Extraction of interface state density profile from the maximums of the parallel conductance versus applied gate bias curves Gp(Va), using the conductance technique

Bibliographische Detailangaben

Veröffentlicht in:	Review of scientific instruments 1992, Vol.63 (9), p.4189-4191
Hauptverfasser:	PAPADAS, C, MORFOULI, P, GHIBAUDO, G, PANANAKAKIS, G
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Physics Surface and interface electron states
Online-Zugang:	Volltext
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