pqid></control><display><type>article</type><title>Ionizing space radiation effects on surface acoustic wave resonators</title><source>IEEE Electronic Library (IEL)</source><creator>Stapor, W.J. ; Hines, J.H. ; Wilson, D.H.</creator><creatorcontrib>Stapor, W.J. ; Hines, J.H. ; Wilson, D.H.</creatorcontrib><description>Two available types of single pole 199 MHz SAW resonators were irradiated to determine space radiation performance, some fabricated on air-swept 40 degrees Y-rotated quartz substrate, and some fabricated on non-swept quartz. In addition, some of the resonators on non-swept quartz were coated with 400 AA RF sputtered layer of SiO/sub x/. It was found that sensitivity to radiation is substrate material dependent, with pure substrates showing less radiation degradation in performance. An unexpected reduction in sensitivity was found for the coated devices.< ></description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/23.124113</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>440800 -- Miscellaneous Instrumentation-- (1990-) ; 661320 -- Auroral, Ionospheric, & Magnetospheric Phenomena-- (1992-) ; Acoustic wave devices, piezoelectric and piezoresistive devices ; Acoustic waves ; Applied sciences ; CHALCOGENIDES ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; COATINGS ; DOSE RATES ; Electromagnetic devices ; Electromagnetic scattering ; ELECTRONIC EQUIPMENT ; Electronics ; Exact sciences and technology ; Frequency ; IMPURITIES ; INHIBITION ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; IONIZATION ; Ionizing radiation ; MINERALS ; OTHER INSTRUMENTATION ; OXIDE MINERALS ; OXIDES ; OXYGEN COMPOUNDS ; RADIATION EFFECTS ; RESONATORS ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; SENSITIVITY ; SILICA ; SILICON COMPOUNDS ; SILICON OXIDES 440200 -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems ; SOUND WAVES ; SPACE ; SUBSTRATES ; Surface acoustic wave devices ; Surface acoustic waves ; SURFACES ; Testing ; Transducers</subject><ispartof>IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1329-1335</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c395t-972764bba0a8b173e35a5e69d58fe7c2834d06d48168c8bd83ca5bf7c344549c3</citedby><cites>FETCH-LOGICAL-c395t-972764bba0a8b173e35a5e69d58fe7c2834d06d48168c8bd83ca5bf7c344549c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/124113$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,309,310,314,780,784,789,790,796,885,23930,23931,25140,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/124113$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5164085$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/5832313$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Stapor, W.J.</creatorcontrib><creatorcontrib>Hines, J.H.</creatorcontrib><creatorcontrib>Wilson, D.H.</creatorcontrib><title>Ionizing space radiation effects on surface acoustic wave resonators</title><title>IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)</title><addtitle>TNS</addtitle><description>Two available types of single pole 199 MHz SAW resonators were irradiated to determine space radiation performance, some fabricated on air-swept 40 degrees Y-rotated quartz substrate, and some fabricated on non-swept quartz. In addition, some of the resonators on non-swept quartz were coated with 400 AA RF sputtered layer of SiO/sub x/. It was found that sensitivity to radiation is substrate material dependent, with pure substrates showing less radiation degradation in performance. An unexpected reduction in sensitivity was found for the coated devices.< ></description><subject>440800 -- Miscellaneous Instrumentation-- (1990-)</subject><subject>661320 -- Auroral, Ionospheric, & Magnetospheric Phenomena-- (1992-)</subject><subject>Acoustic wave devices, piezoelectric and piezoresistive devices</subject><subject>Acoustic waves</subject><subject>Applied sciences</subject><subject>CHALCOGENIDES</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>COATINGS</subject><subject>DOSE RATES</subject><subject>Electromagnetic devices</subject><subject>Electromagnetic scattering</subject><subject>ELECTRONIC EQUIPMENT</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>IMPURITIES</subject><subject>INHIBITION</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>IONIZATION</subject><subject>Ionizing radiation</subject><subject>MINERALS</subject><subject>OTHER INSTRUMENTATION</subject><subject>OXIDE MINERALS</subject><subject>OXIDES</subject><subject>OXYGEN COMPOUNDS</subject><subject>RADIATION EFFECTS</subject><subject>RESONATORS</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>SENSITIVITY</subject><subject>SILICA</subject><subject>SILICON COMPOUNDS</subject><subject>SILICON OXIDES 440200 -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems</subject><subject>SOUND WAVES</subject><subject>SPACE</subject><subject>SUBSTRATES</subject><subject>Surface acoustic wave devices</subject><subject>Surface acoustic waves</subject><subject>SURFACES</subject><subject>Testing</subject><subject>Transducers</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNqN0UtLAzEUBeAgCtbqwq2rQURwMTXPmWQp9VUouNF1yNzJaKRNajJV9NebMkWXukrC_XI4cBE6JnhCCFaXlE0I5YSwHTQiQsiSiFruohHGRJaKK7WPDlJ6zU8usBih61nw7sv55yKtDNgimtaZ3gVf2K6z0KciX9M6dpuhgbBOvYPiw7xnalPwpg8xHaK9ziySPdqeY_R0e_M4vS_nD3ez6dW8BKZEX6qa1hVvGoONbEjNLBNG2Eq1Qna2BioZb3HVckkqCbJpJQMjmq4GxrngCtgYnQ65IbfQCVxv4QWC97moFpJRRlhG5wNaxfC2tqnXS5fALhbG21xfU1lXiqj_QC4pwdXfUDDBMOUZXgwQYkgp2k6volua-KkJ1pv1aMr0sJ5sz7ahJoFZdNF4cOnngyAVx1JkdjIwZ639jRsyvgGofpVu</recordid><startdate>19911201</startdate><enddate>19911201</enddate><creator>Stapor, W.J.</creator><creator>Hines, J.H.</creator><creator>Wilson, D.H.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7U5</scope><scope>7QQ</scope><scope>JG9</scope><scope>OTOTI</scope></search><sort><creationdate>19911201</creationdate><title>Ionizing space radiation effects on surface acoustic wave resonators</title><author>Stapor, W.J. ; Hines, J.H. ; Wilson, D.H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c395t-972764bba0a8b173e35a5e69d58fe7c2834d06d48168c8bd83ca5bf7c344549c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>440800 -- Miscellaneous Instrumentation-- (1990-)</topic><topic>661320 -- Auroral, Ionospheric, & Magnetospheric Phenomena-- (1992-)</topic><topic>Acoustic wave devices, piezoelectric and piezoresistive devices</topic><topic>Acoustic waves</topic><topic>Applied sciences</topic><topic>CHALCOGENIDES</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>COATINGS</topic><topic>DOSE RATES</topic><topic>Electromagnetic devices</topic><topic>Electromagnetic scattering</topic><topic>ELECTRONIC EQUIPMENT</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>IMPURITIES</topic><topic>INHIBITION</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>IONIZATION</topic><topic>Ionizing radiation</topic><topic>MINERALS</topic><topic>OTHER INSTRUMENTATION</topic><topic>OXIDE MINERALS</topic><topic>OXIDES</topic><topic>OXYGEN COMPOUNDS</topic><topic>RADIATION EFFECTS</topic><topic>RESONATORS</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>SENSITIVITY</topic><topic>SILICA</topic><topic>SILICON COMPOUNDS</topic><topic>SILICON OXIDES 440200 -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems</topic><topic>SOUND WAVES</topic><topic>SPACE</topic><topic>SUBSTRATES</topic><topic>Surface acoustic wave devices</topic><topic>Surface acoustic waves</topic><topic>SURFACES</topic><topic>Testing</topic><topic>Transducers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Stapor, W.J.</creatorcontrib><creatorcontrib>Hines, J.H.</creatorcontrib><creatorcontrib>Wilson, D.H.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Materials Research Database</collection><collection>OSTI.GOV</collection><jtitle>IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Stapor, W.J.</au><au>Hines, J.H.</au><au>Wilson, D.H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ionizing space radiation effects on surface acoustic wave resonators</atitle><jtitle>IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)</jtitle><stitle>TNS</stitle><date>1991-12-01</date><risdate>1991</risdate><volume>38</volume><issue>6</issue><spage>1329</spage><epage>1335</epage><pages>1329-1335</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Two available types of single pole 199 MHz SAW resonators were irradiated to determine space radiation performance, some fabricated on air-swept 40 degrees Y-rotated quartz substrate, and some fabricated on non-swept quartz. In addition, some of the resonators on non-swept quartz were coated with 400 AA RF sputtered layer of SiO/sub x/. It was found that sensitivity to radiation is substrate material dependent, with pure substrates showing less radiation degradation in performance. An unexpected reduction in sensitivity was found for the coated devices.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/23.124113</doi><tpages>7</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9499 |
| ispartof | IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1329-1335 |
| issn | 0018-9499 1558-1578 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_5164085 |
| source | IEEE Electronic Library (IEL) |
| subjects | 440800 -- Miscellaneous Instrumentation-- (1990-) 661320 -- Auroral, Ionospheric, & Magnetospheric Phenomena-- (1992-) Acoustic wave devices, piezoelectric and piezoresistive devices Acoustic waves Applied sciences CHALCOGENIDES CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS COATINGS DOSE RATES Electromagnetic devices Electromagnetic scattering ELECTRONIC EQUIPMENT Electronics Exact sciences and technology Frequency IMPURITIES INHIBITION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY IONIZATION Ionizing radiation MINERALS OTHER INSTRUMENTATION OXIDE MINERALS OXIDES OXYGEN COMPOUNDS RADIATION EFFECTS RESONATORS Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SENSITIVITY SILICA SILICON COMPOUNDS SILICON OXIDES 440200 -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems SOUND WAVES SPACE SUBSTRATES Surface acoustic wave devices Surface acoustic waves SURFACES Testing Transducers |
| title | Ionizing space radiation effects on surface acoustic wave resonators |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T04%3A27%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Ionizing%20space%20radiation%20effects%20on%20surface%20acoustic%20wave%20resonators&rft.jtitle=IEEE%20Transactions%20on%20Nuclear%20Science%20(Institute%20of%20Electrical%20and%20Electronics%20Engineers);%20(United%20States)&rft.au=Stapor,%20W.J.&rft.date=1991-12-01&rft.volume=38&rft.issue=6&rft.spage=1329&rft.epage=1335&rft.pages=1329-1335&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/23.124113&rft_dat=%3Cproquest_RIE%3E28482106%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25353024&rft_id=info:pmid/&rft_ieee_id=124113&rfr_iscdi=true |