X-ray Standing Waves and the critical sample thickness for Total-reflection: X-Ray Fluorescence analysis

The intensity of a TXRF signal is affected not only by absorption, but also by interference due to standing waves. These two phenomena can lead to contradictory requirements of sample thickness. Their effect was investigated theoretically for three kinds of matrix and various thickness distributions...

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Veröffentlicht in:	Spectrochimica acta. Part B : Atomic spectroscopy 1991, Vol.46 (10), p.1433-1436
1. Verfasser:	de Boer, D.K.G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical chemistry Chemistry Exact sciences and technology Spectrometric and optical methods
Online-Zugang:	Volltext
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