Transport properties of the Cu/Ni multilayer system

The electrical resistivity, Hall effect and magnetoresistance of Cu/Ni sputtered multilayer films were measured over the range 1.6-300K for a series of different layer periodicities Lambda . For small Lambda anomalies in the resistivity vs. T curves were observed which are interpreted as reflecting...

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Veröffentlicht in:	Journal of physics. Condensed matter 1994-08, Vol.6 (31), p.6151-6162
Hauptverfasser:	Sato, H, Matsudai, T, Abdul-Razzaq, W, Fierz, C, Schroeder, P A
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Electrical properties of specific thin films Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport phenomena in thin films and low-dimensional structures Exact sciences and technology Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects) Low-field transport and mobility piezoresistance Metal and metallic alloys Metals and metallic alloys Metals. Metallurgy Physics
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